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    Peak current detection in a test instrument for ensuring validity of component test output
    2.
    发明授权
    Peak current detection in a test instrument for ensuring validity of component test output 失效
    测试仪器中的峰值电流检测，以确保组件测试输出的有效性

    公开(公告)号：US5512841A

    公开(公告)日：1996-04-30

    申请号：US306550

    申请日：1994-09-15

    申请人： Robert T. Gibson ,  Paul H. Heydron

    发明人： Robert T. Gibson ,  Paul H. Heydron

    IPC分类号： G01R15/12 ,  G01R31/26 ,  G01R31/28 ,  G01R1/06 ,  G01R13/20

    CPC分类号： G01R31/2839 ,  G01R15/125 ,  G01R31/2603

    摘要： Methods and apparatus are disclosed for using current detection in a test instrument to ensure validity of component test output. In a component test instrument that employs digital synthesis of a test stimulus waveform, voltage scan data and current scan data are successively acquired, the scan data being synchronized relative to the test stimulus waveform. The voltage and current scan data are stored in respective temporary storage buffers. Before displaying the data, a check for an open lead is conducted in a manner similar to a current scan. A zero current value indicates an open lead and the acquired scan data is disqualified from being displayed. Similarly, at the beginning of a component test operation, an open lead test is performed and the first voltage scan is deferred until a validity check confirms that the test leads or probes are in place. The disclosed methods and apparatus ensure that only valid data is displayed to the user.

    摘要翻译： 公开了在测试仪器中使用电流检测的方法和装置，以确保部件测试输出的有效性。 在采用数字合成测试激励波形的分量测试仪器中，连续获取电压扫描数据和当前扫描数据，扫描数据相对于测试激励波形进行同步。 电压和电流扫描数据存储在相应的临时存储缓冲器中。 在显示数据之前，以与当前扫描类似的方式进行打开引线的检查。 零电流值表示打开的引线，并且获取的扫描数据不被显示。 类似地，在组件测试操作开始时，执行开放式铅测试，并且推迟第一次电压扫描直到有效性检查确认测试引线或探针到位。 所公开的方法和装置确保仅向用户显示有效的数据。

    Framework for open directory operation extensibility
    3.
    发明授权
    Framework for open directory operation extensibility 失效
    开放目录操作框架可扩展性

    公开(公告)号：US06665674B1

    公开(公告)日：2003-12-16

    申请号：US09496049

    申请日：2000-02-02

    申请人： James H. Buchanan ,  Robert T. Gibson ,  Bruce E. Dunn ,  Brian D. Connell ,  Ian A. Macfarlane ,  Scott E. Miller

    发明人： James H. Buchanan ,  Robert T. Gibson ,  Bruce E. Dunn ,  Brian D. Connell ,  Ian A. Macfarlane ,  Scott E. Miller

    IPC分类号： G06F1730

    CPC分类号： H04L63/123 ,  H04L29/12839 ,  H04L61/1523 ,  H04L61/6022

    摘要： Methods and apparatus are provided for processing messages for access to information stored in an open directory. A Lightweight Directory Access Protocol (LDAP) LDAP Validation Proxy (LVP) is used to intercept LDAP request messages intended for the directory, validates the LDAP requests according to a schema description and optionally provides side-effects. The schema validation and LDAP message processing is modularized according to object classes representing the data stored in the directory and according to services provided. The schema is enforced by validating LDAP messages. This modularization provides a controlled message processing granularity and enables multi-threaded concurrent processing of multiple LDAP messages. The LVP has the capability of generating LDAP requests in processing LDAP messages. The LVP also intercepts and processes LDAP responses issued by a directory and intended for clients.

    摘要翻译： 提供了用于处理消息以访问存储在开放目录中的信息的方法和装置。 轻量目录访问协议（LDAP）LDAP验证代理（LVP）用于拦截针对目录的LDAP请求消息，根据模式描述验证LDAP请求，并可选择提供副作用。 模式验证和LDAP消息处理根据表示存储在目录中的数据的对象类和根据提供的服务进行模块化。 通过验证LDAP消息来强制执行该模式。 该模块化提供受控的消息处理粒度，并允许多个LDAP消息的多线程并发处理。 LVP能够在处理LDAP消息时生成LDAP请求。 LVP还拦截并处理由目录发出并针对客户端的LDAP响应。

    Method and apparatus for automatically testing semiconductor diodes
    5.
    发明授权
    Method and apparatus for automatically testing semiconductor diodes 失效
    自动测试半导体二极管的方法和设备

    公开(公告)号：US5705936A

    公开(公告)日：1998-01-06

    申请号：US708510

    申请日：1996-09-05

    申请人： Robert T. Gibson ,  Todd E. Holmdahl

    发明人： Robert T. Gibson ,  Todd E. Holmdahl

    IPC分类号： G01R31/01 ,  G01R31/26 ,  G01R29/12

    CPC分类号： G01R31/2632 ,  G01R31/01

    摘要： A potable electronic test instrument is adapted for the automatic testing of semiconductor diodes regardless of the orientation of the diode relative to the test probes. The test instrument supplies an a.c. sine wave test voltage coupled to the test probes. The maximum negative voltage and the maximum positive voltage are measured and compared against a set of predetermined open and short circuit values to obtain a decision of open, short, or ok for each value. The combination of the two comparisons is used to determine the device status according to a decision criteria. The diode status is accordingly displayed on the graphical display of the test instrument, indicating the device is open, shorted, a diode with a forward orientation or a reverse orientation with respect to the test probes, or of an unknown type. The diode forward bias junction voltage is displayed regardless of its orientation.

