METHOD FOR OPERATING SEMICONDUCTOR DEVICE
    1.
    发明申请
    METHOD FOR OPERATING SEMICONDUCTOR DEVICE 有权
    操作半导体器件的方法

    公开(公告)号:US20120038414A1

    公开(公告)日:2012-02-16

    申请号:US13282482

    申请日:2011-10-27

    IPC分类号: G05F3/02

    摘要: A method for operating a semiconductor device including a lateral double diffused metal oxide semiconductor (LDMOS) with a first source, a common drain and a first gate, a junction field effect transistor (JFET) with a second source, the common drain and a second gate wherein the second source is electrically connected to the first gate and an inner circuit electrically connected to the first source is provided. The first source provides the inner circuit with an inner current to generate an inner voltage by means of the lateral double diffused metal oxide semiconductor, and the lateral double diffused metal oxide semiconductor turns off when the inner voltage is elevated substantially as high as the first gate voltage.

    摘要翻译: 一种用于操作包括具有第一源极,公共漏极和第一栅极的横向双扩散金属氧化物半导体(LDMOS)的半导体器件的方法,具有第二源极的结型场效应晶体管(JFET),所述公共漏极和第二源极 栅极,其中第二源极电连接到第一栅极,并且提供与第一源电连接的内部电路。 第一源为内部电路提供内部电流,以通过横向双扩散金属氧化物半导体产生内部电压,并且当内部电压升高到与第一栅极高相同时,横向双扩散金属氧化物半导体截止 电压。

    Ultra high voltage MOS transistor device
    2.
    发明授权
    Ultra high voltage MOS transistor device 有权
    超高压MOS晶体管器件

    公开(公告)号:US08115253B2

    公开(公告)日:2012-02-14

    申请号:US12556576

    申请日:2009-09-10

    IPC分类号: H01L29/78 H01L29/76

    摘要: An ultra high voltage MOS transistor device includes a substrate having a first conductive type, a first well having a second conductive type and a second well having the first conductive type formed in the substrate, a drain region having the second conductive type formed in the first well, a source region having the second conductive type formed in the second well, a first doped region having the first conductive type formed between the second well and the substrate, an insulating layer formed in a first recess in the first well, a gate formed on the substrate between the source region and the first well, and a recessed channel region formed in the substrate underneath the gate.

    摘要翻译: 超高压MOS晶体管器件包括具有第一导电类型的衬底,具有第二导电类型的第一阱和在衬底中形成的第一导电类型的第二阱,具有形成在第一导电类型中的第二导电类型的漏极区 具有形成在第二阱中的第二导电类型的源极区,具有形成在第二阱和衬底之间的第一导电类型的第一掺杂区域,形成在第一阱中的第一凹部中的绝缘层,形成的栅极 在源极区域和第一阱之间的衬底上,以及形成在栅极下方的衬底中的凹陷沟道区域。

    Semiconductor device and method for operating the same
    3.
    发明授权
    Semiconductor device and method for operating the same 有权
    半导体装置及其操作方法

    公开(公告)号:US08072011B2

    公开(公告)日:2011-12-06

    申请号:US12573884

    申请日:2009-10-06

    IPC分类号: H01L29/80 H01L31/112

    摘要: A semiconductor device includes a lateral double diffused metal oxide semiconductor (LDMOS) , a junction field effect transistor (JFET) and an inner circuit. The lateral double diffused metal oxide semiconductor includes a first source, a common drain and a first gate. The junction field effect transistor includes a second source, the common drain and a second gate. The second source is electrically connected to the first gate. The inner circuit is electrically connected to the first source.

    摘要翻译: 半导体器件包括横向双扩散金属氧化物半导体(LDMOS),结型场效应晶体管(JFET)和内部电路。 横向双扩散金属氧化物半导体包括第一源极,公共漏极和第一栅极。 结型场效应晶体管包括第二源极,公共漏极和第二栅极。 第二源电连接到第一栅极。 内部电路电连接到第一源。

    Power semiconductor device and fabrication method thereof
    4.
    发明授权
    Power semiconductor device and fabrication method thereof 有权
    功率半导体器件及其制造方法

    公开(公告)号:US08716787B2

    公开(公告)日:2014-05-06

    申请号:US13431063

    申请日:2012-03-27

    IPC分类号: H01L29/66

    摘要: A fabrication method of a power semiconductor device is provided. Firstly, a plurality of trenched gate structures is formed in the base. Then, a body mask is used for forming a pattern layer on the base. The pattern layer has at least a first open and a second open for forming at least a body region and a heavily doped region in the base respectively. Then, a shielding structure is formed on the base to fill the second open and line at least a sidewall of the first open. Next, a plurality of source doped regions is formed in the body region by using the pattern layer and the shielding structure as the mask. Then, an interlayer dielectric layer is formed on the base and a plurality of source contact windows is formed therein to expose the source doped regions.

