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    SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION
    2.
    发明申请
    SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION 有权

    公开(公告)号：US20220302877A1

    公开(公告)日：2022-09-22

    申请号：US17836944

    申请日：2022-06-09

    申请人： CubicPV Inc.

    发明人： Michael D. Irwin ,  Jerome Lovelace ,  Kamil Mielczarek

    IPC分类号： H02S99/00 ,  H02S50/15 ,  H02S50/10

    摘要： The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

    System and method for testing photosensitive device degradation
    3.
    发明授权
    System and method for testing photosensitive device degradation 有权

    公开(公告)号：US11387779B2

    公开(公告)日：2022-07-12

    申请号：US17063157

    申请日：2020-10-05

    申请人： CubicPV Inc.

    发明人： Michael D. Irwin ,  Jerome Lovelace ,  Kamil Mielczarek

    IPC分类号： H02S99/00 ,  H02S50/15 ,  H02S50/10

    摘要： The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

    Mixed Cation Perovskite Material Devices
    5.
    发明申请
    Mixed Cation Perovskite Material Devices 有权

    公开(公告)号：US20220033658A1

    公开(公告)日：2022-02-03

    申请号：US17506194

    申请日：2021-10-20

    申请人： CubicPV Inc.

    发明人： Michael D. Irwin ,  Jerred A. Chute ,  Vivek V. Dhas ,  Kamil Mielczarek

    IPC分类号： C09D1/00 ,  H01L51/42 ,  C09D7/63 ,  H01L31/032 ,  H01G9/20 ,  C09D11/02 ,  H01L51/00 ,  H01L51/44 ,  H01G9/00 ,  C09D7/20 ,  C09D11/36

    摘要： Photovoltaic devices such as solar cells, hybrid solar cell-batteries, and other such devices may include an active layer disposed between two electrodes. The active layer may have perovskite material and other material such as mesoporous material, interfacial layers, thin-coat interfacial layers, and combinations thereof. The perovskite material may be photoactive. The perovskite material may be disposed between two or more other materials in the photovoltaic device. Inclusion of these materials in various arrangements within an active layer of a photovoltaic device may improve device performance. Other materials may be included to further improve device performance, such as, for example: additional perovskites, and additional interfacial layers.

    System and method for testing photosensitive device degradation
    8.
    发明授权
    System and method for testing photosensitive device degradation 有权

    公开(公告)号：US11863122B2

    公开(公告)日：2024-01-02

    申请号：US17836944

    申请日：2022-06-09

    申请人： CubicPV Inc.

    发明人： Michael D. Irwin ,  Jerome Lovelace ,  Kamil Mielczarek

    IPC分类号： H02S99/00 ,  H02S50/15 ,  H02S50/10

    CPC分类号： H02S99/00 ,  H02S50/10 ,  H02S50/15

    摘要： The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

    Hybrid perovskite material processing
    9.
    发明授权
    Hybrid perovskite material processing 有权

    公开(公告)号：US11300870B2

    公开(公告)日：2022-04-12

    申请号：US16859545

    申请日：2020-04-27

    申请人： CUBICPV INC.

    发明人： Michael D. Irwin ,  Kamil Mielczarek ,  Vivek V. Dhas

    IPC分类号： B05D1/38 ,  G03C8/36 ,  H01L51/00 ,  C01G21/16 ,  C01D3/12 ,  C07C19/00 ,  B05D3/10 ,  H01L51/42 ,  C09D11/52 ,  H01G9/20 ,  C07C233/03 ,  C07C317/04 ,  G03C1/035

    摘要： A method for preparing photoactive perovskite materials. The method comprises the steps of: introducing a lead halide and a first solvent to a first vessel and contacting the lead halide with the first solvent to dissolve the lead halide to form a lead halide solution, introducing a Group 1 metal halide a second solvent into a second vessel and contacting the Group 1 metal halide with the second solvent to dissolve the Group 1 metal halide to form a Group 1 metal halide solution, and contacting the lead halide solution with the Group 1 metal halide solution to form a thin-film precursor ink. The method further comprises depositing the thin-film precursor ink onto a substrate, drying the thin-film precursor ink to form a thin film, annealing the thin film; and rinsing the thin film with a salt solution.