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公开(公告)号：US20230048386A1
公开(公告)日：2023-02-16
申请号：US17978384
申请日：2022-11-01
发明人： Yaoping WANG , Zhaoyue LI , Haodong YANG , Meijuan ZHANG , Dong CHAI , Hong WANG
IPC分类号： G06V10/776 , G06T7/00 , G06V10/774 , G06V10/70 , G06V10/94 , G06V10/764
摘要： The present disclosure provides a method and device for detecting an image category. The method includes: acquiring a sample data set including a plurality of sample images labeled with a category, the sample data set including a training data set and a verification data set; training a deep learning model using the training data set to obtain, according to different numbers of training rounds, at least two trained models; testing the at least two trained models using the verification data set to generate a verification test result; generating, based on the verification test result, a verification test index; determining, according to the verification test index, a target model from the at least two trained models; and predict a to-be-tested image of the target object using the target model to obtain the category of the to-be-tested image.
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公开(公告)号：US20240202893A1
公开(公告)日：2024-06-20
申请号：US17772562
申请日：2021-05-21
发明人： Yaoping WANG , Meijuan ZHANG , Wangqiang HE , Dong CHAI , Hong WANG
IPC分类号： G06T7/00 , G06T7/90 , G06V10/44 , G06V10/764 , G06V10/776
CPC分类号： G06T7/0002 , G06T7/90 , G06V10/44 , G06V10/764 , G06V10/776 , G06T2200/24 , G06T2207/10024 , G06T2207/20081 , G06T2207/20092
摘要： Provided is a method and device for detecting defect, a computer readable storage medium and an electronic device, the method including: acquiring (S310) a detection task, and acquiring various types of images corresponding to the detection task; acquiring (S320) defect detection models trained by a same initial model corresponding to the types of the images respectively; and obtaining (S330) defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.
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公开(公告)号：US20230030296A1
公开(公告)日：2023-02-02
申请号：US17429013
申请日：2020-10-30
发明人： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Wangqiang HE , Dong CHAI , Hong WANG
摘要： The present disclosure relates to a task processing method and device based on defect detection, a computer readable storage medium, and a task processing apparatus . The method includes receiving a detection task; determining a task type of the detection task; storing the detection task in a task queue if the task type is a target task type; and executing the detection task in a preset order and generating a feedback signal when a processor is idle. The detection task of the target task type includes an inference task and a training task. Executing the training task includes modifying configuration information according to a preset rule based on product information in the detection task; acquiring training data and an initial model according to the product information; and using the training data to train the initial model according to the configuration information to obtain a target model and store it in memory.
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公开(公告)号：US20240303798A1
公开(公告)日：2024-09-12
申请号：US18263230
申请日：2021-11-30
发明人： Chao JI , Yaoping WANG , Hongxiang SHEN , Ge OU , Boran JIANG , Shuqi WEI , Chuqian ZHONG , Pengfei ZHANG
IPC分类号： G06T7/00
CPC分类号： G06T7/0004 , G06T2207/20021 , G06T2207/20081 , G06T2207/20084 , G06T2207/30121
摘要： The present disclosure relates to an image recognition method and system for a display panel, a training method, and an electronic device and a non-volatile computer-readable storage medium. The image recognition method includes: acquiring an image of a display panel, wherein the image includes gate lines extending in a first direction and data lines extending in a second direction, the gate lines and the data lines intersecting to define a plurality of sub-pixel regions, and the image further includes a defect pattern; and recognizing the defect pattern in the image by using an image recognition model to obtain defect information, wherein the defect information includes at least one of a defect type or a defect position of the defect pattern, the image recognition model comprises a first attention model configured to learn a weight proportion of a feature of the defect pattern in the image.
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公开(公告)号：US20230153974A1
公开(公告)日：2023-05-18
申请号：US17043960
申请日：2019-12-20
发明人： Zhaoyue LI , Dong CHAI , Yaoping WANG , Meijuan ZHANG , Hong WANG
IPC分类号： G06T7/00 , G05B19/418
CPC分类号： G06T7/0004 , G05B19/41875 , G06T2207/20084 , G06T2207/30148 , G06T2207/20081 , G05B2219/32368
摘要： A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
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6.发明公开公开(公告)号：US20230142383A1
公开(公告)日：2023-05-11
申请号：US17044160
申请日：2019-12-20
发明人： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Dong CHAI , Hong WANG
IPC分类号： G01N21/88 , G06Q10/0639
CPC分类号： G01N21/8851 , G06Q10/06395 , G01N2021/8887
摘要： A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
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7.发明公开公开(公告)号：US20240304034A1
公开(公告)日：2024-09-12
申请号：US18666299
申请日：2024-05-16
发明人： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Dong CHAI , Hong WANG
IPC分类号： G07C3/14 , B29C45/76 , G01N21/88 , G06F11/36 , G06F18/2451 , G06Q10/0639 , G06T7/00 , H01L21/67
CPC分类号： G07C3/14 , B29C45/76 , G01N21/8851 , G06F11/3688 , G06F18/2451 , G06Q10/06395 , G06T7/001 , H01L21/67288 , G01N2021/8887
摘要： A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
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