-
1.发明授权Ion bombardment of electrical lapping guides to decrease noise during lapping process 失效离子轰击电气研磨导轨，以减少研磨过程中的噪音公开(公告)号：US07332099B2
公开(公告)日：2008-02-19
申请号：US11246727
申请日：2005-10-06
IPC分类号： G11B5/127
CPC分类号： B24B37/042 , Y10T29/49034 , Y10T29/49046 , Y10T29/49048
摘要： A method for reducing noise in a lapping guide. Selected portions of a magnetoresistive device wafer are bombarded with ions such that a magnetoresistive effect of lapping guides is reduced. The device is lapped, using the lapping guides to measure an extent of the lapping.
摘要翻译： 一种降低研磨导轨中噪音的方法。 用离子轰击磁阻器件晶片的选定部分，使得研磨导轨的磁阻效应降低。 研磨装置，使用研磨导轨测量研磨的程度。
-
2.发明授权Ion bombardment of electrical lapping guides to decrease noise during lapping process 失效离子轰击电气研磨导轨，以减少研磨过程中的噪音公开(公告)号：US06982042B2
公开(公告)日：2006-01-03
申请号：US10377854
申请日：2003-02-28
IPC分类号： G11B11/39
CPC分类号： B24B37/042 , Y10T29/49034 , Y10T29/49046 , Y10T29/49048
摘要： A method for reducing noise in a lapping guide. Selected portions of a Giant magnetoresistive device wafer are masked, thereby defining masked and unmasked regions of the wafer in which the unmasked regions include lapping guides. The wafer is bombarded with ions such that a Giant magnetoresistive effect of the unmasked regions is reduced. The GMR device is lapped, using the lapping guides to measure an extent of the lapping
摘要翻译： 一种降低研磨导轨中噪音的方法。 掩蔽了巨型磁阻器件晶片的选定部分，由此限定晶片的掩蔽和未掩模区域，其中未掩蔽区域包括研磨引导件。 用离子轰击晶片，使得未掩蔽区域的巨磁阻效应降低。 研磨GMR装置，使用研磨导轨测量研磨的程度
-
3.发明授权Multi-chambered, compliant apparatus for restraining workpiece and applying variable pressure thereto during lapping to improve flatness characteristics of workpiece 有权用于限制工件并在研磨过程中施加可变压力的多室兼容装置，以改善工件的平整度特性公开(公告)号：US06846222B2
公开(公告)日：2005-01-25
申请号：US10379497
申请日：2003-03-04
CPC分类号： B24B37/16 , B24B21/04 , B24B37/048 , B24B49/16
摘要： An apparatus and method of lapping of rows of magnetic recording heads uses multiple fluid-filled ports with variable pressure against a flexible adhesive tape to secure to and support the row. The tape provides the necessary tangential restraining force to drag the workpiece along a lapping plate. The multiple ports beneath the tape provide the necessary normal force to press the workpiece against the lapping plate to allow lapping to occur. The amount of material removal from the row is varied by adjusting the pressure in the ports such that higher pressure is applied to those heads with higher stripe height, and lower pressure is applied to recording heads with lower stripe height. To set or adjust the port pressures, measurements of the read sensor resistance are taken to calculate the stripe height. The stripe height is roughly proportional to the reciprocal of resistance.
摘要翻译： 研磨磁记录头的行的装置和方法使用多个流体填充的端口，其可变压力抵靠柔性胶带固定并支撑该行。 胶带提供必要的切向限制力，以沿研磨板拖动工件。 胶带下面的多个端口提供必要的法向力，以将工件压靠在研磨板上以允许研磨发生。 通过调节端口中的压力来改变从行排出的材料的量，使得对具有较高条纹高度的那些头部施加更高的压力，并且将较低的压力施加到具有较低条纹高度的记录头。 要设置或调整端口压力，可以测量读取传感器电阻以计算条带高度。 条纹高度大致与电阻倒数成正比。
-
4.发明授权Magneto-resistive device with built-in test structure and method for determining resistance and track width 失效具有内置测试结构的磁阻元件和确定电阻和轨道宽度的方法公开(公告)号：US06731110B2
公开(公告)日：2004-05-04
申请号：US10156218
申请日：2002-05-28
申请人： Mark A. Church
发明人： Mark A. Church
IPC分类号： G11B5455
CPC分类号： G11B5/3903 , G11B5/012 , G11B5/105 , G11B5/3116 , G11B5/3166 , G11B5/3173 , G11B5/455 , G11B5/4886 , G11B27/36 , G11B2005/0016 , G11B2220/20 , Y10T29/49036
摘要： A magneto-resistive device with built-in test structure. The magneto-resistive device includes a slider having first and second lower termination pads and first and second upper termination pads. A first conductive trace element electrically couples the first lower termination pad to the first upper termination pad and a second conductive trace element electrically couples the second lower termination pad to said second upper termination pad. The magneto-resistive device also includes a magneto-resistive transducer deposited on the slider and the resistance of the magneto-resistive transducer is obtained by passing an electrical current between the first and second lower termination pads and measuring a voltage across the first and second upper termination pads.
