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公开(公告)号：US20050047196A1
公开(公告)日：2005-03-03
申请号：US10649200
申请日：2003-08-27
IPC分类号： G11C11/418 , G11C11/412 , H01L21/8244 , H01L27/11 , G11C11/00
CPC分类号： G11C11/412
摘要： Loadless 4T SRAM cells, and methods for operating such SRAM cells, which can provide highly integrated semiconductor memory devices while providing increased performance with respect to data stability and increased I/O speed for data access operations. A loadless 4T SRAM cell comprises a pair of access transistors and a pair of pull-down transistors, all of which are implemented as N-channel transistors (NFETs or NMOSFETS). The access transistors have lower threshold voltages than the pull-down transistors, which enables the SRAM cell to effectively maintain a logic “1” potential during standby. The pull-down transistors have larger channel widths as compared to the access transistors, which enables the SRAM cell to effectively maintain a logic “0” potential at a given storage node during a read operation. A method is implemented for dynamically adjusting the threshold voltages of the transistors of activated memory cells during an access operation to thereby increase the read current or performance of the accessed memory cells.
摘要翻译： 无负载4T SRAM单元以及用于操作这样的SRAM单元的方法，其可以提供高度集成的半导体存储器件，同时在数据访问操作方面提供相对于数据稳定性和增加的I / O速度的增加的性能。 无负载的4T SRAM单元包括一对存取晶体管和一对下拉晶体管，所有这些都被实现为N沟道晶体管（NFET或NMOSFETS）。 存取晶体管具有比下拉晶体管低的阈值电压，这使得SRAM单元能够在待机期间有效地保持逻辑“1”电位。 与存取晶体管相比，下拉晶体管具有较大的沟道宽度，这使得SRAM单元能够在读取操作期间在给定存储节点处有效地保持逻辑“0”电位。 实现了一种用于在访问操作期间动态地调整激活的存储器单元的晶体管的阈值电压从而增加所访问的存储器单元的读取电流或性能的方法。
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2.发明申请Circuits and methods for providing low voltage, high performance register files 失效提供低电压，高性能寄存器文件的电路和方法公开(公告)号：US20060215465A1
公开(公告)日：2006-09-28
申请号：US11089941
申请日：2005-03-25
IPC分类号： G11C7/00
CPC分类号： G11C11/412 , G11C8/08
摘要： Circuits and methods are provided to implement low voltage, higher performance semiconductor memory devices such as CMOS static random access memory (SRAM) or multi-port register files. For example, circuits and methods are provided for dynamically adjusting power supply and/or ground line voltages that are applied to the memory cells during different modes of memory operation to enable low voltage, high performance operation of the memory devices.
摘要翻译： 提供了电路和方法来实现诸如CMOS静态随机存取存储器（SRAM）或多端口寄存器文件的低电压，更高性能的半导体存储器件。 例如，电路和方法被提供用于在存储器操作的不同模式期间动态调整施加到存储器单元的电源和/或接地线电压，以实现存储器件的低电压，高性能的操作。
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3.发明申请公开(公告)号：US20050043908A1
公开(公告)日：2005-02-24
申请号：US10643193
申请日：2003-08-18
IPC分类号： G01R27/28 , G01R31/26 , G01R31/30 , G01R31/317 , G01R31/3173 , G01R31/3193 , G11C29/50
CPC分类号： G11C29/50004 , G01R31/2603 , G01R31/3016 , G01R31/31725 , G01R31/31727 , G01R31/3173 , G01R31/31937 , G11C11/41 , G11C29/50 , G11C2029/5002
摘要： Circuits and methods for measuring and characterizing random variations in device characteristics of semiconductor integrated circuit devices, which enable circuit designers to accurately measure and characterize random variations in device characteristics (such as transistor threshold voltage) between neighboring devices resulting from random sources such as dopant fluctuations and line edge roughness, for purposes of integrated circuit design and analysis. In one aspect, a method for characterizing random variations in device mismatch (e.g., threshold voltage mismatch) between a pair of device (e.g., transistors) is performed by obtaining subthreshold DC voltage characteristic data for the device pair, and then determining a distribution in voltage threshold mismatch for the device pair directly from the corresponding subthreshold DC voltage characteristic data. The voltage threshold mismatch distributions of different device pairs of a given circuit design can then be used to determine voltage threshold variations of the constituent circuit devices. The voltage threshold variation of the devices can be used to characterize the random variations of the given circuit.
