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公开(公告)号：US08315026B2
公开(公告)日：2012-11-20
申请号：US12745973
申请日：2008-11-27
IPC分类号： H02H3/22
CPC分类号： H03K19/00346 , G06F21/755
摘要： A semiconductor device includes a substrate on which an electronic circuit is provided. Two or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an aggregate amount of a current flowing between the substrate and said pads. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.
摘要翻译： 半导体器件包括其上设置电子电路的衬底。 可以存在可以将电子电路连接到衬底外部的外部设备的两个或更多个焊盘。 电流表与衬底和/或衬垫的至少一部分电接触。 仪表可以测量形成在基板和所述焊盘之间流动的电流的总量的度量的参数。 控制单元连接到电流表和电子电路，用于基于测量的参数来控制电子电路。
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公开(公告)号：US20100277205A1
公开(公告)日：2010-11-04
申请号：US12745966
申请日：2007-12-06
IPC分类号： H03K5/00
CPC分类号： H03K19/00346 , G06F21/755
摘要： A semiconductor device includes a substrate on which an electronic circuit is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.
摘要翻译： 半导体器件包括其上设置电子电路的衬底。 可以存在可以将电子电路连接到衬底外部的外部设备的一个或多个焊盘。 电流表与衬底和/或衬垫的至少一部分电接触。 仪表可以测量形成在衬底和至少一个衬垫中的至少一个之间流动的电流量的测量的参数。 控制单元连接到电流表和电子电路，用于基于测量的参数来控制电子电路。
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公开(公告)号：US08749936B2
公开(公告)日：2014-06-10
申请号：US12745966
申请日：2007-12-06
IPC分类号： H02H9/02
CPC分类号： H03K19/00346 , G06F21/755
摘要： A semiconductor device includes a substrate on which an electronic circuit is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.
摘要翻译： 半导体器件包括其上设置电子电路的衬底。 可以存在可以将电子电路连接到衬底外部的外部设备的一个或多个焊盘。 电流表与衬底和/或衬垫的至少一部分电接触。 仪表可以测量形成在衬底和至少一个衬垫中的至少一个之间流动的电流量的测量的参数。 控制单元连接到电流表和电子电路，用于基于测量的参数来控制电子电路。
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公开(公告)号：US20100253422A1
公开(公告)日：2010-10-07
申请号：US12745973
申请日：2008-11-27
IPC分类号： G05F1/10
CPC分类号： H03K19/00346 , G06F21/755
摘要： A semiconductor device includes a substrate on which an electronic circuit is provided. Two or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an aggregate amount of a current flowing between the substrate and said pads. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.
摘要翻译： 半导体器件包括其上设置电子电路的衬底。 可以存在可以将电子电路连接到衬底外部的外部设备的两个或更多个焊盘。 电流表与衬底和/或衬垫的至少一部分电接触。 仪表可以测量形成在基板和所述焊盘之间流动的电流的总量的度量的参数。 控制单元连接到电流表和电子电路，用于基于测量的参数来控制电子电路。
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5.发明申请CIRCUIT ARRANGEMENT FOR FILTERING UNWANTED SIGNALS FROM A CLOCK SIGNAL, PROCESSING SYSTEM AND METHOD OF FILTERING UNWANTED SIGNALS FROM A CLOCK SIGNAL 有权用于从时钟信号中滤出未经处理的信号的电路布置，处理系统和从时钟信号中滤除未经处理的信号的方法公开(公告)号：US20100164569A1
公开(公告)日：2010-07-01
申请号：US12664028
申请日：2007-06-14
IPC分类号： H03L7/06 , H03L7/00 , H03K5/1252
CPC分类号： H03K5/1252
摘要： A circuit arrangement for detecting unwanted signals on a clock signal comprises an input for receiving the clock signal, and a Phase Lock Loop PLL circuit having a reference input coupled to the input of the circuit arrangement for receiving the clock signal and an output for providing a PLL output signal. The circuit arrangement further comprises a detector coupled to the output of the PLL circuit and to the input of the circuit arrangement. The detector is arranged to identify correct transitions in the clock signal using the PLL output signal, and to remove incorrect transitions due to unwanted signals from the clock signal so as to provide a filtered clock signal at an output of the circuit arrangement.
摘要翻译： 用于检测时钟信号上不想要的信号的电路装置包括用于接收时钟信号的输入端和锁相环PLL电路，其具有耦合到用于接收时钟信号的电路装置的输入端的参考输入端和用于提供时钟信号的输出端 PLL输出信号。 电路装置还包括耦合到PLL电路的输出和电路装置的输入的检测器。 检测器被布置为使用PLL输出信号来识别时钟信号中的正确转换，并且由于来自时钟信号的不期望的信号而去除不正确的转换，以便在电路装置的输出处提供经滤波的时钟信号。
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6.发明授权Circuit arrangement for filtering unwanted signals from a clock signal, processing system and method of filtering unwanted signals from a clock signal 有权用于从时钟信号滤波不想要的信号的电路装置，处理系统以及从时钟信号滤除不想要的信号的方法公开(公告)号：US08115516B2
公开(公告)日：2012-02-14
申请号：US12664028
申请日：2007-06-14
IPC分类号： G01R29/02
CPC分类号： H03K5/1252
摘要： A circuit arrangement for detecting unwanted signals on a clock signal comprises an input for receiving the clock signal, and a Phase Lock Loop PLL circuit having a reference input coupled to the input of the circuit arrangement for receiving the clock signal and an output for providing a PLL output signal. The circuit arrangement further comprises a detector coupled to the output of the PLL circuit and to the input of the circuit arrangement. The detector is arranged to identify correct transitions in the clock signal using the PLL output signal, and to remove incorrect transitions due to unwanted signals from the clock signal so as to provide a filtered clock signal at an output of the circuit arrangement.
