公开(公告)号：US20240096648A1

公开(公告)日：2024-03-21

申请号：US18509801

申请日：2023-11-15

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Chi Nung Ni ,  Long Huang ,  SivaChandra Jangam

IPC: H01L21/56 ,  H01L23/00 ,  H01L25/065

CPC classification number: H01L21/56 ,  H01L24/32 ,  H01L25/0655 ,  H01L2224/32059 ,  H01L2224/32137 ,  H01L2924/183

Abstract: Chip sealing designs to accommodate die-to-die communication are described. In an embodiment, a chip structure includes a split metallic seal structure including a lower metallic seal and an upper metallic seal with overlapping metallization layers, and a through seal interconnect navigating through the split metallic seal structure.

公开(公告)号：US11069665B2

公开(公告)日：2021-07-20

申请号：US16205679

申请日：2018-11-30

Applicant: Apple Inc.

Inventor： Vidhya Ramachandran ,  Chonghua Zhong ,  Jun Zhai ,  Long Huang ,  Mengzhi Pang ,  Rohan U. Mandrekar

IPC: H01L25/16 ,  G01R31/64 ,  H01L23/525 ,  H01L21/66 ,  H01L49/02

Abstract: Integrated passive devices (IPDs), electronic packaging structures, and methods of testing IPDs are described. In an embodiment, an electronic package structure includes an IPD with an array of capacitor banks that are electrically separate in the IPD, and a package routing that includes an interconnect electrically connected to an IC and a plurality of the capacitor banks in parallel.

公开(公告)号：US11862481B2

公开(公告)日：2024-01-02

申请号：US17460806

申请日：2021-08-30

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Chi Nung Ni ,  Long Huang ,  SivaChandra Jangam

IPC: H01L21/56 ,  H01L25/065 ,  H01L23/00

CPC classification number: H01L21/56 ,  H01L24/32 ,  H01L25/0655 ,  H01L2224/32059 ,  H01L2224/32137 ,  H01L2924/183

Abstract: Chip sealing designs to accommodate die-to-die communication are described. In an embodiment, a chip structure includes a split metallic seal structure including a lower metallic seal and an upper metallic seal with overlapping metallization layers, and a through seal interconnect navigating through the split metallic seal structure.

公开(公告)号：US20200176427A1

公开(公告)日：2020-06-04

申请号：US16205679

申请日：2018-11-30

Applicant: Apple Inc.

Inventor： Vidhya Ramachandran ,  Chonghua Zhong ,  Jun Zhai ,  Long Huang ,  Mengzhi Pang ,  Rohan U. Mandrekar

IPC: H01L25/16 ,  H01L21/66 ,  G01R31/02

Abstract: Integrated passive devices (IPDs), electronic packaging structures, and methods of testing IPDs are described. In an embodiment, an electronic package structure includes an IPD with an array of capacitor banks that are electrically separate in the IPD, and a package routing that includes an interconnect electrically connected to an IC and a plurality of the capacitor banks in parallel.

公开(公告)号：US20240088032A1

公开(公告)日：2024-03-14

申请号：US17932182

申请日：2022-09-14

Applicant: Apple Inc.

Inventor： Vidhya Ramachandran ,  Chi Nung Ni ,  Chueh-An Hsieh ,  Rekha Govindaraj ,  Jun Zhai ,  Long Huang ,  Rohan U. Mandrekar ,  Saumya K. Gandhi ,  Zhuo Yan ,  Yizhang Yang ,  Saurabh P. Sinha ,  Antonietta Oliva

IPC: H01L23/528 ,  H01L23/00 ,  H01L23/48 ,  H01L23/522 ,  H01L49/02

CPC classification number: H01L23/5283 ,  H01L23/481 ,  H01L23/5226 ,  H01L24/08 ,  H01L24/16 ,  H01L28/40 ,  H01L2224/08265 ,  H01L2224/16225

Abstract: Microelectronic modules are described. In an embodiment, a microelectronic module includes a module substrate, a chip mounted onto the module substrate, and a semiconductor-based integrated passive device between the chip and the module substrate. The semiconductor-based integrated passive device may include an upper RDL stack-up with thicker wiring layers than a lower BEOL stack-up. The semiconductor-based integrated passive device may be further solder bonded or hybrid bonded with the chip.

公开(公告)号：US20220293433A1

公开(公告)日：2022-09-15

申请号：US17460806

申请日：2021-08-30

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Chi Nung Ni ,  Long Huang ,  SivaChandra Jangam

IPC: H01L21/56 ,  H01L25/065 ,  H01L23/00

Abstract: Chip sealing designs to accommodate die-to-die communication are described. In an embodiment, a chip structure includes a split metallic seal structure including a lower metallic seal and an upper metallic seal with overlapping metallization layers, and a through seal interconnect navigating through the split metallic seal structure.