Abstract:
A shutter system for a pixel array is disclosed. The system includes a read shift register, first and second reset shift registers, and a plurality of logic gates. The read shift register is configured to sequentially count rows of the pixel array from top to bottom, such that the read shift register generates a read pointer. The first reset shift register is configured to sequentially reset rows of the pixel array from top to bottom. The first reset shift register provides a first reset pointer for allowing reset of pixels in a row indicated by the first reset pointer. The first reset pointer allows reset of pixels prior to reading of the pixels in a row indicated by the read pointer. The time difference between the first reset pointer and the read pointer indicates an exposure time. The second reset shift register is configured to provide a second reset pointer, which enables the first reset shift register to sequentially reset rows of the pixel array without generating any flashes when the exposure time is increased. The plurality of logic gates direct outputs of the read shift register and the first and second reset shift registers to each pixel in the pixel array.
Abstract:
A shutter system for a pixel array is disclosed. The system includes a read shift register, first and second reset shift registers, and a plurality of logic gates. The read shift register is configured to sequentially count rows of the pixel array from top to bottom, such that the read shift register generates a read pointer. The first reset shift register is configured to sequentially reset rows of the pixel array from top to bottom. The first reset shift register provides a first reset pointer for allowing reset of pixels in a row indicated by the first reset pointer. The first reset pointer allows reset of pixels prior to reading of the pixels in a row indicated by the read pointer. The time difference between the first reset pointer and the read pointer indicates an exposure time. The second reset shift register is configured to provide a second reset pointer, which enables the first reset shift register to sequentially reset rows of the pixel array without generating any flashes when the exposure time is increased. The plurality of logic gates direct outputs of the read shift register and the first and second reset shift registers to each pixels in the pixel array.
Abstract:
A relatively non-complex signal processor supporting an active pixel sensor imaging system is disclosed. The signal processor only requires the first sample from a group of samples in a multiple sample to be transmitted to the signal processor at full resolution. The subsequent samples in that group can be transmitted using only a subset of least significant bits. The minimum number of required LSBs is based upon the level of noise in the system. In one embodiment, the number of LSBs transmitted is k+2 per sample, where k indicates the number bits corresponding to peak noise. In an alternative embodiment, each subsequent sample is transmitted using only k+1 bits.
Abstract:
A macro pixel is provided. The macro pixel includes at least two color pixel elements. Each color pixel element includes a photoreceptor that in response to receiving light, generates an output signal that is indicative of the quantity of light photons of a color are received. Each of the color pixel elements are configured to receive a corresponding color. The photoreceptor of each color pixel element has a geometry and a responsivity to light that is a function of the geometry of the photoreceptor such that the responsivity of the output signal of the photoreceptor to the corresponding color is controllable by changing the geometry. The geometries of the photoreceptors are selected so that a predetermined relative sensitivity to each color is obtained.
Abstract:
A relatively non-complex signal processor supporting an active pixel sensor imaging system is disclosed. The signal processor only requires the first sample from a group of samples in a multiple sample to be transmitted to the signal processor at full resolution. The subsequent samples in that group can be transmitted using only a subset of least significant bits. The minimum number of required LSBs is based upon the level of noise in the system. In one embodiment, the number of LSBs transmitted is k+2 per sample, where k indicates the number bits corresponding to peak noise. In an alternative embodiment, each subsequent sample is transmitted using only k+1 bits.
Abstract:
A mechanism for discharging parasitic capacitance at an input of an operational amplifier, which is shared between two stages of a pipelined analog-to-digital converter and/or two channels of signal processing circuitry, before the amplifier configuration of the stages/channels is switched. The discharging act occurs when a short reset pulse is generated between two clock phases. The short reset pulse is applied to a switch connected to the operational amplifier input. When the reset pulse closes the switch, a discharge path is created and any parasitic capacitance at the operational amplifier input is discharged through the path. The discharging of the parasitic capacitance substantially mitigates the memory effect and the problems associated with the memory effect.
Abstract:
An apparatus and method for measuring the breakpoint of a response curve representing the voltage output of an image array having an extended dynamic range. By flooding a light-opaque pixel with a charge and then applying an intermediate reset voltage to the pixel, the signal is read from the pixel and stored. The full reset voltage is applied to the pixel, and then the signal in the pixel is read and stored. The voltage output difference is the difference between the first and second stored signal. The voltage output difference is then used to determine the voltage of the knee point. Further, a conventional saturated pixel can be reset with an intermediate reset just prior to readout. The resulting signal can then be used to determine the voltage of the knee point.
Abstract:
The speed of on-chip ADC testing of image sensors is increased by testing multiple chips in parallel. A wafer typically contains many individual image sensor chips. In a parallel on-chip test procedure, power is applied to a plurality of the image sensor chips and the chips are then tested in parallel. Additional power lines may need to be added to the wafer to allow power to be supplied to a plurality of the image sensor chips at once. These power lines may be etched directly on the wafer, or a wafer master may be used to overlay the wafer with the power lines for testing purposes. Additionally, test engines may be added to the wafer map to control the overall test procedures.
Abstract:
An integrated circuit may have rows and columns of imaging pixel arrays. Row driver circuitry and column readout circuitry may be shared between the imaging pixel arrays. Control circuit blocks may bypass inactive pixel arrays and may shift signals between different signal paths on the integrated circuit. The control circuit blocks may include synchronizing circuitry for deskewing control signals and buffer circuitry for regenerating weak signals as they are distributed across the integrated circuit. An array of lenses may be associated with the integrated circuit. The spacing between imaging pixel arrays may differ at different parts of the integrated circuit. Images from multiple image sensor pixel arrays may be combined to form a single digital image. Image sensors may be provided with unique lenses, different color responses, different image pixels, different image pixel patterns, and other differences. Reference pixels may be interposed in the gaps between image sensor arrays.
Abstract:
A relatively non-complex signal processor supporting an active pixel sensor imaging system is disclosed. The signal processor only requires the first sample from a group of samples in a multiple sample to be transmitted to the signal processor at full resolution. The subsequent samples in that group can be transmitted using only a subset of least significant bits. The minimum number of required LSBs is based upon the level of noise in the system. In one embodiment, the number of LSBs transmitted is k+2 per sample, where k indicates the number bits corresponding to peak noise. In an alternative embodiment, each subsequent sample is transmitted using only k+1 bits.