Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits
    1.
    发明申请
    Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits 有权
    用于表征半导体集成电路器件特性随机变化的电路和方法

    公开(公告)号:US20050043908A1

    公开(公告)日:2005-02-24

    申请号:US10643193

    申请日:2003-08-18

    摘要: Circuits and methods for measuring and characterizing random variations in device characteristics of semiconductor integrated circuit devices, which enable circuit designers to accurately measure and characterize random variations in device characteristics (such as transistor threshold voltage) between neighboring devices resulting from random sources such as dopant fluctuations and line edge roughness, for purposes of integrated circuit design and analysis. In one aspect, a method for characterizing random variations in device mismatch (e.g., threshold voltage mismatch) between a pair of device (e.g., transistors) is performed by obtaining subthreshold DC voltage characteristic data for the device pair, and then determining a distribution in voltage threshold mismatch for the device pair directly from the corresponding subthreshold DC voltage characteristic data. The voltage threshold mismatch distributions of different device pairs of a given circuit design can then be used to determine voltage threshold variations of the constituent circuit devices. The voltage threshold variation of the devices can be used to characterize the random variations of the given circuit.

    摘要翻译: 用于测量和表征半导体集成电路器件的器件特性的随机变化的电路和方法,其使电路设计者能够精确地测量和表征由诸如掺杂剂波动的随机源产生的相邻器件之间的器件特性(例如晶体管阈值电压)的随机变化 和线边缘粗糙度,用于集成电路设计和分析。 在一方面,通过获得器件对的亚阈值DC电压特性数据来执行用于表征一对器件(例如,晶体管)之间的器件失配(例如,阈值电压失配)的随机变化的方法,然后确定器件对中的分布 直接从对应的亚阈值直流电压特性数据中的器件对的电压阈值失配。 然后可以使用给定电路设计的不同器件对的电压阈值失配分布来确定构成电路器件的电压阈值变化。 器件的电压阈值变化可用于表征给定电路的随机变化。

    METHOD AND STRUCTURE FOR REDUCING GATE LEAKAGE AND THRESHOLD VOLTAGE FLUCTUATION IN MEMORY CELLS
    2.
    发明申请
    METHOD AND STRUCTURE FOR REDUCING GATE LEAKAGE AND THRESHOLD VOLTAGE FLUCTUATION IN MEMORY CELLS 失效
    用于减少记忆细胞中门的泄漏和阈值电压波动的方法和结构

    公开(公告)号:US20050018518A1

    公开(公告)日:2005-01-27

    申请号:US10625959

    申请日:2003-07-24

    IPC分类号: G11C7/10 G11C7/00

    CPC分类号: G11C7/1045 G11C2207/2227

    摘要: A memory device has a memory cell including a plurality of active devices, which can be switched on by an applied threshold voltage. A power line is coupled to at least one storage node by one of the active devices. One other of the active devices couples a virtual ground to the storage node. Potentials of the power line and the virtual ground cause the plurality of active devices to be selectively operated in near subthreshold and/or superthreshold regimes in accordance with a mode of operation.

    摘要翻译: 存储器件具有包括多个有源器件的存储器单元,其可通过所施加的阈值电压接通。 电力线通过一个有源装置耦合到至少一个存储节点。 另一个活动设备将虚拟接地耦合到存储节点。 根据操作模式,电源线和虚拟接地的电位使多个有源器件选择性地在近临近阈值和/或超阈值状态下操作。

    Circuits and methods for providing low voltage, high performance register files
    3.
    发明申请
    Circuits and methods for providing low voltage, high performance register files 失效
    提供低电压,高性能寄存器文件的电路和方法

    公开(公告)号:US20060215465A1

    公开(公告)日:2006-09-28

    申请号:US11089941

    申请日:2005-03-25

    IPC分类号: G11C7/00

    CPC分类号: G11C11/412 G11C8/08

    摘要: Circuits and methods are provided to implement low voltage, higher performance semiconductor memory devices such as CMOS static random access memory (SRAM) or multi-port register files. For example, circuits and methods are provided for dynamically adjusting power supply and/or ground line voltages that are applied to the memory cells during different modes of memory operation to enable low voltage, high performance operation of the memory devices.

