Abstract:
A real-time system and method for invoking a fraud alert notification to a bank prompted by an abandoned deposit following a denied accelerated funding request for a financial item.
Abstract:
An instruction set is provided that features multiple instructions and various address modes to deliver a mixture of flexible microcontroller-like instructions and specialized digital signal processing (“DSP”) execute instructions from a single instruction stream. A subset of instructions of the instruction set can be executed by a processor. Similarly, another subset of the instructions can be utilized by the digital signal processor. A software application can thus take advantage of digital signal processing capabilities in the same program, obviating the need for separate programs for separate processors.
Abstract:
A microcontroller apparatus is provided with an instruction set for manipulating the behavior of the microcontroller. The apparatus and system is provided that enables a linearized address space that makes modular emulation possible. Direct or indirect addressing is possible through register files or data memory. Special function registers, including the Program Counter (PC) and Working Register (W), are mapped in the data memory. An orthogonal (symmetrical) instruction set makes possible any operation on any register using any addressing mode. Consequently, two file registers to be used in some two operand instructions. This allows data to be moved directly between two registers without going through the W register. Thus increasing performance and decreasing program memory usage.
Abstract:
A real-time system and method for invoking a fraud alert notification to a bank prompted by an abandoned deposit following a denied accelerated funding request for a financial item.
Abstract:
The present invention relates generally to functional pathway configurations at the interfaces between integrated circuits (ICs) and the circuit assemblies with which the ICs communicate. More particularly, the present invention relates generally to the functional pathway configuration at the interface between one or more semiconductor integrated circuit dice, including an IC package and the circuitry of a system wherein the integrated circuit dice is a digital signal controller. Even more particularly, the present invention relates to a 18, 28, 40, 44, 64 or 80 pin functional pathway configuration for the interface between the digital signal controller and the system in which it is embedded.
Abstract:
Method and apparatus for controlling the updating of a random access memory (RAM) that stores data for coding the activation of segments of one or more alphanmeric characters of a liquid crystal display (LCD), to maintain substantially a direct current (DC) voltage value of zero across transparent conductive plates of the LCD, is performed or provided in a microcontroller having internal LCD control capabilities. A type B waveform is employed for activating the LCD, the waveform being of a type in which data is transmitted over two frames, the data in the second frame of which is the inverse of data in the first frame thereof to maintain an average DC voltage value over each two-frame portion of the waveform at substantially zero volt. The RAM is allowed to be written to for updating the data therein only after completion of an entire two-frame portion of the waveform and before commencement of a new two-frame portion, to avoid a non-zero average DC voltage across the LCD glass during a two-frame portion. An error bit is set whenever an attempt is made to write to the RAM at times other than between the end of a two-frame portion and the commencement of a new two-frame portion. A response to the error bit is made by returning to the write step that prompted it, to determine whether all of the data intended to be written has been stored in the RAM.
Abstract:
A microcontroller apparatus is provided with an instruction set for manipulating the behavior of the microcontroller. The apparatus and system is provided that enables a linearized address space that makes modular emulation possible. Direct or indirect addressing is possible through register files or data memory. Special function registers, including the Program Counter (PC) and Working Register (W), are mapped in the data memory. An orthogonal (symmetrical) instruction set makes possible any operation on any register using any addressing mode. Consequently, two file registers to be used in some two operand instructions. This allows data to be moved directly between two registers without going through the W register. Thus increasing performances and decreasing program memory usage.
Abstract:
A device including a microcontroller fabricated on a semiconductor chip is used to control an LCD display of an external system intended to be controlled by the microcontroller. The microcontroller enters a sleep state in which it operates in a battery power conservation mode during periods of time when functional activity of the microcontroller is reduced. The microcontroller awakens from the sleep state for resumption of activity when such a period ends. Timing to the LCD is decoupled from the microcontroller's own internal clock when the independent internal on-chip clock, which may be an RC oscillator, is selected by the user of the device. This allows the chip to continue to drive the LCD display even though the microcontroller's internal clock has stopped during the sleep.
Abstract:
A single semiconductor chip device is utilized for controlling an external system which has a liquid crystal display (LCD) associated therewith. A dual port random access memory (RAM) stores data representative of information to be displayed on the LCD. The RAM includes a plurality of master data storage latches and a single slave data storage latch shared by all of the plurality of master storage latches. A microcontroller has a central processing unit (CPU) for communicating with the master storage latches via one of the RAM ports to periodically change the data stored therein. An LCD control module successively updates the data in the single slave storage latch with data from each of the master storage latches and downloads the updated data from the single slave storage latch to a temporary store associated with the LCD after each update from a master storage latch and before the update of data from the next master storage latch. Consequently, data in each master storage latch may be changed periodically by the CPU without interference with downloading of updated data from the single slave storage unit.
Abstract:
A method is disclosed for testing a high speed microcontroller fabricated on a semiconductor chip, and for testing relatively low speed functions of a liquid crystal display (LCD) module on the chip that drives an off-chip LCD for an external system to be controlled by the microcontroller with a plurality of discrete analog voltage levels for performing the LCD functions. Digital values are multiplexed in time slots of a test waveform to simulate in high speed digital format of a test mode the low speed timing, relative magnitude and functionality of analog voltage levels used to drive the LCD; A high speed driver is selectively coupled to a pin of the chip, to which the discrete analog voltage levels are normally applied at low speed to drive the LCD, and the test waveform is applied to the high speed driver. The digital values and timing that appear on the pin are then monitored as an indication of proper functionality of the LCD module. The high speed driver is switched out and the normal low speed LCD driver is switched back for return to an LCD user mode when the test mode is completed. Monitoring the pin with a digital tester allows verification that pin pulses in predetermined time slots indicate the corresponding analog voltage level is being applied at the proper time during normal operation of the LCD module, and digitally testing of continuity in an analog channel. A transistor normally employed on the chip for electrostatic discharge protection is activated to selectively couple the high speed driver to the pin for the high speed testing mode.