摘要翻译： 具有内置测试结构的磁阻设备。 磁阻装置包括具有第一和第二下端接焊盘以及第一和第二上端接焊盘的滑块。 第一导电迹线元件将第一下端接焊盘电耦合到第一上终端焊盘，而第二导电迹线元件将第二下端接焊盘电耦合到所述第二上端接焊盘。 磁阻设备还包括沉积在滑块上的磁阻换能器，并且磁阻换能器的电阻是通过在第一和第二下端接焊盘之间通过电流并测量跨越第一和第二上端 端接垫
-
公开(公告)号：US06684171B2
公开(公告)日：2004-01-27
申请号：US10127198
申请日：2002-04-22
IPC分类号： G06F1900
CPC分类号： G11B5/3903 , G11B5/102 , G11B5/105 , G11B5/3103 , G11B5/3116 , G11B5/3166 , G11B5/3169 , G11B5/3173 , G11B5/3967 , G11B5/455 , G11B2005/0016
摘要： An in-situ (result-directed/predictive) MR stripe height calibration method capable of operating on the fly during lapping operation. The method involves utilization of an interval sampling technique, which provides a high number of data points. The data provided are filtered and averaged at each kerf location to provide a much higher calibration accuracy than previously available. The primary advantage is to create an accurate relationship between MR element resistance and its stripe height while the MR element is being lapped. The method thus provides the ability to target either resistance or stripe height or a combination of both during the lapping process. Finally, the system is completely self-contained and does not required wafer data.
摘要翻译： 原位（结果导向/预测）MR条纹高度校准方法，能够在研磨操作期间在飞行中进行操作。 该方法涉及利用间隔采样技术，其提供了大量的数据点。 提供的数据在每个切口位置进行过滤和平均，以提供比以前可用的更高的校准精度。 主要优点是在MR元件被研磨的同时，在MR元件电阻与其条纹高度之间产生准确的关系。 因此，该方法提供了在研磨过程中靶向电阻或条纹高度或二者的组合的能力。 最后，系统是完全独立的，不需要晶圆数据。
-
公开(公告)号：US5876264A
公开(公告)日：1999-03-02
申请号：US845339
申请日：1997-04-25
CPC分类号： G11B5/3903 , G11B5/3166 , G11B5/1871 , G11B5/3103 , G11B5/3116
摘要： Disclosed is an apparatus and method for calibrating the deposition windage of deposited thin film resistive elements, such as magnetoresistive read elements for magnetic heads which are to be lapped, comprising one set of at least three resistive elements having different nominal height dimensions, a resistance detector for measuring the resistance of each of the resistive elements, and a windage calculator responsive to the nominal height dimensions and to the measured resistances of each of the resistive elements for calculating the windage of the one set of resistive elements.
摘要翻译： 公开了用于校准沉积的薄膜电阻元件的沉积风阻的装置和方法，例如要研磨的磁头的磁阻读取元件，包括一组至少三个具有不同标称高度尺寸的电阻元件，电阻检测器 用于测量每个电阻元件的电阻，以及响应于标称高度尺寸的风阻计算器和用于计算一组电阻元件的风阻的每个电阻元件的测量电阻。
-
7.发明授权Method and apparatus for controlling the throat height of batch fabricated thin film magnetic transducers 失效用于控制批量制造的薄膜磁换能器的喉部高度的方法和装置
公开(公告)号：US4689877A
公开(公告)日：1987-09-01
申请号：US885894
申请日：1986-07-15
申请人： Mark A. Church
发明人： Mark A. Church
CPC分类号： G11B5/3173 , G11B5/1871 , G11B5/3116 , G11B5/314 , G11B5/3166 , Y10T29/49037 , Y10T29/49044 , Y10T29/53022 , Y10T29/5303
摘要： A method for determining the position of a lapped edge of a substrate during lapping of a row of thin film magnetic transducer elements. First and second electrical lapping guide structures are formed on each side of the row of transducer elements. The lapping guide structures include a series of switching junctions, each switching junction paralleled by a resistor. A lapping resistor which provides a change in resistance proportional to the lapping of the row is measured and compared with the position of the lapping plane as determined from each switching junction change of state. Calibration of the resistor versus lapping plane position is effected to permit an accurate determination of the lapped surface from subsequent resistance measurements of the lapping resistor.
