Combined thermal analyzer and x-ray diffractometer
    2.
    发明授权
    Combined thermal analyzer and x-ray diffractometer 失效
    组合热分析仪和X射线衍射仪

    公开(公告)号:US4821303A

    公开(公告)日:1989-04-11

    申请号:US105769

    申请日:1987-10-06

    CPC分类号: G01N23/207 G01N25/4866

    摘要: Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20.degree. (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.

    摘要翻译: 描述了用于同时观察材料的结构和热力学性质的科学仪器和方法。 X射线衍射仪和热分析仪,并安装在相同样品上进行配合并合作,并在几分钟内完成有意义的分析。 衍射仪配备有一个连接到多通道分析仪的快速位置敏感检测器,用于在20°(2θ)或更大的角度上记录和显示样品的X射线衍射数据。 热分析仪优选为差示扫描量热计。 通过将样品通过一定温度和/或环境的同时获取的X射线衍射和热数据相关联,可以识别和阐明与热事件相对应的结构变化。