Abstract:
ESD protection circuitry is disclosed. In one embodiment, an integrated circuit includes first and second sensor circuits. The first sensor circuit has a first resistive-capacitive (RC) time constant, while the second sensor circuit has a second RC time constant. The RC time constant of the first sensor circuit is at least one order of magnitude greater than that of the second sensor circuit. A first clamp transistor is coupled to and configured to be activated by the first sensor circuit responsive to the latter detecting an ESD event. A second clamp transistor is coupled to and configured to be activated by the second sensor circuit responsive to the latter detecting the ESD event.
Abstract:
A system and method for efficiently performing timing characterization of high-speed clocks signals with low-speed input/output pins. An integrated circuit includes a clock generator that generates a high-speed clock signal. A clock characterizer circuit receives the high-speed clock signal. The clock characterizer generates a corresponding low-speed clock signal. The generated low-speed clock signal is output through a low-speed general-purpose input/output (GPIO) pin for measurement. The generated low-speed clock signal is sent to a sequential element for staging. The staging of the generated low-speed clock signal is done with sequential elements that use a reverse polarity of a clock signal than the polarity used by a previous stage. The high-speed clock signal is used for the staging. The output of each stage is sent to a low-speed GPIO pin for measurement.
Abstract:
Embodiments of an apparatus for implementing a display port interface are disclosed. The apparatus may include a source processor and a sink processor coupled through an interface. The interface may include a primary link, and an auxiliary link. The source processor may be operable to send a wake-up command to the sink processor via the auxiliary link, which may indicate a change in frequency on the primary link. The source processor to the sink processor via the primary link may send initialization parameters, which may include a clock data recovery lock parameter and an idle parameter.
Abstract:
A method and apparatus for power glitch detection in IC's is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.
Abstract:
ESD protection circuitry is disclosed. In one embodiment, an integrated circuit includes first and second sensor circuits. The first sensor circuit has a first resistive-capacitive (RC) time constant, while the second sensor circuit has a second RC time constant. The RC time constant of the first sensor circuit is at least one order of magnitude greater than that of the second sensor circuit. A first clamp transistor is coupled to and configured to be activated by the first sensor circuit responsive to the latter detecting an ESD event. A second clamp transistor is coupled to and configured to be activated by the second sensor circuit responsive to the latter detecting the ESD event.
Abstract:
Embodiments of an apparatus for implementing a display port interface are disclosed. The apparatus may include a source processor and a sink processor coupled through an interface. The interface may include a primary link, and an auxiliary link. The source processor may be operable to send a wake-up command to the sink processor via the auxiliary link, which may indicate a change in frequency on the primary link. The source processor to the sink processor via the primary link may send initialization parameters, which may include a clock data recovery lock parameter and an idle parameter.
Abstract:
Embodiments of an apparatus for implementing a display port interface are disclosed. The apparatus may include a source processor and a sink processor coupled through an interface. The source processor may be operable to select a frequency from a continuous range of frequencies, and transmit data to the sink processor at the selected frequency. A phase lock circuit may be included in the sink processor. The phase lock circuit may be configured to generate a signal at the selected frequency dependent upon the transmitted data. The generated signal may be in phase with the transmitted data.
Abstract:
A method and apparatus for power glitch detection in IC's is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.
Abstract:
Embodiments of an apparatus for implementing a display port interface are disclosed. The apparatus may include a source processor and a sink processor coupled through an interface. The source processor may be operable to select a frequency from a continuous range of frequencies, and transmit data to the sink processor at the selected frequency. A phase lock circuit may be included in the sink processor. The phase lock circuit may be configured to generate a signal at the selected frequency dependent upon the transmitted data. The generated signal may be in phase with the transmitted data.
Abstract:
A system and method for efficiently performing timing characterization of high-speed clocks signals with low-speed input/output pins. An integrated circuit includes a clock generator that generates a high-speed clock signal. A clock characterizer circuit receives the high-speed clock signal. The clock characterizer generates a corresponding low-speed clock signal. The generated low-speed clock signal is output through a low-speed general-purpose input/output (GPIO) pin for measurement. The generated low-speed clock signal is sent to a sequential element for staging. The staging of the generated low-speed clock signal is done with sequential elements that use a reverse polarity of a clock signal than the polarity used by a previous stage. The high-speed clock signal is used for the staging. The output of each stage is sent to a low-speed GPIO pin for measurement.