摘要:
Systems and processes for booting a device can be implemented by detecting a reset signal associated with the device and retrieving a predetermined page of data from a nonvolatile memory location into a register associated with the nonvolatile memory. The nonvolatile memory may be designed and implemented such that each page of data is retrieved from the nonvolatile memory as a unit, and the page of data includes instructions for use in booting the device. A command to read data stored in the register is received, and the command can include an address identifying a location of one or more instructions within the register. In response, the one or more instructions are retrieved from the register for execution by a processor.
摘要:
Method and system for uniquely identifying a replicated copy of a storage volume is provided. A unique identifier is created by a storage system managing the replicated copy. The unique identifier includes a time stamp of when the identifier is being created, a system clock of the storage system and a unique address for an adapter that is used by the storage system.
摘要:
Lun clones are transferred from a primary server to a secondary server. The lun clones on the secondary server maintain the same data storage space saving relationship with backing luns of the lun clones as exists on the primary server. Incremental backups and restores of the lun clones between the primary and secondary servers involves transferring less than the total number of data blocks associated with the lun clone.
摘要:
An apparatus for programming an electronically programmable semiconductor fuse applies a programming current to a fuse link as a series of multiple pulses. Application of the programming current as a series of multiple short pulses provides a level of programming current sufficiently high to ensure reliable and effective electromigration while avoiding exceeding temperature limits of the fuse link.
摘要:
High precision continuous time gmC BPF (Band Pass Filter) tuning. A novel approach is presented by which a continuous time signal serves as a BPF control voltage for tuning of a BPF within a communication device (e.g., transceiver or receiver). A PLL (Phase Locked Loop) tunes the center frequency of the BPF using this continuous time signal, and the PLL oscillates at the center frequency of the BPF. The BPF is implemented as a gmC (transconductance-capacitance) filter, and the PLL is implemented using a number of gm (transconductance) cells as well. The PLL's gm cells and the BPF's gm cells are substantially identical in form. All of these gm cells are operated within their respective linear regions. This similarity of gm cells within the PLL and the BPF provide for substantial immunity to environmental perturbations including temperature and humidity changes as well as fluctuations of power supply voltages.
摘要:
Systems and processes for booting a device can be implemented by detecting a reset signal associated with the device and retrieving a predetermined page of data from a nonvolatile memory location into a register associated with the nonvolatile memory. The nonvolatile memory may be designed and implemented such that each page of data is retrieved from the nonvolatile memory as a unit, and the page of data includes instructions for use in booting the device. A command to read data stored in the register is received, and the command can include an address identifying a location of one or more instructions within the register. In response, the one or more instructions are retrieved from the register for execution by a processor.
摘要:
An exemplary embodiment of the present invention described and shown in the specification and drawings is a transceiver with a receiver, a transmitter, a local oscillator (LO) generator, a controller, and a self-testing unit. All of these components can be packaged for integration into a single IC including components such as filters and inductors. The controller for adaptive programming and calibration of the receiver, transmitter and LO generator. The self-testing unit generates is used to determine the gain, frequency characteristics, selectivity, noise floor, and distortion behavior of the receiver, transmitter and LO generator. It is emphasized that this abstract is provided to comply with the rules requiring an abstract which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or the meaning of the claims.
摘要:
Aspects of a method and system for frequency calibration of a voltage controlled ring oscillator are provided. In this regard, an oscillating voltage may be generated via a voltage controlled ring oscillator comprising a plurality of delay cells. Each of the plurality of delay cells may comprise a MOSFET differential pair coupled to a plurality of variable resistors. A frequency of oscillation and amplitude of the generated oscillating voltage may be controlled by controlling a resistance of the plurality of variable resistors. The frequency of oscillation and amplitude may be controlled via one or more digital control words generated by a baseband processor, a DSP, and/or a memory. The digital control words may comprise a control word for finely tuning the frequency of oscillation and amplitude and a control word for coarsely tuning the frequency of oscillation and amplitude.
摘要:
A process of forming a semiconductive capacitor device for a memory circuit includes forming a first capacitor cell recess and a second capacitor cell recess that are spaced apart by a capacitor cell boundary of a first height. The process includes lowering the first height of the capacitor cell boundary to a second height. A common plate capacitor bridges between the first recess and the second recess over the boundary above the second height and below the first height.
摘要:
A method for identifying potentially defective integrated circuit chips and excluding them from future testing as wafers move through a manufacturing line The method includes data-collecting steps, tagging the chips on wafers identified as potentially bad chips based on information collected as the wafer moves down the fabrication line, evaluating test cost savings by eliminating any further tests on the tagged chips preferably using a test cost database. Considering all the future tests to be preformed, the tagged chips are skipped if it is determined that the test cost saving is significant. Tagging bad chips is based on various criteria and models which are dynamically adjusted by performing the wafer final test on samples of the tagged chips and feeding-back the final test results. The dynamic adaptive adjustment method preferably includes a feedback loop or iterative process to evaluate financial tradeoffs when assessing the profit of salvaging chips against the additional test costs.