摘要翻译： 用于检测时钟信号上不想要的信号的电路装置包括用于接收时钟信号的输入端和锁相环PLL电路，其具有耦合到用于接收时钟信号的电路装置的输入端的参考输入端和用于提供时钟信号的输出端 PLL输出信号。 电路装置还包括耦合到PLL电路的输出和电路装置的输入的检测器。 检测器被布置为使用PLL输出信号来识别时钟信号中的正确转换，并且由于来自时钟信号的不期望的信号而去除不正确的转换，以便在电路装置的输出处提供经滤波的时钟信号。
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公开(公告)号：US20110297935A1
公开(公告)日：2011-12-08
申请号：US13201977
申请日：2009-02-23
申请人： Hubert Bode , Andreas Laudenbach , Andreas Roth
发明人： Hubert Bode , Andreas Laudenbach , Andreas Roth
IPC分类号： H01L23/58
CPC分类号： H01L23/585 , H01L22/14 , H01L22/34 , H01L27/0921 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device comprises a substrate provided with a doping of a first type, on which an electronic circuit is provided surrounded by a circuit portion of the substrate provided with a doping of a second type; at least one pad for connecting the electronic circuit to an external device outside the substrate, surrounded by a pad portion provided with a doping of the second type; a sensing device comprising a sensor portion of the substrate provided with a doping of the first type, for sensing a parameter forming a measure for a local electrical potential of the substrate; and an evaluation unit connected to the sensing device, for providing an evaluation signal based on a difference between the parameter and a reference value.
摘要翻译： 半导体器件包括设置有第一类型的掺杂的衬底，电子电路设置在其上，由设置有第二类型的掺杂的衬底的电路部分围绕; 至少一个焊盘，用于将所述电子电路连接到所述衬底外部的外部设备，由被提供有所述第二类型的掺杂的焊盘部分围绕; 感测装置，包括设置有第一类型的掺杂的衬底的传感器部分，用于感测形成衬底的局部电势的度量的参数; 以及评估单元，连接到感测装置，用于基于参数和参考值之间的差异提供评估信号。
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公开(公告)号：US08853795B2
公开(公告)日：2014-10-07
申请号：US13201977
申请日：2009-02-23
申请人： Hubert Bode , Andreas Laudenbach , Andreas Roth
发明人： Hubert Bode , Andreas Laudenbach , Andreas Roth
IPC分类号： H01L29/66 , H01L27/092 , H01L21/66 , H01L23/58
CPC分类号： H01L23/585 , H01L22/14 , H01L22/34 , H01L27/0921 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device comprises a substrate provided with a doping of a first type, on which an electronic circuit is provided surrounded by a circuit portion of the substrate provided with a doping of a second type; at least one pad for connecting the electronic circuit to an external device outside the substrate, surrounded by a pad portion provided with a doping of the second type; a sensing device comprising a sensor portion of the substrate provided with a doping of the first type, for sensing a parameter forming a measure for a local electrical potential of the substrate; and an evaluation unit connected to the sensing device, for providing an evaluation signal based on a difference between the parameter and a reference value.
摘要翻译： 半导体器件包括设置有第一类型的掺杂的衬底，电子电路设置在其上，由设置有第二类型的掺杂的衬底的电路部分围绕; 至少一个焊盘，用于将所述电子电路连接到所述衬底外部的外部设备，由被提供有所述第二类型的掺杂的焊盘部分围绕; 感测装置，包括设置有第一类型的掺杂的衬底的传感器部分，用于感测形成衬底的局部电势的度量的参数; 以及评估单元，连接到感测装置，用于基于参数和参考值之间的差异提供评估信号。
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9.发明申请SEMICONDUCTOR DEVICE WITH NON-ISOLATED POWER TRANSISTOR WITH INTEGRATED DIODE PROTECTION 有权具有集成二极管保护功能的非隔离型功率晶体管的半导体器件公开(公告)号：US20160099349A1
公开(公告)日：2016-04-07
申请号：US14507063
申请日：2014-10-06
申请人： Patrice M. Parris , Hubert M. Bode , Weize Chen , Richard J. DeSouza , Andreas Laudenbach , Kurt U. Neugebauer
发明人： Patrice M. Parris , Hubert M. Bode , Weize Chen , Richard J. DeSouza , Andreas Laudenbach , Kurt U. Neugebauer
CPC分类号： H01L29/7823 , H01L21/761 , H01L27/0255 , H01L27/0727 , H01L29/0619 , H01L29/0623 , H01L29/063 , H01L29/0653 , H01L29/0878 , H01L29/1095 , H01L29/36 , H01L29/66659 , H01L29/7835
摘要： A semiconductor device configured with one or more integrated breakdown protection diodes in non-isolated power transistor devices and electronic apparatus, and methods for fabricating the devices.
摘要翻译： 在非隔离功率晶体管器件和电子设备中配置有一个或多个集成击穿保护二极管的半导体器件，以及用于制造器件的方法。
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公开(公告)号：US09620496B2
公开(公告)日：2017-04-11
申请号：US14644041
申请日：2015-03-10
CPC分类号： H01L27/0248 , H01L21/8222 , H01L27/0259 , H01L27/067
摘要： Protection circuits, device structures and related fabrication methods are provided. An exemplary protection circuit includes a first protection arrangement and a second protection arrangement. The first protection arrangement includes a first transistor having a first collector, a first emitter, and a first base coupled to the first emitter at a first node, and a second transistor having a second collector, a second emitter, and a second base coupled to the second emitter at a second node, the second collector being coupled to the first collector at a third node. The second protection arrangement is coupled electrically in series between the second node and a fourth node. The protection circuit further includes a first diode coupled between the third node and the fourth node.
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