摘要翻译： 用于测量和表征半导体集成电路器件的器件特性的随机变化的电路和方法，其使电路设计者能够精确地测量和表征由诸如掺杂剂波动的随机源产生的相邻器件之间的器件特性（例如晶体管阈值电压）的随机变化 和线边缘粗糙度，用于集成电路设计和分析。 在一方面，通过获得器件对的亚阈值DC电压特性数据来执行用于表征一对器件（例如，晶体管）之间的器件失配（例如，阈值电压失配）的随机变化的方法，然后确定器件对中的分布 直接从对应的亚阈值直流电压特性数据中的器件对的电压阈值失配。 然后可以使用给定电路设计的不同器件对的电压阈值失配分布来确定构成电路器件的电压阈值变化。 器件的电压阈值变化可用于表征给定电路的随机变化。
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4.发明申请METHOD AND STRUCTURE FOR REDUCING GATE LEAKAGE AND THRESHOLD VOLTAGE FLUCTUATION IN MEMORY CELLS 失效用于减少记忆细胞中门的泄漏和阈值电压波动的方法和结构公开(公告)号：US20050018518A1
公开(公告)日：2005-01-27
申请号：US10625959
申请日：2003-07-24
CPC分类号： G11C7/1045 , G11C2207/2227
摘要： A memory device has a memory cell including a plurality of active devices, which can be switched on by an applied threshold voltage. A power line is coupled to at least one storage node by one of the active devices. One other of the active devices couples a virtual ground to the storage node. Potentials of the power line and the virtual ground cause the plurality of active devices to be selectively operated in near subthreshold and/or superthreshold regimes in accordance with a mode of operation.
摘要翻译： 存储器件具有包括多个有源器件的存储器单元，其可通过所施加的阈值电压接通。 电力线通过一个有源装置耦合到至少一个存储节点。 另一个活动设备将虚拟接地耦合到存储节点。 根据操作模式，电源线和虚拟接地的电位使多个有源器件选择性地在近临近阈值和/或超阈值状态下操作。
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5.发明申请High performance register file with bootstrapped storage supply and method of reading data thereform 有权具有引导存储供应的高性能寄存器文件和数据读取方法公开(公告)号：US20060109733A1
公开(公告)日：2006-05-25
申请号：US10996311
申请日：2004-11-22
申请人： Rajiv Joshi , Azeez Bhavnagarwala
发明人： Rajiv Joshi , Azeez Bhavnagarwala
IPC分类号： G11C8/00
CPC分类号： G11C11/412 , G11C8/16
摘要： A multi-port register file, integrated circuit (IC) chip including one or more multi-port register files and method of reading data from the multi-port register file. The supply to storage latches in multi-port register file is selectively bootstrapped above the supply voltage during accesses.
摘要翻译： 多端口寄存器文件，包括一个或多个多端口寄存器文件的集成电路（IC）芯片以及从多端口寄存器文件读取数据的方法。 在多端口寄存器文件中的存储锁存器的供应在访问期间选择性地被引导到电源电压之上。
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6.发明申请Methods for incorporating high k dielectric materials for enhanced SRAM operation and structures produced thereby 审中-公开用于结合高k电介质材料以增强SRAM操作的方法和由此产生的结构公开(公告)号：US20060103023A1
公开(公告)日：2006-05-18
申请号：US10988484
申请日：2004-11-12
IPC分类号： H01L21/4763 , H01L23/48
CPC分类号： H01L21/76801 , G11C11/412 , H01L23/53295 , H01L27/11 , H01L27/1104 , H01L2924/0002 , H01L2924/00
摘要： A hybrid interconnect structure that possesses a higher interconnect capacitance in one set of regions than in other regions on the same microelectronic chip is described. Several methods to fabricate such a structure are provided. Circuit implementations of such hybrid interconnect structures are described that enable increased static noise margin and reduce the leakage in SRAM cells and common power supply voltages for SRAM and logic in such a chip. Methods that enable combining these circuit benefits with higher interconnect performance speed and superior mechanical robustness in such chips are also taught.
摘要翻译： 描述了在一组区域中具有比在同一微电子芯片上的其它区域更高的互连电容的混合互连结构。 提供了几种制造这种结构的方法。 描述了这样的混合互连结构的电路实现，其能够增加静态噪声容限并且减少SRAM单元中的泄漏以及用于这种芯片中的SRAM和逻辑的公共电源电压。 还教导了能够将这些电路优点与更高的互连性能速度和优异的机械鲁棒性相结合的方法。
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公开(公告)号：US20070247896A1
公开(公告)日：2007-10-25
申请号：US11409858
申请日：2006-04-24
IPC分类号： G11C11/00
CPC分类号： G11C11/4125 , Y10S257/903
摘要： A memory cell comprises a wordline, a first digital inverter with a first input and a first output, and a second digital inverter with a second input and a second output. Moreover, the memory cell further comprises a first feedback connection connecting the first output to the second input, and a second feedback connection connecting the second output to the first input. The first feedback connection comprises a first resistive element and the second feedback connection comprises a second resistive element. What is more, each digital inverter has an associated capacitance. The memory cell is configured such that reading the memory cell includes applying a read voltage pulse to the wordline. In addition, the first and second resistive elements are configured such that the first and second feedback connections have resistance-capacitance induced delays longer than the applied read voltage pulse.
