公开(公告)号：US08559255B2

公开(公告)日：2013-10-15

申请号：US13569442

申请日：2012-08-08

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C7/00

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US07453724B2

公开(公告)日：2008-11-18

申请号：US11931992

申请日：2007-10-31

Applicant: Aaron Lee ,  Hounien Chen ,  Sachit Chandra ,  Nancy Leong ,  Guowei Wang

Inventor： Aaron Lee ,  Hounien Chen ,  Sachit Chandra ,  Nancy Leong ,  Guowei Wang

IPC: G11C11/34 ,  G11C16/06

CPC classification number: G11C16/0475 ,  G11C16/3454 ,  G11C16/3459

Abstract: A method is provided for programming a nonvolatile memory device including an array of memory cells, where each memory cell including a substrate, a control gate, a charge storage element, a source region and a drain region. The method includes receiving a programming window that identifies a plurality of memory cells in the array. A first group of memory cells to be programmed is identified from the plurality of memory cells in the programming window. The first group of memory cells is programmed and a programming state of the first group of memory cells is verified.

Abstract translation: 提供了一种用于对包括存储器单元阵列的非易失性存储器件进行编程的方法，其中每个存储器单元包括衬底，控制栅极，电荷存储元件，源极区域和漏极区域。 该方法包括接收标识阵列中的多个存储单元的编程窗口。 在编程窗口中从多个存储器单元识别要编程的第一组存储器单元。 第一组存储器单元被编程，并且验证第一组存储器单元的编程状态。

公开(公告)号：US6101129A

公开(公告)日：2000-08-08

申请号：US291984

申请日：1999-04-14

Applicant: Johnny Chen ,  Tiao-Hua Kuo ,  Nancy Leong

Inventor： Johnny Chen ,  Tiao-Hua Kuo ,  Nancy Leong

IPC: G11C16/16 ,  G11C16/04

CPC classification number: G11C16/16

Abstract: A method for fast chip erase of memory cells in a non-volatile memory array comprises the steps of providing an acceleration voltage greater than the internal pump voltage supplied by a conventional internal voltage supply pump, providing an erase write command, and performing a fast erase operation on the memory cells, comprising the step of coupling the acceleration voltage to the sources of the memory cells in a plurality of sectors simultaneously. In an embodiment, a fast preprogramming operation is performed on the memory cells prior to the step of performing the fast erase operation in the fast chip erase mode. In a further embodiment, a fast weak programming (APDE) operation is performed on the memory cells subsequent to the step of performing the fast erase operation in the fast chip erase mode. In an additional embodiment, the step of performing the fast erase operation further comprises the steps of detecting the acceleration voltage, generating an acceleration voltage indicator signal in response to the detection of the acceleration voltage, and generating a fast chip erase write command in response to the acceleration voltage indicator signal and the erase write command.

Abstract translation: 用于在非易失性存储器阵列中快速擦除存储器单元的方法包括以下步骤：提供大于由常规内部电压供应泵提供的内部泵浦电压的加速电压，提供擦除写入命令，以及执行快速擦除 包括将加速电压与多个扇区中的存储单元的源极同时耦合的步骤。 在一个实施例中，在以快速擦除擦除模式执行快速擦除操作的步骤之前，对存储器单元执行快速预编程操作。 在另一实施例中，在执行快速擦除擦除模式中的快速擦除操作的步骤之后，对存储器单元执行快速弱编程（APDE）操作。 在另外的实施例中，执行快速擦除操作的步骤还包括以下步骤：检测加速电压，响应于加速电压的检测产生加速电压指示信号，并响应于 加速电压指示信号和擦除写命令。

公开(公告)号：US07986562B2

公开(公告)日：2011-07-26

申请号：US12650118

申请日：2009-12-30

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C16/06

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US20090161462A1

公开(公告)日：2009-06-25

申请号：US11963508

申请日：2007-12-21

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C7/02

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US06633949B2

公开(公告)日：2003-10-14

申请号：US09892431

申请日：2001-06-26

Applicant: Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

Inventor： Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

IPC: G06F1200

CPC classification number: G11C8/12 ,  G11C16/08

Abstract: A bank selector encoder comprises a partition indicator circuit having a plurality of partition boundary indicator terminals, a plurality of inverters arranged in a plurality of columns, with each column of the inverters coupled to a respective one of a plurality of columns of ROM cells in a ROM array and a plurality of bank selector code outputs coupled to respective columns of the inverters. The partition boundary indicator terminals are capable of designating a memory partition boundary to identify an upper memory bank and a lower memory bank. The bank selector encoder is capable of generating an identifying bank selector code for each of a plurality of the predetermined memory partition boundaries. The bank selector encoder outputs code bits of a bank selector code based upon the partition boundary indicator terminals.

Abstract translation: 存储体选择器编码器包括具有多个分区边界指示符终端的分区指示器电路，多列排列的多个反相器，其中每列反相器耦合到多列ROM单元的相应一列 ROM阵列和耦合到反相器的各列的多个存储体选择器代码输出。 分区边界指示符终端能够指定存储器分区边界以识别上部存储体和下部存储体。 存储体选择器编码器能够为多个预定的存储分区边界中的每一个生成识别库选择器代码。 存储体选择器编码器基于分区边界指示符终端输出存储体选择器代码的代码位。

公开(公告)号：US06275894B1

公开(公告)日：2001-08-14

申请号：US09159489

申请日：1998-09-23

Applicant: Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

Inventor： Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

IPC: G11C1604

CPC classification number: G11C8/12 ,  G11C16/08

Abstract: A bank selector circuit for a simultaneous operation flash memory device with a flexible bank partition architecture comprises a memory boundary option 18, a bank selector encoder 2 coupled to receive a memory partition indicator signal from the memory boundary option 18, and a bank selector decoder 3 coupled to receive a bank selector code from the bank selector encoder 2. The decoder 3, upon receiving a memory address, outputs a bank selector output signal to point the memory address to either a lower memory bank or an upper memory bank in the simultaneous operation flash memory device, in dependence upon the selected memory partition boundary.

