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1.发明授权Method and apparatus for testing circuits having different configurations with a single test fixture 失效用单个测试夹具测试具有不同结构的电路的方法和装置公开(公告)号：US06252414B1
公开(公告)日：2001-06-26
申请号：US09140225
申请日：1998-08-26
IPC分类号： G01R3102
CPC分类号： G01R31/2884
摘要： A fixture for testing circuits includes a rectangular array of conductive test pads, alternating with insulating areas in a checkerboard-like pattern. In a first embodiment, the entire array is printed on a central portion of a plastic membrane, with outer portions of the membrane carrying electrical lines from the test pads to connectors. In a second embodiment, the rectangular array is formed on surfaces of a number of closely packet plastic membranes, each of which has tabs extending away from the testing surface to connectors. The test fixture is generic, not being configured for testing a particular circuit configuration. To compensate for conditions of linear misalignment, the rectangular array is moved in a raster pattern having a size equal to the cell size of the rectangular array. To compensate for conditions of angular misalignment, the array may be rotated after such misalignment is measured, or test results may be compared with exemplary data for a number of misalignment conditions.
摘要翻译： 用于测试电路的夹具包括导电测试焊盘的矩形阵列，与棋盘状图案的绝缘区域交替。 在第一实施例中，整个阵列印刷在塑料膜的中心部分上，膜的外部部分将电线从测试垫传送到连接器。 在第二实施例中，矩形阵列形成在多个紧密包装的塑料膜的表面上，每个塑料膜具有从测试表面延伸到连接器的突出部。 测试夹具是通用的，未配置用于测试特定的电路配置。 为了补偿线性未对准的条件，矩形阵列以尺寸等于矩形阵列的单元大小的光栅图案移动。 为了补偿角度未对准的情况，可以在测量这种不对准之后旋转阵列，或者可以将测试结果与许多不对准条件的示例性数据进行比较。
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公开(公告)号：US5757159A
公开(公告)日：1998-05-26
申请号：US728657
申请日：1996-10-10
CPC分类号： G01R1/06705 , G01R31/2887 , Y10T82/14
摘要： An actuator providing Z-direction movement within a positioning system extends between an input stage and an output stage. A nut is mounted to rotate on the input stage in threaded engagement with a screw extending into the nut from the output stage. The nut is driven by a motor also mounted on the input stage. A plate attached to the output stage through a flexible leaf spring slides along the input stage in the Z-direction with movement of the output stage, preventing rotation of the output stage about the axis of the screw. Lateral positioning of the screw results from the threaded engagement of the screw and nut. The leaf spring is formed to provide a lateral pre-load force between the screw and nut.
摘要翻译： 在定位系统内提供Z方向移动的致动器在输入级和输出级之间延伸。 螺母被安装成在输入台上旋转，与从输出级延伸到螺母中的螺钉螺纹接合。 螺母由安装在输入级上的电机驱动。 通过柔性板簧安装在输出台上的板通过输出级的运动沿Z方向滑动输入级，防止输出级围绕螺杆的轴线旋转。 螺钉的横向定位取决于螺钉和螺母的螺纹接合。 板簧形成为在螺钉和螺母之间提供横向预加载力。
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公开(公告)号：US6034524A
公开(公告)日：2000-03-07
申请号：US895709
申请日：1997-07-17
CPC分类号： G01R31/2887
摘要： A test system for applying electrical tests to circuits on flexible substrates includes a first transport system moving frames, each of which is configured for holding a single such flexible substrate, a loading station in which the substrates are individually loaded onto the frames, a testing station in which the electrical tests are applied, and an unloading station in which the substrates are removed from the frames. Within the testing station, each frame is disengaged from the first transport system and fastened to a second transport system, which moves the frame in a pattern causing a number of segments of the substrate within the frame to be placed between probe arrays adjacent each of the opposite sides of the substrate. These arrays are each aligned with visual markings on the adjacent side of the substrate, and the arrays are then moved into engagement with the substrate for the testing process. When testing of a particular substrate is complete, the frame is disengaged from the second transport system and fastened to the first transport system to be carried to the unloading station.
