摘要:
An integrated circuit on a semiconductor chip with a plurality of registers distributed across the semiconductor chip. The registers are writeable and readable. The integrated circuit comprises a central control block. The integrated circuit comprises a plurality of circuit units. The circuit unit includes a functional portion with a local clock controller and one or more of the registers. The circuit unit includes a satellite portion. The central control block and the satellite portions are serially connected together and form a scan chain, wherein the scan chain is formed as a ring.
摘要:
An integrated circuit on a semiconductor chip with a plurality of registers distributed across the semiconductor chip. The registers are writeable and readable. The integrated circuit comprises a central control block. The integrated circuit comprises a plurality of circuit units. The circuit unit includes a functional portion with a local clock controller and one or more of the registers. The circuit unit includes a satellite portion. The central control block and the satellite portions are serially connected together and form a scan chain, wherein the scan chain is formed as a ring.
摘要:
A method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.
摘要:
The present invention relates to a method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is at least partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.
摘要:
The invention relates to frequency adjustment of electronic signals. The method comprises the steps of providing an output signal of a frequency generator with a first frequency as input signal for a signal delay element providing an edge of said input signal of said signal delay element; delaying said input signal by adding a delay to each cycle of said input signal until the delayed output signal of the signal delay element is aligned to an edge of said input signal.
摘要:
A system and method of shifting a clock frequency of an integrated circuit device from a first frequency to a second frequency, including alternating between the first frequency and the second frequency according to a dithering pattern, the alternating occurring for a predetermined number of cycles; and setting the clock frequency to the second frequency after the predetermined number of cycles.
摘要:
A synchronization system capable of simultaneously resetting frequency divide-by counters (124A, 124B) of multiple processors (A, B) to zero regardless of the divide-by frequency signal (Mclk/n signal (168A, 168B)) and regardless of the magnitude of the clock mesh delays experienced by the Mclk/n signals in the processors. The synchronization system includes a mesh delay circuit (176A, 176B) for each processor that simulates in the undivided signal (Mclk/1 signal (136A, 136B)) the clock mesh delay experienced by the Mclk/n signal in that processor so as to provide an Lclk signal (172A, 172B). A phase detector detects the phase offset between the Mclk/n signal and the Sysclk signal (112) and sends an asynchronous offset signal (194A, 194B) to a counter re-setter (196A, 196B) that resets the divide-by counter to zero based on the offset signal.
摘要:
The present invention relates to a method for controlling the supply voltage for an integrated circuit, which is connected to a voltage regulation module via a sense line, a voltage supply line and a bus wherein the supply voltage is provided by the voltage regulation module (10) via the voltage supply line. The supply voltage is composed of a reference voltage and a number of additional voltage levels. The reference voltage is defined by a voltage source and controlled by the integrated circuit via the bus, and the number of additional voltage levels is determined by the integrated circuit and send to the voltage regulation module via the sense line. Further the present invention relates to a corresponding apparatus with a voltage regulation module and an integrated circuit.
摘要:
A method and apparatus for changing a clock frequency in a system (10) comprising a plurality of synchronous integrated circuit chips (12, 14, 16), and a circuit (20) for implementing the frequency change. The method includes: detecting a change in processing requirements in one of the plurality of synchronous integrated circuit chips; notifying the plurality of synchronous integrated circuit chips that a clock frequency change is to occur; achieving a quiescent bus state in each of the plurality of synchronous integrated circuit chips; notifying the plurality of synchronous integrated circuit chips that the clock frequency change can occur; and changing the clock frequency of the plurality of integrated circuit chips.
摘要:
A mechanism provides accurate time-based counters for scaling operating frequencies of microprocessors. The mechanism makes use of a time-based counter circuit configuration in which a fixed frequency clock is derived from a PLL of the clock generation circuit of the microprocessor and is used to feed the external and internal timebase logic as well as a timebase accumulator counter. The timebase accumulator counter accumulates the tick events from the timebase logic between two core clocks. The accumulated value is transferred to the core clock domain on every clock edge of a scalable clock and the accumulator is then reset. Because the accumulated ticks are transferred to the core clock domain before the accumulator is reset, no ticks are ever lost using the circuitry of the illustrative embodiment.