Abstract translation: 一种用于具有灵活存储体分区架构的同步操作闪速存储器件的存储体选择器电路包括存储器边界选项18，耦合以从存储器边界选项18接收存储器分区指示符信号的存储体选择器编码器2以及存储体选择器解码器3 耦合以从存储体选择器编码器2接收存储体选择器代码。解码器3在接收到存储器地址时输出存储体选择器输出信号，以将同时操作中的存储器地址指向下存储体或较高存储体 闪存设备，根据所选择的内存分区边界。

公开(公告)号：US5995415A

公开(公告)日：1999-11-30

申请号：US159142

申请日：1998-09-23

Applicant: Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

Inventor： Tiao-Hua Kuo ,  Yasushi Kasa ,  Nancy Leong ,  Johnny Chen ,  Michael Van Buskirk

IPC: G11C16/02 ,  G11C7/18 ,  G11C8/12 ,  G11C16/06 ,  G11C16/08 ,  G11C7/00

CPC classification number: G11C16/08 ,  G11C7/18 ,  G11C8/12

Abstract: A simultaneous operation non-volatile memory device with a flexible bank partition architecture comprises a memory array 20 including a plurality of memory cells arranged in a plurality of columns and rows, a plurality of bit lines 28 and 30 each coupled to a respective column of the memory cells, each of the bit lines comprising first and second bit line segments separated by a gap designating a memory partition boundary between upper and lower memory banks, and an X-decoder 22 coupled to the respective rows of the memory cells to row decode the memory array in response to receiving upper and lower bank memory addresses. Two pre-decoders 24 and 26 are coupled to the X-decoder 22. Two Y-decoders 32 and 34 are coupled to the bit line segments to provide column decoding for the memory cells in the upper and lower memory banks, respectively.

Abstract translation: 具有柔性库分隔体系结构的同时操作的非易失性存储器件包括存储器阵列20，存储器阵列20包括布置在多个列和行中的多个存储器单元，多个位线28和30，每个位线连接到相应的列 存储器单元，每个位线包括由指定上存储体和下存储体之间的存储器分区边界的间隙分隔的第一和第二位线段，以及耦合到存储器单元的各行的X解码器22进行行解码 存储器阵列响应于接收上部和下部存储器地址。 两个预解码器24和26耦合到X解码器22.两个Y解码器32和34分别耦合到位线段以对上和下存储体中的存储单元提供列解码。

公开(公告)号：US07433228B2

公开(公告)日：2008-10-07

申请号：US11229519

申请日：2005-09-20

Applicant: Tiao-Hua Kuo ,  Nancy Leong ,  Hounien Chen ,  Sachit Chandra ,  Nian Yang

Inventor： Tiao-Hua Kuo ,  Nancy Leong ,  Hounien Chen ,  Sachit Chandra ,  Nian Yang

IPC: G11C16/04

CPC classification number: G11C16/0491 ,  G11C16/0475 ,  G11C16/10

Abstract: A method is provided for programming a nonvolatile memory array including an array of memory cells, where each memory cell including a substrate, a control gate, a charge storage element having at least two charge storage areas for storing at least two independent charges, a source region and a drain region. The method includes designating at least one memory cell as a high-speed memory cell and pre-conditioning the high-speed memory cells by placing a first of the at least two charge storage areas into a programmed state, and subsequently enabling the programming on the second area with much higher rate.

Abstract translation: 提供了一种用于对包括存储器单元阵列的非易失性存储器阵列进行编程的方法，其中每个存储器单元包括衬底，控制栅极，具有用于存储至少两个独立电荷的至少两个电荷存储区域的电荷存储元件，源 区域和漏极区域。 该方法包括将至少一个存储器单元指定为高速存储单元，并且通过将至少两个电荷存储区域中的第一个置于编程状态来预处理高速存储器单元，并且随后使能在 第二个地区的利率要高得多。

公开(公告)号：US07423915B2

公开(公告)日：2008-09-09

申请号：US11332241

申请日：2006-01-17

Applicant: Nancy Leong ,  Sachit Chandra ,  Hounien Chen

Inventor： Nancy Leong ,  Sachit Chandra ,  Hounien Chen

IPC: G11C7/10 ,  G11C7/00

CPC classification number: G11C16/26 ,  G06F12/0893 ,  G06F2212/2022 ,  G11C7/1039

Abstract: A non-volatile memory, such as a Flash memory, is configured to perform a random multi-page read operation. The memory may include a core array of non-volatile memory cells and input lines for receiving an indication of the random multi-page read operation. Further, the memory may include a multi-level volatile memory coupled to the core array that is configured to simultaneously process multiple pages of data from the core array in a pipelined manner. Output lines are coupled to the multi-level volatile memory and output the pages of data from the memory device.

Abstract translation: 诸如闪存的非易失性存储器被配置为执行随机的多页读取操作。 存储器可以包括非易失性存储器单元的核心阵列和用于接收随机多页读取操作的指示的输入线。 此外，存储器可以包括耦合到核心阵列的多级易失性存储器，其被配置为以流水线方式从核心阵列同时处理多个数据页面。 输出线耦合到多级易失性存储器并从存储器件输出数据页面。