公开(公告)号：US20130162692A1

公开(公告)日：2013-06-27

申请号：US13611093

申请日：2012-09-12

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: G09G3/32 ,  G09G5/10

CPC classification number: G01J1/0422 ,  G01J1/4228 ,  G01J2001/0481 ,  G01J2001/4252 ,  G01R31/2635

Abstract: A luminance test system includes a plurality of LEDs, a microcontroller, a plurality of light sensors, a plurality of shielding members, a plurality of AD converters, a MCU and a display module. Each of the plurality of light sensors detects a luminance of one of the plurality of LEDs to generate an analog luminance signal. Each of the shielding members receives one of the plurality of LEDs and one of the plurality of light sensors. Each of the plurality AD converters converts the analog luminance signal into a digital luminance signal. The plurality of AD converters in turn transmit the digital luminance signal to the MCU. The display module displays a luminance value of each of the plurality of LEDs according to the digital luminance signal.

Abstract translation: 亮度测试系统包括多个LED，微控制器，多个光传感器，多个屏蔽构件，多个AD转换器，MCU和显示模块。 多个光传感器中的每一个检测多个LED中的一个的亮度以产生模拟亮度信号。 每个屏蔽构件接收多个LED中的一个和多个光传感器中的一个。 多个AD转换器中的每一个将模拟亮度信号转换为数字亮度信号。 多个AD转换器又将数字亮度信号发送到MCU。 显示模块根据数字亮度信号显示多个LED中的每一个的亮度值。

公开(公告)号：US20130162317A1

公开(公告)日：2013-06-27

申请号：US13589293

申请日：2012-08-20

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: H03L5/00

CPC classification number: G01R31/31705

Abstract: A system for processing signals includes an original wave outputting module, a signal sampling module and a signal processing module. The signal processing module includes an SCM, an FGPA chip and an amplifier electrically connected to the SCM. The original wave outputting module outputs an originating wave. The signal sampling module samples the wave, and outputs a plurality of signals. The signal processing module receives the plurality of signals, and outputs an amplified wave. The SCM has a predetermined wave frequency value and a predetermined wave amplitude value. The FGPA chip generates digital signals according to the predetermined wave frequency value. The amplifier amplifies the digital signals according to the predetermined wave amplitude value.

Abstract translation: 用于处理信号的系统包括原始波输出模块，信号采样模块和信号处理模块。 信号处理模块包括SCM，FGPA芯片和与SCM电连接的放大器。 原波输出模块输出起始波。 信号采样模块对波进行采样，并输出多个信号。 信号处理模块接收多个信号，并输出放大的波。 SCM具有预定的波频率值和预定的波幅值。 FGPA芯片根据预定的波频率值产生数字信号。 放大器根据预定的波幅值放大数字信号。

公开(公告)号：US20130151900A1

公开(公告)日：2013-06-13

申请号：US13592487

申请日：2012-08-23

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: G06F11/28

CPC classification number: G06F11/221 ,  G06F11/321

Abstract: A debug system includes a debug device and a computer. The debug device includes an SPI reading and writing module, a first control module, a detecting module, and a signal receiving and transmitting module. The computer includes a second control module and a display module. The SPI reading and writing module is connected to an SPI device. The second control module sends an inputted write command to the first control module. The first control module writes data to the SPI device according to the inputted write command. The detecting module sends a fail signal to the first control module after detecting that the data is not written to the SPI device and a written times of the data is greater than a predetermined times. The first control module sends the fail signal to the second control module. The second control module displays the fail signal on the display module.

Abstract translation: 调试系统包括调试设备和计算机。 调试装置包括SPI读写模块，第一控制模块，检测模块和信号接收和发送模块。 计算机包括第二控制模块和显示模块。 SPI读写模块连接到SPI器件。 第二控制模块向第一控制模块发送输入的写命令。 第一控制模块根据输入的写命令将数据写入SPI设备。 检测模块在检测到数据未被写入SPI设备并且数据的写入时间大于预定时间之后，向第一控制模块发送故障信号。 第一控制模块将故障信号发送到第二控制模块。 第二个控制模块在显示模块上显示故障信号。