摘要翻译： 用于对柔性基板上的电路进行电测试的测试系统包括第一传送系统移动框架，每个框架被构造用于保持单个这样的柔性基板，其中基板分别装载到框架上的装载站，测试站 其中施加电测试，以及卸载站，其中基板从框架中移除。 在测试站内，每个框架与第一传送系统脱离接合并固定到第二传送系统，该第二传送系统使框架以图案移动，使得框架内的基板的多个段被放置在与每个 基板的相对两侧。 这些阵列各自与衬底的相邻侧上的视觉标记对准，然后将阵列移动到与衬底接合以进行测试过程。 当特定基底的测试完成时，框架与第二输送系统脱离接合并固定到第一输送系统以被运送到卸载站。
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公开(公告)号：US6023171A
公开(公告)日：2000-02-08
申请号：US910428
申请日：1997-08-13
申请人： James Edward Boyette, Jr. , Robert Edward Brown , Christian J. Bunker , James Christopher Mahlbacher
发明人： James Edward Boyette, Jr. , Robert Edward Brown , Christian J. Bunker , James Christopher Mahlbacher
CPC分类号： G01R1/07342
摘要： A dual contact probe tip is provided within a flying probe circuit tester to make separate electrical contacts with a circuit under test at two closely-spaced test points. The tip includes a mounting block having an attachment section attached to a carriage of the tester and a pair of flexible cantilever sections, with a probe pin extending from a distal end of each of these cantilever sections to make contact with the circuit. One electrical path is established through the conductive mounting block and one of the probe pins. The other probe pin is coated with an insulating material except for its point and for a surface to which a wire is soldered, so that the other electrical path is established through this other probe pin and the attached wire. Each probe pin is tapered toward its point, and the probe pins extend from the mounting block at an oblique angle toward one another.
摘要翻译： 飞针探针电路测试仪中提供双接触探头，以在两个紧密间隔的测试点与被测电路分开电接触。 尖端包括安装块，其具有连接到测试器的托架上的附接部分和一对柔性悬臂部分，探针从这些悬臂部分的每一个的远端延伸以与电路接触。 通过导电安装块和探针之一建立一条电路。 另一个探针被除绝缘材料外面涂覆绝缘材料，除了焊点表面之外，还可以通过另一个探针和附着线建立另一个探针。 每个探针都朝向其尖端逐渐变细，探针从安装块以相互倾斜的角度相对延伸。
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公开(公告)号：US6093930A
公开(公告)日：2000-07-25
申请号：US54013
申请日：1998-04-02
申请人： James Edward Boyette, Jr. , James Michael Hammond , Salvatore R. Riggio, Jr. , Michael Servedio
发明人： James Edward Boyette, Jr. , James Michael Hammond , Salvatore R. Riggio, Jr. , Michael Servedio
IPC分类号： G01Q70/02 , G01Q70/14 , H01J37/067
CPC分类号： G01Q70/02 , B82Y35/00 , Y10S977/86
摘要： A scanning probe microscope having a probe attachment fixture, to which a probe assembly is removably attached during measurements, driven in an engagement direction, and a sample stage driven in scanning directions perpendicular to the engagement direction includes a buffer with a number of buffer stations within the sample stage. When the stage is driven so that one of the buffer stations is in alignment with the attachment fixture, and when the attachment fixture is driven in the engagement direction to be in proximity to the buffer station, the probe assembly is selectively transferred in either direction between the attachment fixture and the buffer station. In a preferred embodiment, probe assemblies are transferred on transfer pallets, and a stationary magazine is provided for storing these pallets, which are transferred in either direction between the magazine and the buffer.
摘要翻译： 一种扫描探针显微镜，其具有探针附接固定装置，探测器组件在测量期间以接合方向被驱动而可移除地附接到该探针附件，并且沿垂直于接合方向的扫描方向驱动的样本台包括具有多个缓冲站的缓冲器， 样品阶段。 当舞台被驱动使得缓冲站中的一个与附接夹具对准时，并且当附接夹具沿接合方向被驱动以接近缓冲站时，探针组件选择性地在 附件夹具和缓冲站。 在优选实施例中，探针组件被转移到转移托盘上，并且提供固定盒以存储这些托盘，这些托盘在盒和缓冲器之间沿任一方向传送。
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