Biasing scheme for low supply headroom applications

    公开(公告)号:US06531915B2

    公开(公告)日:2003-03-11

    申请号:US10127752

    申请日:2002-04-23

    IPC分类号: G05F110

    摘要: Methods and apparatus for improving the current matching within current mirror circuits in applications such as low voltage integrated circuits. Embodiments of the present invention attempt to maintain the proper current ratio between reference and output supplies by adjusting the reference output of the current mirror. An existing reference voltage on the output side of the mirror can be used or a reference voltage can be created to be used for the voltage regulation of the reference side of the current mirror.

    Biasing scheme for low supply headroom applications

    公开(公告)号:US06667654B2

    公开(公告)日:2003-12-23

    申请号:US10360810

    申请日:2003-02-10

    IPC分类号: G05F110

    摘要: Methods and apparatus for improving the current matching within current mirror circuits in applications such as low voltage integrated circuits. Embodiments of the present invention attempt to maintain the proper current ratio between reference and output supplies by adjusting the reference output of the current mirror. An existing reference voltage on the output side of the mirror can be used or a reference voltage can be created to be used for the voltage regulation of the reference side of the current mirror.

    Biasing scheme for low supply headroom applications
    3.
    发明授权
    Biasing scheme for low supply headroom applications 有权
    低供应净空应用的偏置方案

    公开(公告)号:US06396335B1

    公开(公告)日:2002-05-28

    申请号:US09712413

    申请日:2000-11-13

    IPC分类号: G05F110

    摘要: Methods and apparatus for improving the current matching within current mirror circuits in applications such as low voltage integrated circuits. Embodiments of the present invention attempt to maintain the proper current ratio between reference and output supplies by adjusting the reference output of the current mirror. An existing reference voltage on the output side of the mirror can be used or a reference voltage can be created to be used for the voltage regulation of the reference side of the current mirror.

    摘要翻译: 用于改善电流镜像电路内的电流匹配的方法和装置,例如低压集成电路。 本发明的实施例通过调节电流镜的参考输出来尝试维持参考电压和输出电源之间的适当电流比。 可以使用反射镜的输出侧上的现有参考电压,或者可以创建用于电流镜的参考侧的电压调节的参考电压。

    Biasing scheme for low supply headroom applications

    公开(公告)号:US07030687B2

    公开(公告)日:2006-04-18

    申请号:US10952928

    申请日:2004-09-30

    IPC分类号: G05F1/10

    摘要: Methods and apparatus for improving the current matching within current mirror circuits in applications such as low voltage integrated circuits. Embodiments of the present invention attempt to maintain the proper current ratio between reference and output supplies by adjusting the reference output of the current mirror. An existing reference voltage on the output side of the mirror can be used or a reference voltage can be created to be used for the voltage regulation of the reference side of the current mirror.

    Biasing scheme for supply headroom applications
    5.
    发明授权
    Biasing scheme for supply headroom applications 失效
    供应净空应用的偏置方案

    公开(公告)号:US06812779B2

    公开(公告)日:2004-11-02

    申请号:US10665620

    申请日:2003-09-22

    IPC分类号: G05F110

    摘要: Methods and apparatus for improving the current matching within current mirror circuits in applications such as low voltage integrated circuits. Embodiments of the present invention attempt to maintain the proper current ratio between reference and output supplies by adjusting the reference output of the current mirror. An existing reference voltage on the output side of the mirror can be used or a reference voltage can be created to be used for the voltage regulation of the reference side of the current mirror.

    摘要翻译: 用于改善电流镜像电路内的电流匹配的方法和装置,例如低压集成电路。 本发明的实施例通过调节电流镜的参考输出来尝试维持参考电压和输出电源之间的适当电流比。 可以使用反射镜的输出侧上的现有参考电压,或者可以创建用于电流镜的参考侧的电压调节的参考电压。

    Simultaneous testing of semiconductor components on a wafer
    9.
    发明授权
    Simultaneous testing of semiconductor components on a wafer 有权
    同时测试晶圆上的半导体元件

    公开(公告)号:US09002673B2

    公开(公告)日:2015-04-07

    申请号:US13025657

    申请日:2011-02-11

    摘要: Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation.

    摘要翻译: 公开了同时无线地测试形成在半导体晶片上的半导体元件的方法和装置。 半导体部件通过公共通信信道将各自的测试结果传送到无线自动测试设备。 多个接收天线在三维空间中观察多个方向的结果。 无线自动测试设备确定一个或多个半导体组件是否按预期运行,并且可选地,可以使用三维空间的属性来确定一个或多个半导体组件的位置。 无线测试设备还可以通过检测在独立测试操作之前,期间和/或之后由半导体晶片发射,传输和/或反射的红外能量来确定半导体组件的性能。