REDUCING EFFECTS OF ERASE DISTURB IN A MEMORY DEVICE
    1.
    发明申请
    REDUCING EFFECTS OF ERASE DISTURB IN A MEMORY DEVICE 有权
    减少存储器件中擦除干扰的影响

    公开(公告)号:US20110128782A1

    公开(公告)日:2011-06-02

    申请号:US12628522

    申请日:2009-12-01

    IPC分类号: G11C7/00 G11C16/10

    摘要: Methods for programming and memory devices are disclosed. One such method for programming includes initially biasing a subset of a plurality of control gates of a string of memory cells with a negative voltage, wherein the subset is less than all of the plurality of control gates of the string. The control gate of a selected memory cell is subsequently biased with a programming voltage during a programming phase.

    摘要翻译: 公开了用于编程和存储器件的方法。 一种用于编程的方法包括:初始地利用负电压偏置存储器单元串的多个控制栅极的子集,其中该子集小于该串的多个控制栅极的全部。 在编程阶段期间,所选择的存储单元的控制栅随后用编程电压进行偏置。

    Reducing effects of erase disturb in a memory device
    3.
    发明授权
    Reducing effects of erase disturb in a memory device 有权
    减少存储器件中擦除干扰的影响

    公开(公告)号:US08203876B2

    公开(公告)日:2012-06-19

    申请号:US12628522

    申请日:2009-12-01

    IPC分类号: G11C16/04

    摘要: Methods for programming and memory devices are disclosed. One such method for programming includes initially biasing a subset of a plurality of control gates of a string of memory cells with a negative voltage, wherein the subset is less than all of the plurality of control gates of the string. The control gate of a selected memory cell is subsequently biased with a programming voltage during a programming phase.

    摘要翻译: 公开了用于编程和存储器件的方法。 一种用于编程的方法包括:初始地利用负电压偏置存储器单元串的多个控制栅极的子集,其中该子集小于该串的多个控制栅极的全部。 在编程阶段期间,所选择的存储单元的控制栅随后用编程电压进行偏置。