    摘要翻译: 提供了功率半导体器件的制造方法。 首先,在基底上形成多个沟槽栅极结构。 然后,使用身体掩模在基底上形成图案层。 图案层具有至少第一开口和第二开口,用于分别在基底中形成至少一个体区域和重掺杂区域。 然后,在基座上形成屏蔽结构,以填充第一开口的至少第二侧壁的第二开口和线。 接下来,通过使用图案层和屏蔽结构作为掩模,在体区域中形成多个源极掺杂区域。 然后,在基底上形成层间电介质层,并在其中形成多个源极接触窗以露出源极掺杂区域。

    POWER SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
    6.
    发明申请
    POWER SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF 有权
    功率半导体器件及其制造方法

    公开(公告)号:US20130256789A1

    公开(公告)日:2013-10-03

    申请号:US13431063

    申请日:2012-03-27

    IPC分类号: H01L29/78 H01L21/04

    摘要: A fabrication method of a power semiconductor device is provided. Firstly, a plurality of trenched gate structures is formed in the base. Then, a body mask is used for forming a pattern layer on the base. The pattern layer has at least a first open and a second open for forming at least a body region and a heavily doped region in the base respectively. Then, a shielding structure is formed on the base to fill the second open and line at least a sidewall of the first open. Next, a plurality of source doped regions is formed in the body region by using the pattern layer and the shielding structure as the mask. Then, an interlayer dielectric layer is formed on the base and a plurality of source contact windows is formed therein to expose the source doped regions.

    摘要翻译: 提供了功率半导体器件的制造方法。 首先,在基底上形成多个沟槽栅极结构。 然后,使用身体掩模在基底上形成图案层。 图案层具有至少第一开口和第二开口,用于分别在基底中形成至少一个体区域和重掺杂区域。 然后,在基座上形成屏蔽结构,以填充第一开口的至少第二侧壁的第二开口和线。 接下来,通过使用图案层和屏蔽结构作为掩模,在体区域中形成多个源极掺杂区域。 然后,在基底上形成层间电介质层,并在其中形成多个源极接触窗以露出源极掺杂区域。

    ULTRA HIGH VOLTAGE MOS TRANSISTOR DEVICE
    7.
    发明申请
    ULTRA HIGH VOLTAGE MOS TRANSISTOR DEVICE 有权
    超高压MOS晶体管器件

    公开(公告)号:US20110057263A1

    公开(公告)日:2011-03-10

    申请号:US12556576

    申请日:2009-09-10

    IPC分类号: H01L29/78

    摘要: An ultra high voltage MOS transistor device includes a substrate having a first conductive type, a first well having a second conductive type and a second well having the first conductive type formed in the substrate, a drain region having the second conductive type formed in the first well, a source region having the second conductive type formed in the second well, a first doped region having the first conductive type formed between the second well and the substrate, an insulating layer formed in a first recess in the first well, a gate formed on the substrate between the source region and the first well, and a recessed channel region formed in the substrate underneath the gate.

    摘要翻译: 超高压MOS晶体管器件包括具有第一导电类型的衬底,具有第二导电类型的第一阱和在衬底中形成的第一导电类型的第二阱,具有形成在第一导电类型中的第二导电类型的漏极区 具有形成在第二阱中的第二导电类型的源极区,具有形成在第二阱和衬底之间的第一导电类型的第一掺杂区域,形成在第一阱中的第一凹部中的绝缘层,形成的栅极 在源极区域和第一阱之间的衬底上,以及形成在栅极下方的衬底中的凹陷沟道区域。

    Method for operating semiconductor device
    9.
    发明授权
    Method for operating semiconductor device 有权
    半导体器件的操作方法

    公开(公告)号:US08179188B2

    公开(公告)日:2012-05-15

    申请号:US13282482

    申请日:2011-10-27

    IPC分类号: H03K17/687

    摘要: A method for operating a semiconductor device including a lateral double diffused metal oxide semiconductor (LDMOS) with a first source, a common drain and a first gate, a junction field effect transistor (JFET) with a second source, the common drain and a second gate wherein the second source is electrically connected to the first gate and an inner circuit electrically connected to the first source is provided. The first source provides the inner circuit with an inner current to generate an inner voltage by means of the lateral double diffused metal oxide semiconductor, and the lateral double diffused metal oxide semiconductor turns off when the inner voltage is elevated substantially as high as the first gate voltage.

    摘要翻译: 一种用于操作包括具有第一源极,公共漏极和第一栅极的横向双扩散金属氧化物半导体(LDMOS)的半导体器件的方法,具有第二源极的结型场效应晶体管(JFET),所述公共漏极和第二源极 栅极,其中第二源极电连接到第一栅极,并且提供与第一源电连接的内部电路。 第一源为内部电路提供内部电流,以通过横向双扩散金属氧化物半导体产生内部电压,并且当内部电压升高到与第一栅极高相同时,横向双扩散金属氧化物半导体截止 电压。

    SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME
    10.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME 有权
    半导体器件及其操作方法

    公开(公告)号:US20110080213A1

    公开(公告)日:2011-04-07

    申请号:US12573884

    申请日:2009-10-06

    IPC分类号: H03K3/353 H01L27/088

    摘要: A semiconductor device includes a lateral double diffused metal oxide semiconductor (LDMOS) , a junction field effect transistor (JFET) and an inner circuit. The lateral double diffused metal oxide semiconductor includes a first source, a common drain and a first gate. The junction field effect transistor includes a second source, the common drain and a second gate. The second source is electrically connected to the first gate. The inner circuit is electrically connected to the first source.

    摘要翻译: 半导体器件包括横向双扩散金属氧化物半导体(LDMOS),结型场效应晶体管(JFET)和内部电路。 横向双扩散金属氧化物半导体包括第一源极,公共漏极和第一栅极。 结型场效应晶体管包括第二源极,公共漏极和第二栅极。 第二源电连接到第一栅极。 内部电路电连接到第一源。