公开(公告)号：US08626343B2

公开(公告)日：2014-01-07

申请号：US13015023

申请日：2011-01-27

Applicant: Shu-Hsien Chou ,  Li-Wen Guo ,  Kang-Bin Wang ,  Bi-Hui Tan

Inventor： Shu-Hsien Chou ,  Li-Wen Guo ,  Kang-Bin Wang ,  Bi-Hui Tan

IPC: G06F19/00

CPC classification number: G06F11/3058 ,  G06F1/206 ,  H05K7/20836

Abstract: A monitor and control system includes a server model, a number of switches, a temperature sensor mounted in the server model, a monitor and control device, and a microcontroller. The switches are connected to the resistors to control current through the resistors. The temperature sensor is mounted in the server model. The monitor and control device is connected to the server model and configured to monitor and control the server model. The microcontroller is configured to switch the switches on and off and send temperature information sensed by the temperature sensor to the monitor and control device.

Abstract translation: 监视器和控制系统包括服务器模型，多个开关，安装在服务器模型中的温度传感器，监视器和控制装置以及微控制器。 开关连接到电阻器以控制通过电阻器的电流。 温度传感器安装在服务器型号中。 监视和控制设备连接到服务器型号，并配置为监视和控制服务器型号。 微控制器被配置为打开和关闭开关，并将由温度传感器感测的温度信息发送到监视器和控制装置。

公开(公告)号：US20130151902A1

公开(公告)日：2013-06-13

申请号：US13559543

申请日：2012-07-26

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: G06F11/28

CPC classification number: G06F11/3656

Abstract: A debug system includes a debug device and a computer. The debug device includes an IIC reading and writing module, a first control module; and a signal receiving and transmitting module. The computer includes a second control module. The IIC reading and writing module is connected to an IIC device. The second control module sends an inputted command to the first control module via the signal receiving and transmitting module. The first control module reads data from the IIC device or writes data to the IIC device via the IIC reading and writing module according to the inputted command

Abstract translation: 调试系统包括调试设备和计算机。 调试装置包括IIC读写模块，第一控制模块; 和信号接收和发送模块。 计算机包括第二控制模块。 IIC读写模块连接到IIC设备。 第二控制模块经由信号接收和发送模块向第一控制模块发送输入的命令。 第一控制模块从IIC设备读取数据，或者通过IIC读写模块根据输入的命令将数据写入IIC设备

公开(公告)号：US20130159777A1

公开(公告)日：2013-06-20

申请号：US13564793

申请日：2012-08-02

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: G06F11/28

CPC classification number: G06F11/273

Abstract: A testing system for testing an under test electronic device, includes an error capturing and latching unit, a storage unit, and a control terminal. The error capturing and latching unit detects and captures running error signals of the under test electronic device. The storage unit stores the running error signals. The control terminal is connected to the storage unit. The control terminal picks out the running error signals from the storage unit and analyzes these signals.

Abstract translation: 用于测试电子设备的测试系统包括错误捕获和锁存单元，存储单元和控制终端。 错误捕获和锁定单元检测并捕获被测电子设备的运行中的错误信号。 存储单元存储运行中的错误信号。 控制终端连接到存储单元。 控制终端从存储单元中取出运行中的错误信号并分析这些信号。

公开(公告)号：US20130036275A1

公开(公告)日：2013-02-07

申请号：US13527663

申请日：2012-06-20

Applicant: KANG-BIN WANG

Inventor： KANG-BIN WANG

IPC: G06F12/00

CPC classification number: G06F13/24

Abstract: A circuit for the rapid transmission of data is presented. The circuit includes a control unit, a data storage unit, and a data processing unit. The data processing unit includes an interrupt module, a processor chipset, an access controller, a first register and a second register. The interrupt module is connected to the control unit and receives an interrupt signal from the control unit. The access controller reads data from the data storage unit according to a beginning address and an ending address included in the interrupt signal and stores the retrieved data alternately in the first register and in the second register. The processor chipset retrieves and displays data from the second register when data is in the first register and retrieves and displays data from the first register when data is in the second register.