    摘要翻译： 一种饮用电子测试仪器适用于半导体二极管的自动测试，而不管二极管相对于测试探针的取向如何。 测试仪器提供a.c. 正弦波测试电压耦合到测试探头。 测量最大负电压和最大正电压，并与一组预定的开路和短路值进行比较，以获得每个值的开路，短路或确定的决定。 两个比较的组合用于根据决策标准确定设备状态。 因此，二极管状态显示在测试仪器的图形显示屏上，指示器件打开，短路，相对于测试探头或未知类型具有正向或反向取向的二极管。 显示二极管正向偏压结电压，无论其方向如何。

    Method and apparatus for determining and selectively displaying valid measurement information
    6.
    发明授权
    Method and apparatus for determining and selectively displaying valid measurement information 失效
    用于确定和选择性地显示有效测量信息的方法和装置

    公开(公告)号：US5530373A

    公开(公告)日：1996-06-25

    申请号：US376942

    申请日：1995-01-20

    申请人： Robert T. Gibson ,  Paul H. Heydron

    发明人： Robert T. Gibson ,  Paul H. Heydron

    IPC分类号： G01R31/26 ,  G01R13/34 ,  G01R15/12 ,  G01R19/25 ,  G01R23/16

    CPC分类号： G01R13/345 ,  G01R19/25

    摘要： An electronic test instrument adapted for displaying only meaningful information notwithstanding the intermittent arrival of valid input signals due to probing operations is provided. Two independent measurement processes measure the input signal simultaneously. The first measurement process operates in a similar fashion to a digital storage oscilloscope (DSO) by successively sampling the input signal to produce waveform information which are selectively sent to an LCD display device which graphically displays the waveform. The second measurement process continually performs a stability assessment of the input signal by collecting a series of stability measurements of a selected input signal parameter, creating a moving average of the series, and comparing each new stability measurement to the moving average relative to stability criteria. The stability decision controls the flow of waveform information to the display, thereby ensuring that only meaningful information is displayed based on waveform scans conducted when the input signal is stable.

    摘要翻译： 提供了一种适用于仅显示有意义的信息的电子测试仪器，尽管由于探测操作而导致有效的输入信号的间歇性到达。 两个独立的测量过程同时测量输入信号。 第一测量过程以与数字存储示波器（DSO）类似的方式操作，通过对输入信号进行连续采样以产生选择性地发送到图形显示波形的LCD显示装置的波形信息。 第二测量过程通过收集所选择的输入信号参数的一系列稳定性测量结果，连续地执行对输入信号的稳定性评估，创建该系列的移动平均值，并且相对于稳定性标准将每个新的稳定性测量值与移动平均值进行比较。 稳定性决定控制波形信息到显示器的流动，从而确保仅当输入信号稳定时进行的波形扫描才显示有意义的信息。

    Method and apparatus for automatically testing semiconductor diodes
    7.
    发明授权
    Method and apparatus for automatically testing semiconductor diodes 失效
    自动测试半导体二极管的方法和设备

    公开(公告)号：US5578936A

    公开(公告)日：1996-11-26

    申请号：US376602

    申请日：1995-01-23

    申请人： Robert T. Gibson ,  Todd E. Holmdahl

    发明人： Robert T. Gibson ,  Todd E. Holmdahl

    IPC分类号： G01R31/01 ,  G01R31/26 ,  G01R31/22

    CPC分类号： G01R31/2632 ,  G01R31/01

    摘要： A portable electronic test instrument is adapted for the automatic testing of semiconductor diodes regardless of the orientation of the diode relative to the test probes. The test instrument supplies an a.c. sine wave test voltage coupled to the test probes. The maximum negative voltage and the maximum positive voltage are measured and compared against a set of predetermined open and short circuit values to obtain a decision of open, short, or ok for each value. The combination of the two comparisons is used to determine the device status according to a decision criteria. The diode status is accordingly displayed on the graphical display of the test instrument, indicating the device is open, shorted, a diode with a forward orientation or a reverse orientation with respect to the test probes, or of an unknown type. The diode forward bias junction voltage is displayed regardless of its orientation.

    摘要翻译： 便携式电子测试仪器适用于半导体二极管的自动测试，而与二极管相对于测试探针的取向无关。 测试仪器提供a.c. 正弦波测试电压耦合到测试探头。 测量最大负电压和最大正电压，并与一组预定的开路和短路值进行比较，以获得每个值的开路，短路或确定的决定。 两个比较的组合用于根据决策标准确定设备状态。 因此，二极管状态显示在测试仪器的图形显示屏上，指示器件打开，短路，相对于测试探头或未知类型具有正向或反向取向的二极管。 显示二极管正向偏压结电压，无论其方向如何。