摘要:
A signal delay circuit including a capacitive load element is described. The capacitive load element has a first input end, a second input end, and a third input end. The first input end receives a first signal, the second input end receives a second signal inverted to the first signal, and the third input end receives a control signal. The capacitance of the capacitive load element changes with the control signal.
摘要:
A system for clock and data recovery (“CDR”) includes a clock generator, a half-rate phase detector for receiving the input data, an encoder, a phase selector outputting recovered clock, a confidence counter, and a multiplexer outputting recovered data. The clock generator generates an 8-phase clock signal at half a rate of the transmitted serial data. The phase detector samples input data at four times the standard sampling rate, takes the oversampled data and detects phase transitions therein, i.e., phase lead and lag. The encoder encodes the phase transition data. The confidence counter receives the phase transition data and generates a signal representing the accumulated net effect of the phase transitions. The phase selector receives the confidence counter signal and the 8-phase clock from the clock generator, and determines the optimum phase for data sampling.
摘要:
A jitter measurement circuit and a method for calibrating the jitter measurement circuit are disclosed. The jitter measurement circuit includes a synchronous dual-phase detector and a decision circuit. In a test mode, a probability distribution function (PDF) of the jitter of a clock signal output by a circuit under test is obtained. In a calibration mode, a random clock, which is externally generated or generated by a free-run oscillator in the circuit under test, is used to calibrate the synchronous dual-phase detector. The decision circuit performs logic operations, data latching and counting on a phase relationship detected by the synchronous dual-phase detector in order to obtain a counting value and a PDF relative to the jitter of the clock signal.
摘要:
In a precisely self-calibrating high-speed analog to digital converter the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.
摘要:
A system for clock and data recovery (“CDR”) includes a clock generator, a half-rate phase detector for receiving the input data, an encoder, a phase selector outputting recovered clock, a confidence counter, and a multiplexer outputting recovered data. The clock generator generates an 8-phase clock signal at half a rate of the transmitted serial data. The phase detector samples input data at four times the standard sampling rate, takes the oversampled data and detects phase transitions therein, i.e., phase lead and lag. The encoder encodes the phase transition data. The confidence counter receives the phase transition data and generates a signal representing the accumulated net effect of the phase transitions. The phase selector receives the confidence counter signal and the 8-phase clock from the clock generator, and determines the optimum phase for data sampling.
摘要:
A precisely self-calibrating high-speed analog to digital converter is disclosed, wherein the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.
摘要:
Disclosed is a sample and hold circuit for detecting a parameter of a data signal, which includes: a first switching module, wherein the sample and hold circuit samples the data signal according to the turning on or off of the first switching module; at least one capacitor, coupled to the first switching module; a second switching module, coupled to the capacitor; a controllable reference voltage source, for providing a first reference voltage to charge/discharge the capacitor via the second switching module according to a control signal; a first comparator, coupled to the capacitor, for comparing a voltage drop on the capacitor and the first reference voltage to generate a first comparing result; and a control circuit, coupled to the controllable reference voltage source and the first comparator, for generating the control signal according to the comparing results.
摘要:
Disclosed is a sample and hold circuit for detecting a parameter of a data signal, which includes: a first switching module, wherein the sample and hold circuit samples the data signal according to the turning on or off of the first switching module; at least one capacitor, coupled to the first switching module; a second switching module, coupled to the capacitor; a controllable reference voltage source, for providing a first reference voltage to charge/discharge the capacitor via the second switching module according to a control signal; a first comparator, coupled to the capacitor, for comparing a voltage drop on the capacitor and the first reference voltage to generate a first comparing result; and a control circuit, coupled to the controllable reference voltage source and the first comparator, for generating the control signal according to the comparing results.
摘要:
A buffer circuit having an input terminal and an output terminal comprises a first inverter having an input node coupled to the input terminal and an output node coupled to the output terminal, a second inverter having an input node coupled to a reference voltage and an output node, a third inverter having an input node coupled to the output terminal and an output node coupled to the output node of the second inverter, a fourth inverter having an input node coupled to the output node of the second inverter and an output node coupled to the output terminal, a fifth inverter having an input node and an output node coupled to the output terminal, a sixth inverter having an input node and an output node coupled to the output node of the second inverter, a first resistive element is coupled between the output terminal and the input node of the fifth inverter, and a second resistive element is coupled between the output node of the second inverter and the input node of the sixth inverter.
摘要:
A jitter measurement circuit and a method for calibrating the jitter measurement circuit are disclosed. The jitter measurement circuit includes a synchronous dual-phase detector and a decision circuit. In a test mode, a probability distribution function (PDF) of the jitter of a clock signal output by a circuit under test is obtained. In a calibration mode, a random clock, which is externally generated or generated by a free-run oscillator in the circuit under test, is used to calibrate the synchronous dual-phase detector. The decision circuit performs logic operations, data latching and counting on a phase relationship detected by the synchronous dual-phase detector in order to obtain a counting value and a PDF relative to the jitter of the clock signal.