    摘要翻译: 提供了电路和方法来实现诸如CMOS静态随机存取存储器(SRAM)或多端口寄存器文件的低电压,更高性能的半导体存储器件。 例如,电路和方法被提供用于在存储器操作的不同模式期间动态调整施加到存储器单元的电源和/或接地线电压,以实现存储器件的低电压,高性能的操作。

    Static random access memory cell with improved stability
    4.
    发明申请
    Static random access memory cell with improved stability 有权
    静态随机存取存储单元具有改进的稳定性

    公开(公告)号:US20070247896A1

    公开(公告)日:2007-10-25

    申请号:US11409858

    申请日:2006-04-24

    IPC分类号: G11C11/00

    CPC分类号: G11C11/4125 Y10S257/903

    摘要: A memory cell comprises a wordline, a first digital inverter with a first input and a first output, and a second digital inverter with a second input and a second output. Moreover, the memory cell further comprises a first feedback connection connecting the first output to the second input, and a second feedback connection connecting the second output to the first input. The first feedback connection comprises a first resistive element and the second feedback connection comprises a second resistive element. What is more, each digital inverter has an associated capacitance. The memory cell is configured such that reading the memory cell includes applying a read voltage pulse to the wordline. In addition, the first and second resistive elements are configured such that the first and second feedback connections have resistance-capacitance induced delays longer than the applied read voltage pulse.

    摘要翻译: 存储单元包括字线,具有第一输入和第一输出的第一数字逆变器以及具有第二输入和第二输出的第二数字反相器。 此外,存储单元还包括将第一输出连接到第二输入的第一反馈连接和将第二输出连接到第一输入的第二反馈连接。 第一反馈连接包括第一电阻元件,第二反馈连接包括第二电阻元件。 更重要的是,每个数字逆变器都有相关的电容。 存储单元被配置为使得读取存储器单元包括将读取电压脉冲施加到字线。 此外,第一和第二电阻元件被配置为使得第一和第二反馈连接具有比施加的读取电压脉冲更长的电阻 - 电容感应延迟。

    Loadless NMOS four transistor dynamic dual Vt SRAM cell
    5.
    发明申请
    Loadless NMOS four transistor dynamic dual Vt SRAM cell 有权
    无负载NMOS四晶体管动态双Vt SRAM单元

    公开(公告)号:US20050047196A1

    公开(公告)日:2005-03-03

    申请号:US10649200

    申请日:2003-08-27

    CPC分类号: G11C11/412

    摘要: Loadless 4T SRAM cells, and methods for operating such SRAM cells, which can provide highly integrated semiconductor memory devices while providing increased performance with respect to data stability and increased I/O speed for data access operations. A loadless 4T SRAM cell comprises a pair of access transistors and a pair of pull-down transistors, all of which are implemented as N-channel transistors (NFETs or NMOSFETS). The access transistors have lower threshold voltages than the pull-down transistors, which enables the SRAM cell to effectively maintain a logic “1” potential during standby. The pull-down transistors have larger channel widths as compared to the access transistors, which enables the SRAM cell to effectively maintain a logic “0” potential at a given storage node during a read operation. A method is implemented for dynamically adjusting the threshold voltages of the transistors of activated memory cells during an access operation to thereby increase the read current or performance of the accessed memory cells.

    摘要翻译: 无负载4T SRAM单元以及用于操作这样的SRAM单元的方法,其可以提供高度集成的半导体存储器件,同时在数据访问操作方面提供相对于数据稳定性和增加的I / O速度的增加的性能。 无负载的4T SRAM单元包括一对存取晶体管和一对下拉晶体管,所有这些都被实现为N沟道晶体管(NFET或NMOSFETS)。 存取晶体管具有比下拉晶体管低的阈值电压,这使得SRAM单元能够在待机期间有效地保持逻辑“1”电位。 与存取晶体管相比,下拉晶体管具有较大的沟道宽度,这使得SRAM单元能够在读取操作期间在给定存储节点处有效地保持逻辑“0”电位。 实现了一种用于在访问操作期间动态地调整激活的存储器单元的晶体管的阈值电压从而增加所访问的存储器单元的读取电流或性能的方法。

    System and method using locally heated island for integrated circuit testing
    7.
    发明申请
    System and method using locally heated island for integrated circuit testing 失效
    使用本地加热岛进行集成电路测试的系统和方法

    公开(公告)号:US20060049843A1

    公开(公告)日:2006-03-09

    申请号:US10936164

    申请日:2004-09-08

    IPC分类号: G01R31/26

    摘要: A test system and method for integrated circuits includes an energy source having an adjustable energy rate, and a feedback device, which measures a physical quantity at a discrete position on an integrated circuit. A control circuit adjusts the power source to externally apply energy to the integrated circuit at the discrete position. A circuit tester applies test programs to the integrated circuit while the discrete position is maintained at a value of the physical quantity in accordance with the control circuit.