摘要翻译： 存储单元包括字线，具有第一输入和第一输出的第一数字逆变器以及具有第二输入和第二输出的第二数字反相器。 此外，存储单元还包括将第一输出连接到第二输入的第一反馈连接和将第二输出连接到第一输入的第二反馈连接。 第一反馈连接包括第一电阻元件，第二反馈连接包括第二电阻元件。 更重要的是，每个数字逆变器都有相关的电容。 存储单元被配置为使得读取存储器单元包括将读取电压脉冲施加到字线。 此外，第一和第二电阻元件被配置为使得第一和第二反馈连接具有比施加的读取电压脉冲更长的电阻 - 电容感应延迟。
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8.发明授权High performance register file with bootstrapped storage supply and method of reading data therefrom 有权具有引导存储供应的高性能寄存器文件和从其读取数据的方法公开(公告)号：US07180818B2
公开(公告)日：2007-02-20
申请号：US10996311
申请日：2004-11-22
IPC分类号： G11C8/00
CPC分类号： G11C11/412 , G11C8/16
摘要： A multi-port register file, integrated circuit (IC) chip including one or more multi-port register files and method of reading data from the multi-port register file. The supply to storage latches in multi-port register file is selectively bootstrapped above the supply voltage during accesses.
摘要翻译： 多端口寄存器文件，包括一个或多个多端口寄存器文件的集成电路（IC）芯片以及从多端口寄存器文件读取数据的方法。 在多端口寄存器文件中的存储锁存器的供应在访问期间选择性地被引导到电源电压之上。
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公开(公告)号：US20230042652A1
公开(公告)日：2023-02-09
申请号：US17827763
申请日：2022-05-29
申请人： Azeez Bhavnagarwala
发明人： Azeez Bhavnagarwala
IPC分类号： G11C11/4096 , G11C11/4094 , G11C11/4074
摘要： CMOS harvesting circuits are disclosed for conventional 6T SRAM bitcell arrays enabling substantial improvements to SRAM access time, pipeline performance and to SRAM active and leakage energy consumption—without scaling operating voltages while also improving Read and Write margins using assist schemes at very low area and energy overhead by reusing circuits that harvest charge. Active energy dissipation during an SRAM read access is lowered by use of novel sensing schemes that self-limit signal development on the BL without the energy overheads seen in conventional designs from sense-amp offsets, BL column leakage and uncertain read current. Improvements in access time are enabled by increasing the signal development rate on the BL—by comparing the rising electric potential of harvested charge with a decreasing BL voltage in a bitcell column using a novel and compact inverting amplifier with dynamic reset. This area and energy efficient scheme leveraging availability of harvested charge not only self-limits signal development on the BL to lower active power and improve read latency, but also eliminates most of the uncertainty of BL voltage signal from uncertain read current by using a capacitive divider. Charge harvested in each column of bitcells from a read/write access is moved to a local harvest grid with a fraction of the capacitance of the BLs accessed in the subarray, at a voltage closer to VDD and is readily tapped into during a following Write access lowering write energy consumption from the power grid by over 30%. Active or standby mode leakage is lowered by the raised voltage of the harvesting node in each column—that is discharged only before the WL selects —for all columns during a Read and for half-select columns during a Write
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公开(公告)号：US06920061B2
公开(公告)日：2005-07-19
申请号：US10649200
申请日：2003-08-27
IPC分类号： G11C11/418 , G11C11/412 , H01L21/8244 , H01L27/11 , G11C11/00
CPC分类号： G11C11/412
摘要： Loadless 4T SRAM cells, and methods for operating such SRAM cells, which can provide highly integrated semiconductor memory devices while providing increased performance with respect to data stability and increased I/O speed for data access operations. A loadless 4T SRAM cell comprises a pair of access transistors and a pair of pull-down transistors, all of which are implemented as N-channel transistors (NFETs or NMOSFETS). The access transistors have lower threshold voltages than the pull-down transistors, which enables the SRAM cell to effectively maintain a logic “1” potential during standby. The pull-down transistors have larger channel widths as compared to the access transistors, which enables the SRAM cell to effectively maintain a logic “0” potential at a given storage node during a read operation. A method is implemented for dynamically adjusting the threshold voltages of the transistors of activated memory cells during an access operation to thereby increase the read current or performance of the accessed memory cells.
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