Abstract translation: 提出了一种快速传输数据的电路。 电路包括控制单元，数据存储单元和数据处理单元。 数据处理单元包括中断模块，处理器芯片组，访问控制器，第一寄存器和第二寄存器。 中断模块连接到控制单元，并从控制单元接收中断信号。 访问控制器根据包含在中断信号中的起始地址和结束地址从数据存储单元读取数据，并将所检索的数据交替存储在第一寄存器和第二寄存器中。 当数据在第一个寄存器中时，处理器芯片组检索并显示来自第二个寄存器的数据，当数据位于第二个寄存器中时，处理器芯片组从第一个寄存器中检索并显示数据。

公开(公告)号：US20120032510A1

公开(公告)日：2012-02-09

申请号：US13005744

申请日：2011-01-13

Applicant: SHU-HSIEN CHOU ,  KANG-BIN WANG ,  LI-WEN GUO ,  BI-HUI TAN

Inventor： SHU-HSIEN CHOU ,  KANG-BIN WANG ,  LI-WEN GUO ,  BI-HUI TAN

IPC: H02J4/00

CPC classification number: G06F11/3058 ,  G06F11/3048 ,  G06F11/3062 ,  G06F11/3093 ,  Y10T307/25 ,  Y10T307/461 ,  Y10T307/469 ,  Y10T307/615

Abstract: In a server management method, a blade server system including a plurality of blade servers is connected to a monitor device in series. The monitor device sends a command to the server system to control the plurality of blade servers. The plurality of blade servers responds to the command. The monitor device receives information from the server system to monitor and control the plurality of blade servers. A server monitor system associated with the server monitor method is also disclosed.

Abstract translation: 在服务器管理方法中，包括多个刀片服务器的刀片服务器系统与监视器装置串联连接。 监视器装置向服务器系统发送命令以控制多个刀片服务器。 多个刀片服务器响应命令。 监视器装置从服务器系统接收信息以监视和控制多个刀片服务器。 还公开了与服务器监视器方法相关联的服务器监视器系统。

公开(公告)号：US08791595B2

公开(公告)日：2014-07-29

申请号：US13005744

申请日：2011-01-13

Applicant: Shu-Hsien Chou ,  Kang-Bin Wang ,  Li-Wen Guo ,  Bi-Hui Tan

Inventor： Shu-Hsien Chou ,  Kang-Bin Wang ,  Li-Wen Guo ,  Bi-Hui Tan

IPC: H02J3/14 ,  H02J3/00 ,  H02J9/00 ,  G05D23/00 ,  G06F11/30

CPC classification number: G06F11/3058 ,  G06F11/3048 ,  G06F11/3062 ,  G06F11/3093 ,  Y10T307/25 ,  Y10T307/461 ,  Y10T307/469 ,  Y10T307/615

Abstract: In a server management method, a blade server system including a plurality of blade servers is connected to a monitor device in series. The monitor device sends a command to the server system to control the plurality of blade servers. The plurality of blade servers responds to the command. The monitor device receives information from the server system to monitor and control the plurality of blade servers. A server monitor system associated with the server monitor method is also disclosed.

Abstract translation: 在服务器管理方法中，包括多个刀片服务器的刀片服务器系统与监视器装置串联连接。 监视器装置向服务器系统发送命令以控制多个刀片服务器。 多个刀片服务器响应命令。 监视器装置从服务器系统接收信息以监视和控制多个刀片服务器。 还公开了与服务器监视器方法相关联的服务器监视器系统。

公开(公告)号：US08717207B2

公开(公告)日：2014-05-06

申请号：US13589293

申请日：2012-08-20

Applicant: Kang-Bin Wang

Inventor： Kang-Bin Wang

IPC: H03M1/00

CPC classification number: G01R31/31705

Abstract: A system for processing signals includes an original wave outputting module, a signal sampling module and a signal processing module. The signal processing module includes an SCM, an FGPA chip and an amplifier electrically connected to the SCM. The original wave outputting module outputs an originating wave. The signal sampling module samples the wave, and outputs a plurality of signals. The signal processing module receives the plurality of signals, and outputs an amplified wave. The SCM has a predetermined wave frequency value and a predetermined wave amplitude value. The FGPA chip generates digital signals according to the predetermined wave frequency value. The amplifier amplifies the digital signals according to the predetermined wave amplitude value.

Abstract translation: 用于处理信号的系统包括原始波输出模块，信号采样模块和信号处理模块。 信号处理模块包括SCM，FGPA芯片和与SCM电连接的放大器。 原波输出模块输出起始波。 信号采样模块对波进行采样，并输出多个信号。 信号处理模块接收多个信号，并输出放大的波。 SCM具有预定的波频率值和预定的波幅值。 FGPA芯片根据预定的波频率值产生数字信号。 放大器根据预定的波幅值放大数字信号。