    摘要翻译: 集成电路的测试系统和方法包括具有可调节能量速率的能量源和测量集成电路上的离散位置处的物理量的反馈装置。 控制电路调节电源以在离散位置向外部施加能量到集成电路。 电路测试仪将测试程序应用于集成电路,而离散位置根据控制电路保持在物理量的值。

    A METHOD AND APPARATUS FOR CONTROLLING POWER CONSUMPTION IN AN INTEGRATED CIRCUIT
    8.
    发明申请
    A METHOD AND APPARATUS FOR CONTROLLING POWER CONSUMPTION IN AN INTEGRATED CIRCUIT 审中-公开
    一种用于控制集成电路中的功耗的方法和装置

    公开(公告)号:US20060064606A1

    公开(公告)日:2006-03-23

    申请号:US10711485

    申请日:2004-09-21

    IPC分类号: G06F1/26

    摘要: A method and apparatus for controlling power consumption by devices in an integrated circuit. The apparatus includes a complementary device for a corresponding device for which power consumption is desired to be reduced. The complementary device supports all or some of the tasks of the corresponding device. The complementary device receives tasks that can be executed by either itself or the corresponding device and based upon the power management scheme will either execute the task itself or allow the corresponding device.

    摘要翻译: 一种用于控制集成电路中的器件的功耗的方法和装置。 该装置包括用于相应设备的补充设备,期望降低功耗。 互补设备支持相应设备的全部或部分任务。 互补设备接收可以由其自身或相应设备执行的任务,并且基于功率管理方案将执行任务本身或允许相应的设备。

    Low power circuits with small voltage swing transmission, voltage regeneration, and wide bandwidth architecture
    9.
    发明申请
    Low power circuits with small voltage swing transmission, voltage regeneration, and wide bandwidth architecture 有权
    具有小电压摆幅传输,电压再生和宽带宽架构的低功率电路

    公开(公告)号:US20050030817A1

    公开(公告)日:2005-02-10

    申请号:US10635331

    申请日:2003-08-06

    摘要: An integrated circuit, such as a memory macro, includes multiple power rails supporting first and second voltage differentials, with the second voltage differential being smaller than the first voltage differential. Signal lines in the integrated circuit are driven with the small voltage swing, which is generated by small swing circuits. The integrated circuit further includes regeneration circuits, which are receiving small voltage swing inputs and are outputting first, or full voltage swings. The application of the small voltage swing to the signal lines saves power in the integrated circuit. A wide bandwidth, full-wordline I/O, memory integrated circuit has simultaneously operable connection paths between essentially all the memory cells that are attached to the same wordline and the corresponding I/O terminals, and it has a single ended data-line structure.

    摘要翻译: 诸如存储器宏的集成电路包括支持第一和第二电压差的多个电源轨,第二电压差小于第一电压差。 集成电路中的信号线由小的摆动电路产生的小电压摆动驱动。 集成电路还包括正在接收小电压摆幅输入并且正在输出第一或全电压摆幅的再生电路。 将小电压摆幅应用于信号线节省了集成电路中的功率。 宽带宽全字I / O存储器集成电路具有在连接到相同字线和对应的I / O端子的基本上所有存储单元之间的同时可操作的连接路径,并且具有单端数据线结构 。

    Charge recycling power gate
    10.
    发明申请
    Charge recycling power gate 失效
    充电回收电源门

    公开(公告)号:US20050285628A1

    公开(公告)日:2005-12-29

    申请号:US10880111

    申请日:2004-06-29

    IPC分类号: H03K19/00 H03K19/094

    CPC分类号: H03K19/0019

    摘要: A charge recycling power gate and corresponding method are provided for using a charge sharing effect between a capacitive load of a functional unit and a parasitic capacitance of a charge recycling means to turn on a switching means between a virtual ground and a ground, the charge recycling power gate including a first transistor, a virtual ground in signal communication with a first terminal of the first transistor, a ground in signal communication with a second terminal of the first transistor, a capacitor having a first terminal in signal communication with a third terminal of the first transistor and a second terminal in signal communication with the ground, and a second transistor having a first terminal in signal communication with the virtual ground and a second terminal in signal communication with the third terminal of the first transistor.

    摘要翻译: 提供电荷回收功率门和相应的方法,用于使用功能单元的电容性负载与电荷回收装置的寄生电容之间的电荷共享效应,以接通虚拟地面和地面之间的开关装置,电荷回收 功率门,包括第一晶体管,与第一晶体管的第一端子进行信号通信的虚拟地,与第一晶体管的第二端子进行信号通信的地,电容器,具有与第三晶体管的第三端子信号通信的第一端子 第一晶体管和与地面信号通信的第二端子,以及第二晶体管,其具有与虚拟接地信号通信的第一端子和与第一晶体管的第三端子信号通信的第二端子。