摘要:
The invention includes a novel scan chain structure for LSSD or GSD IC operation. The scan chain structure includes a first flip-flop (L1) and a second flip-flop (L2) configured to operate the first flip-flop (L1) in normal mode operation, in scan mode operation, in initialization mode and in low leakage power mode operation, wherein each flip-flop within a long scan chain of latches includes a data input, data output, a clock input, a scan-in input and a scan-out output, arranged for normal mode operation. A buffer circuit is electrically connected between the scan-out output of the second flip-flop (L2) and the scan-in input of the first flip-flop (L1) for the next latch in the scan chain, the buffer circuit including a control element that controls the operation the first flip-flop (L1) to scan mode or low power leakage mode. The first flip-flop (L1) is set to a data output value upon exit from low power leakage mode that is the same value that it is set to at initialization during normal mode operation. The switching occurs in only one clock cycle.
摘要:
The invention includes a design structure embodied in a computer readable medium for performing a method for inserting a scan chain into a VLSI circuit design. The scan chain structure, or structures, are included in the design structure for the VLSI circuit design. The scan chain structure includes a first flip-flop (L1) and a second flip-flop (L2) configured to operate the first flip-flop (L1) in normal mode operation, in scan mode operation, in initialization mode and in low leakage power mode operation. A buffer circuit is electrically connected between the scan-out output of the second flip-flop (L2) and the scan-in input of the first flip-flop (L1) for the next latch in the scan chain. Buffer circuit control elements control the first flip-flop (L1) to switch between scan mode or low power leakage mode. The switching occurs in only one clock cycle. The design structure can include a netlist, which describes the VLSI circuit, reside on storage medium as a data format used for the exchange of layout data of integrated circuits, and preferably includes at least one of test data files, characterization data, verification data, or design specifications.
摘要:
A method, system and computer program product for estimating a static power consumption of an integrated circuit are disclosed. The static power consumption of a cell of the integrated circuit is characterized based on contributions of an input node(s) and an output node(s) of the cell. A contribution considers a leakage weight and a leakage probability of a node. A logic template of the cell may be created to better represent a contribution of an internal node to the static power consumption of the cell.
摘要:
The invention includes a design structure embodied in a computer readable medium for performing a method for inserting a scan chain into a VLSI circuit design. The scan chain structure, or structures, are included in the design structure for the VLSI circuit design. The scan chain structure includes a first flip-flop (L1) and a second flip-flop (L2) configured to operate the first flip-flop (L1) in normal mode operation, in scan mode operation, in initialization mode and in low leakage power mode operation. A buffer circuit is electrically connected between the scan-out output of the second flip-flop (L2) and the scan-in input of the first flip-flop (L1) for the next latch in the scan chain. Buffer circuit control elements control the first flip-flop (L1) to switch between scan mode or low power leakage mode. The switching occurs in only one clock cycle. The design structure can include a netlist, which describes the VLSI circuit, reside on storage medium as a data format used for the exchange of layout data of integrated circuits, and preferably includes at least one of test data files, characterization data, verification data, or design specifications.
摘要:
The invention includes a novel scan chain structure for LSSD or GSD IC operation. The scan chain structure includes a first flip-flop (L1) and a second flip-flop (L2) configured to operate the first flip-flop (L1) in normal mode operation, in scan mode operation, in initialization mode and in low leakage power mode operation, wherein each flip-flop within a long scan chain of latches includes a data input, data output, a clock input, a scan-in input and a scan-out output, arranged for normal mode operation. A buffer circuit is electrically connected between the scan-out output of the second flip-flop (L2) and the scan-in input of the first flip-flop (L1) for the next latch in the scan chain, the buffer circuit including a control element that controls the operation the first flip-flop (L1) to scan mode or low power leakage mode. The first flip-flop (L1) is set to a data output value upon exit from low power leakage mode that is the same value that it is set to at initialization during normal mode operation. The switching occurs in only one clock cycle.
摘要:
A method, system and computer program product for estimating a static power consumption of an integrated circuit are disclosed. The static power consumption of a cell of the integrated circuit is characterized based on contributions of an input node(s) and an output node(s) of the cell. A contribution considers a leakage weight and a leakage probability of a node. A logic template of the cell may be created to better represent a contribution of an internal node to the static power consumption of the cell.
摘要:
The invention relates to frequency adjustment of electronic signals. The method comprises the steps of providing an output signal of a frequency generator with a first frequency as input signal for a signal delay element providing an edge of said input signal of said signal delay element; delaying said input signal by adding a delay to each cycle of said input signal until the delayed output signal of the signal delay element is aligned to an edge of said input signal.
摘要:
A system and method of shifting a clock frequency of an integrated circuit device from a first frequency to a second frequency, including alternating between the first frequency and the second frequency according to a dithering pattern, the alternating occurring for a predetermined number of cycles; and setting the clock frequency to the second frequency after the predetermined number of cycles.
摘要:
A synchronization system capable of simultaneously resetting frequency divide-by counters (124A, 124B) of multiple processors (A, B) to zero regardless of the divide-by frequency signal (Mclk/n signal (168A, 168B)) and regardless of the magnitude of the clock mesh delays experienced by the Mclk/n signals in the processors. The synchronization system includes a mesh delay circuit (176A, 176B) for each processor that simulates in the undivided signal (Mclk/1 signal (136A, 136B)) the clock mesh delay experienced by the Mclk/n signal in that processor so as to provide an Lclk signal (172A, 172B). A phase detector detects the phase offset between the Mclk/n signal and the Sysclk signal (112) and sends an asynchronous offset signal (194A, 194B) to a counter re-setter (196A, 196B) that resets the divide-by counter to zero based on the offset signal.
摘要:
An integrated circuit on a semiconductor chip with a plurality of registers distributed across the semiconductor chip. The registers are writeable and readable. The integrated circuit comprises a central control block. The integrated circuit comprises a plurality of circuit units. The circuit unit includes a functional portion with a local clock controller and one or more of the registers. The circuit unit includes a satellite portion. The central control block and the satellite portions are serially connected together and form a scan chain, wherein the scan chain is formed as a ring.