摘要:
A method for testing decoding circuits in a memory including a matrix of storage cells includes writing the same first word in all the storage cells, and then writing second words in the matrix such that each row and each column has at least one stored second word. The second words are different from the first words. If several second words are written in the same row or in the same column, then the second words are different from one another. Reading all the words in the memory permits verification of the integrity of the decoding circuits, and reduces the testing time of the memory.
摘要:
A method is provided for decoding an encoded binary data signal and generating a clock signal that is synchronous with the encoded data signal. There is generated, from the encoded data signal, an edge detection signal comprising four pulses per binary state of the encoded data signal. The encoded data signal is sampled every four pulses of the edge detection signal so as to obtain a binary signal of decoded data, and from the edge detection signal there is generated a binary clock signal that is synchronous with the encoded data signal and changes logic state every two pulses of the edge detection signal.
摘要:
A method is provided for erasing or programming at least one memory cell of a non-volatile memory. According to the method, a state fixation pulse is applied to a floating gate transistor of the memory cell. The state fixation pulse also includes, successively, a portion at a reference voltage, and a state fixation portion at a voltage with sufficient amplitude for the transfer of electrons between the drain and the gate of the floating gate transistor. Additionally, an external adjustment signal is applied to the memory to adjust the state fixation portion to a predetermined duration, and the state fixation portion is adjusted to the predetermined duration in real time as a function of the state of the adjustment signal. Also provided is a non-volatile memory.
摘要:
A circuit produces a voltage for the erasure or programming of a memory cell. The circuit includes a capacitor, and a discharge circuit connected to a first terminal of the capacitor. The discharge circuit includes a first transistor, a drain of which is connected to the first terminal of the capacitor. The first transistor activates the discharge circuit when a discharge signal is received by a gate of the first transistor. The discharge circuit includes a slow discharge arm and a fast discharge arm parallel-connected to the source of the first transistor. The discharge circuit produces a low discharge current or a high discharge current for discharging the capacitor as a function of an operating mode selection signal.
摘要:
A column register of an integrated circuit memory, notably in EEPROM technology, is utilized in a method of writing a data word of 2p bits in the memory, where p is a non-zero whole number. The method includes the following steps: 1) erasing all the cells of the word; 2) loading 2q data in 2q high-voltage latches (HV1, HV3, HV5, HV7), and loading 2p−2q other data in the 2p−2q low-voltage latches (LV0, LV2, LV4, LV6); and 3) programming 2q cells of the memory (M0, M2, M4, M6) as a function of the data memorized in the 2q high-voltage latches; as well as repeating 2p−q−1 times the following steps: 4) loading, in the 2q high-voltage latches, of 2q other data that were loaded in the 2q low-voltage latches at step 2); and 5) programming 2q other cells of the memory (M1, M3, M5, M7) as a function of the data memorized in the 2q high-voltage latches.
摘要:
In a EEPROM memory architecture organized into word columns that includes n memory cells per word column, there is, for each word of the column, one diffusion line to connect sources of the memory cells to a ground connection transistor using a source line. A word read access includes simultaneously selecting the word accessed in a read mode in a first group of memory cells, and an additional word in the second group of memory cells. Each column has n bit lines ranked 0 to n−1, each connected to the same ranked cells in the first group of memory cells. The connection of each of the n cells ranked 0 to n−1 in the second group of memory cells to one of the n bit lines of the column are such that a length of connection between a source of a memory cell connected to an i ranked bit line in the second group of memory cells to a respective second diffusion connection corresponds to a length of connection between a source of a memory cell connected to an (n−1)-i ranked bit line in the first group of memory cells to a respective first diffusion connection.
摘要:
A device and method for the reading of cells of an EEPROM is provided. The device includes at least one reference cell and one circuit for comparison between a current flowing into the reference cell and a current flowing in a cell selected in read mode. The reference cell is in a programmed state. The programming of the reference cell is done after the control reading and during the integrated circuit power-on reset phase, activated by the powering on of the integrated circuit.
摘要:
A non-volatile electrically erasable and programmable memory provides both a SDP (software data protection) function and an OTP (one-time protection) function. The memory comprises a memory array having a plurality of memory cells each for storing an information bit. The memory further comprises at least one supplementary cell for storing a first state bit pertaining to the write-accessible (or non-write accessible) state of all the memory cells of the memory array, and at least one other supplementary cell for storing a second state bit relating to the blank state (or non-blank state) of a group of memory cells designed to be programmed only once by the user. A common management circuit for the SDP and OTP cells is located outside the memory array.
摘要:
A passive contactless integrated circuit includes an electrically programmable non-volatile data memory (MEM), a charge accumulation booster circuit for supplying a high voltage necessary for writing data in the memory. The integrated circuit includes a volatile memory point for memorizing an indicator flag, and circuitry for modifying the value of the indicator flag when the high voltage reaches a critical threshold for the first time after activating the booster circuit.
摘要:
A binary frequency divider includes a counter paced by an input signal, means for comparing a counting value with first and second threshold values and supplying first and second control signals synchronized with variation edges of a first type of the input signal. The divider includes means for supplying at least one third control signal shifted by a half-period of the input signal in relation to one of the first or second control signals, and control means for generating the output signal using control signals chosen according to the value of at least one least significant bit of the division setpoint. Application is mainly but not exclusively to UHF transponders.