Abstract:
A wake-up circuit of a memory device employs a cascade chain structure in which bit lines are divided into a plurality of blocks, and if the bit lines of one of the blocks are determined to have undergone a wake-up operation based on a bit line voltage fed back in the block, the wake-up operation is performed on a subsequent block. Accordingly, a wake-up delay can be varied, and therefore peak currents can be controlled, thereby reducing overall system power noise.
Abstract:
A wake-up circuit of a memory device employs a cascade chain structure in which bit lines are divided into a plurality of blocks, and if the bit lines of one of the blocks are determined to have undergone a wake-up operation based on a bit line voltage fed back in the block, the wake-up operation is performed on a subsequent block. Accordingly, a wake-up delay can be varied, and therefore peak currents can be controlled, thereby reducing overall system power noise.
Abstract:
Integrated circuit memory devices with latch-free page buffers therein include a page buffer for electrically coupling a bit line from an array of memory cells to a buffer output. The page buffers generate a first logic state at an output thereof when the bit line is at a first logic potential and a high-impedance logic state when the bit line is at a second logic potential, during a memory read operation. An output buffer is also provided for converting the high-impedance state and the first logic state generated by the page buffer to respective opposite logic states (e.g, logic 1 and logic 0). The bit line data is used to directly trigger the appropriate state of the page buffer output by coupling a gate of an insulated-gate isolation transistor to the bit line data and then reading the source of the isolation transistor as the page buffer output.
Abstract:
A wake-up circuit of a memory device employs a cascade chain structure in which bit lines are divided into a plurality of blocks, and if the bit lines of one of the blocks are determined to have undergone a wake-up operation based on a bit line voltage fed back in the block, the wake-up operation is performed on a subsequent block. Accordingly, a wake-up delay can be varied, and therefore peak currents can be controlled, thereby reducing overall system power noise.
Abstract:
A wake-up circuit of a memory device employs a cascade chain structure in which bit lines are divided into a plurality of blocks, and if the bit lines of one of the blocks are determined to have undergone a wake-up operation based on a bit line voltage fed back in the block, the wake-up operation is performed on a subsequent block. Accordingly, a wake-up delay can be varied, and therefore peak currents can be controlled, thereby reducing overall system power noise.
Abstract:
The semiconductor memory device includes a memory cell array, sense amplifying means for generating a sense output signal pair, and a data output buffer for providing the sense output signal pair. The data output buffer includes a level shifter for generating a first data output signal pair by shifting the level of the sense output signal pair responsive to the output buffer enable signal. A register inverts and latches the first data output signal pair, generating a second data output signal pair. A first transmission and latch means transmits and latches the second data output signal pair generating a third data output signal pair responsive to a first control signal. A second transmission and latch means transmits and latches the second data output signal pair generating a fourth data output signal pair responsive to a second control signal. A first inverter generates a fifth data output signal pair by inverting the third data output signal pair responsive to a first data output control signal. A second inverter generates the fifth data output signal pair by inverting the fourth data output signal pair responsive to a second data output control signal. A first latch generates a sixth data output signal pair by latching the fifth data output signal pair. A logical multiplication means manipulates the sixth data output signal pair responsive to an output enable signal.
Abstract:
A decoding circuit and method for a semiconductor memory device simplifies a decoding process by individually performing a large block decoding and small block decoding operations, and thereby reduces the total time delay taken in an address decoding process and layout area occupied by decoding circuits. The decoding circuit for a semiconductor memory device having a memory cell array including a plurality of large blocks, each large block including m small blocks (wherein m=2,3, . . . ) and having a plurality of memory cells being arranged in a matrix form, and a plurality of reading/writing circuits each corresponding to said large blocks, includes a first decoding circuit for receiving a first address to simultaneously select respective specific small block in each of the large blocks, corresponding to the first address, and a second decoding circuit for receiving a second address to enable a selected one of the reading/writing circuits corresponding to said second address.
Abstract:
An input buffer includes a low-speed input buffer for buffering an input signal at the time of low-speed operation, a high-speed input buffer being controlled by the low-speed input buffer, for adjusting the high-level and low-level logic of an input signal at the time of high-speed operation and an output driver for outputting high-level or low-level logic by inputting the output signal of the high-speed input buffer. Therefore, there is no direct current present, the operational speed is increased and noise can be reduced.