Tin-indium antimonide infrared detector
    2.
    发明授权
    Tin-indium antimonide infrared detector 失效
    锑锡铱红外探测器

    公开(公告)号:US5497029A

    公开(公告)日:1996-03-05

    申请号:US305516

    申请日:1994-09-13

    摘要: A compound semiconductor device suitable for an infrared ray detector comprises a substrate composed of indium antimonide (InSb), a first conductive layer deposited on the substrate and composed of tin-indium antimonide represented by the formula Sn.sub.x (InSb).sub.1-x, where 0.05.ltoreq.x.ltoreq.0.3, a second conductive layer that is a semiconductor region (active region) formed on the first conductive layer, and electrode provided on the second conductive layer, and a surface protective film formed on the first conductive layer except for the electrode portions.

    摘要翻译: 适用于红外线检测器的化合物半导体器件包括由铟锑化物(InSb)构成的衬底,沉积在衬底上并由式Snx(InSb)1-x表示的锡 - 铟锑化物组成的第一导电层,其中0.05 作为形成在第一导电层上的半导体区域(有源区域)的第二导电层和设置在第二导电层上的电极以及形成在第一导电层上的表面保护膜,除了 用于电极部分。