摘要翻译： 一种用于在一排薄膜磁换能器元件的研磨期间确定衬底的重叠边缘的位置的方法。 第一和第二电气研磨引导结构形成在换能器元件行的每一侧上。 研磨引导结构包括一系列开关结，每个开关结由电阻器并联。 测量提供与行的研磨成比例的电阻变化的研磨电阻器，并与每个开关结状态变化确定的研磨平面的位置进行比较。 实现电阻器对研磨平面位置的校准，以允许从研磨电阻器的后续电阻测量中精确地确定重叠表面。
-
公开(公告)号：US4219854A
公开(公告)日：1980-08-26
申请号：US972103
申请日：1978-12-21
CPC分类号： G11B5/3136 , G11B5/313
摘要： A thin film magnetic head assembly has a multi-turn electrical conducting coil, which is formed by deposition in an elliptical pattern. By virtue of the elliptical pattern, the coil turn portions between the back gap closure and transducing gap of the thin film head are relatively narrow, whereas the coil turn portions furthest from the transducing gap are widest. Corners and sharp ends are eliminated. Electrical resistance effects are thereby minimized and signal output is enhanced.
摘要翻译： 薄膜磁头组件具有通过以椭圆形图案沉积形成的多匝导电线圈。 由于椭圆形图案，薄膜头的后间隙封闭和换能间隙之间的线圈转动部分相对较窄，而距离换能间隙最远的线圈转动部分最宽。 角落和尖端被消除。 从而电阻效应最小化，信号输出增强。
-
9.发明授权Integrated magnetic recording head assembly including an inductive write subassembly and a magnetoresistive read subassembly 失效集成磁记录头组件，其包括感应写入子组件和磁阻读取子组件
公开(公告)号：US4504880A
公开(公告)日：1985-03-12
申请号：US407007
申请日：1982-08-09
申请人： Mark A. Church , Stephen K. Decker
发明人： Mark A. Church , Stephen K. Decker
CPC分类号： G11B5/3903 , G11B5/3967
摘要： An integrated read/write head assembly incorporates a thin film inductive write head subassembly comprising first and second pole pieces that define a write transducing gap, and a magnetoresistive read subassembly disposed in the write gap. The first write pole piece is extended so as to provide a planar conductive path from the terminal connections or studs to the magnetoresistive read subassembly, thereby forming a uniform surface for deposition of the magnetoresistive read subassembly.
摘要翻译： 集成的读/写头组件包括薄膜感应写头子组件，其包括限定写换能间隙的第一和第二极片，以及设置在写间隙中的磁阻读取子组件。 第一写磁极片被延伸以提供从端子连接或螺柱到磁阻读取子组件的平面导电路径，由此形成用于沉积磁阻读取子组件的均匀表面。
-
公开(公告)号：US6027397A
公开(公告)日：2000-02-22
申请号：US845678
申请日：1997-04-25
IPC分类号： B24B37/005 , B24B49/04 , B24B49/10 , G11B5/187 , G11B5/31 , G11B5/39 , B24B49/02 , G11B5/127
CPC分类号： B24B37/005 , B24B49/04 , B24B49/10 , G11B5/3106 , G11B5/3967 , G11B5/1871 , G11B5/3116 , G11B5/3166 , G11B5/398 , Y10T29/49037 , Y10T29/49043
摘要： A dual element electrical lapping guide system is disclosed for a row of multi-layer dual element magnetoresistive and inductive magnetic transducers formed on a substrate, which will be used to form sliders, the sliders being separated by separation kerfs, and the multi-layer transducers aligned along an edge of the substrate for lapping of the edge. The dual element lapping guide system comprises superposed resistive elements and electrical switch elements, each positioned in one of the separation kerfs, and having an edge thereof positioned so as to be aligned with the edge of the row and subject to lapping of the row. Each electrical switch element comprises a bottom and a top layer connected at one end thereof and separated at the other end thereof by an insulation layer, so as to be initially closed at the connected end, which end is aligned with the edge of the multi-layer transducers and subject to lapping of the row at the connected end to open the switch element.
摘要翻译： 公开了一种用于形成在基板上的多层双元件磁阻和电感式磁换能器的行的双元件电研磨引导系统，其将用于形成滑块，滑块由分离切口分开，并且多层换能器 沿着衬底的边缘排列以研磨边缘。 双元件研磨引导系统包括重叠的电阻元件和电气开关元件，每个电极元件和电气开关元件均位于分离切口之一中，并且其边缘被定位成与行的边缘对准并且经受研磨。 每个电气开关元件包括一个底部和一个在其一端连接并在另一端分隔绝缘层的顶层，以便在连接端初始关闭，该端部与多层结构的边缘对准， 并且在连接端进行研磨以打开开关元件。
-
-
-
-
-
-
-
-
-
搜索结果
19 条记录 (耗时 0.018 秒)