-
1.
公开(公告)号:US20080202588A1
公开(公告)日:2008-08-28
申请号:US11678623
申请日:2007-02-26
申请人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
IPC分类号: F17D3/00
CPC分类号: C23C16/52 , C23C16/4412 , C23C16/455 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/0318 , Y10T137/0324 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
摘要翻译: 提供了一种用于将气体输送到半导体处理系统的方法和装置。 在一个实施例中,用于将气体输送到半导体处理系统的装置包括具有入口和出口的多个气体输入和输出管线。 连接线耦合各对气体输入和气体输出线。 连接阀布置成控制通过相应连接线的流动。 质量气体流量控制器布置成控制流入相应入口的流量。 在另一个实施例中,一种方法包括提供具有至少多个入口的歧管,歧管可以选择性地联接到多个出口中的至少一个出口,使一个或多个气体通过歧管流过真空环境,旁通处理室 在处理之前或校准电路,并且在衬底处理期间使一种或多种气体流入处理室。
-
2.
公开(公告)号:US07775236B2
公开(公告)日:2010-08-17
申请号:US11678622
申请日:2007-02-26
申请人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
IPC分类号: F16K11/24
CPC分类号: H01J37/3244 , H01J37/32449 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/7761 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
摘要翻译: 提供了一种用于将气体输送到半导体处理系统的方法和装置。 在一个实施例中,用于将气体输送到半导体处理系统的装置包括具有入口和出口的多个气体输入和输出线。 连接线耦合各对气体输入和气体输出线。 连接阀布置成控制通过相应连接线的流动。 质量气体流量控制器布置成控制流入相应入口的流量。 在另一个实施例中,一种方法包括提供具有至少多个入口的歧管,歧管可以选择性地联接到多个出口中的至少一个,将一个或多个气体通过歧管流动到真空环境,旁路处理室 在处理之前或校准电路,并且在衬底处理期间使一种或多种气体流入处理室。
-
公开(公告)号:US07846497B2
公开(公告)日:2010-12-07
申请号:US11678623
申请日:2007-02-26
申请人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
CPC分类号: C23C16/52 , C23C16/4412 , C23C16/455 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/0318 , Y10T137/0324 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
-
公开(公告)号:US20080202610A1
公开(公告)日:2008-08-28
申请号:US11678622
申请日:2007-02-26
申请人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
IPC分类号: F16K21/00
CPC分类号: H01J37/3244 , H01J37/32449 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/7761 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
-
5.
公开(公告)号:US08074677B2
公开(公告)日:2011-12-13
申请号:US11678621
申请日:2007-02-26
申请人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: Ezra Robert Gold , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
CPC分类号: H01J37/32449 , H01J37/3244 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/7761 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
摘要翻译: 提供了一种用于将气体输送到半导体处理系统的方法和装置。 在一个实施例中,用于将气体输送到半导体处理系统的装置包括具有入口和出口的多个气体输入和输出线。 连接线耦合各对气体输入和气体输出线。 连接阀布置成控制通过相应连接线的流动。 质量气体流量控制器布置成控制流入相应入口的流量。 在另一个实施例中,一种方法包括提供具有至少多个入口的歧管,歧管可以选择性地联接到多个出口中的至少一个,将一个或多个气体通过歧管流动到真空环境,旁路处理室 在处理之前或校准电路,并且在衬底处理期间使一种或多种气体流入处理室。
-
公开(公告)号:US20080202609A1
公开(公告)日:2008-08-28
申请号:US11678621
申请日:2007-02-26
申请人: EZRA ROBERT GOLD , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
发明人: EZRA ROBERT GOLD , Richard Charles Fovell , James Patrick Cruse , Jared Ahmad Lee , Bruno Geoffrion , Douglas Arthur Buchberger , Martin J. Salinas
IPC分类号: F16K11/00
CPC分类号: H01J37/32449 , H01J37/3244 , H01L21/67098 , H01L21/67103 , H01L21/67109 , H01L21/67115 , Y10T137/7761 , Y10T137/87249
摘要: A method and apparatus for delivering gases to a semiconductor processing system are provided. In one embodiment, an apparatus for delivering gases to a semiconductor processing system includes a plurality of gas input and output lines having inlet and outlet ports. Connecting lines couple respective pairs of the gas input and gas output lines. Connecting valves are arranged to control flow through the respective connecting lines. Mass gas flow controllers are arranged to control flow into respective inlet ports. In another embodiment, a method includes providing a manifold having at least a plurality of inlet that may be selectively coupled to at least one of a plurality of outlets, flowing one or more gases through the manifold to a vacuum environment by-passing the processing chamber prior to processing or to a calibration circuit, and flowing the one or more gases into the processing chamber during substrate processing.
-
公开(公告)号:US07975558B2
公开(公告)日:2011-07-12
申请号:US12823935
申请日:2010-06-25
申请人: Jared Ahmad Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
发明人: Jared Ahmad Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
CPC分类号: G01F25/0053 , G01F25/0038 , Y10T137/0368 , Y10T137/7761
摘要: A method and apparatus for measuring gas flow are provided. In one embodiment, a calibration circuit for gas control may be utilized to verify and/or calibrate gas flows utilized for backside cooling, process gas delivery, purge gas delivery, cleaning agent delivery, carrier gases delivery and remediation gas delivery, among others.
摘要翻译: 提供了一种测量气体流量的方法和装置。 在一个实施例中,用于气体控制的校准电路可用于验证和/或校准用于后侧冷却,处理气体输送,吹扫气体输送,清洁剂输送,载气输送和修复气体输送等的气体流。
-
公开(公告)号:US20100251828A1
公开(公告)日:2010-10-07
申请号:US12823935
申请日:2010-06-25
申请人: Jared Ahmad Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
发明人: Jared Ahmad Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
IPC分类号: G01F1/56
CPC分类号: G01F25/0053 , G01F25/0038 , Y10T137/0368 , Y10T137/7761
摘要: A method and apparatus for measuring gas flow are provided. In one embodiment, a calibration circuit for gas control may be utilized to verify and/or calibrate gas flows utilized for backside cooling, process gas delivery, purge gas delivery, cleaning agent delivery, carrier gases delivery and remediation gas delivery, among others.
摘要翻译: 提供了一种测量气体流量的方法和装置。 在一个实施例中,用于气体控制的校准电路可用于验证和/或校准用于后侧冷却,处理气体输送,吹扫气体输送,清洁剂输送,载气输送和修复气体输送等的气体流。
-
公开(公告)号:US07743670B2
公开(公告)日:2010-06-29
申请号:US11833623
申请日:2007-08-03
申请人: Jared Ahmed Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
发明人: Jared Ahmed Lee , Ezra Robert Gold , Chunlei Zhang , James Patrick Cruse , Richard Charles Fovell
CPC分类号: G01F25/0053 , G01F25/0038 , Y10T137/0368 , Y10T137/7761
摘要: A method and apparatus for measuring gas flow are provided. In one embodiment, a calibration circuit for gas control may be utilized to verify and/or calibrate gas flows utilized for backside cooling, process gas delivery, purge gas delivery, cleaning agent delivery, carrier gases delivery and remediation gas delivery, among others.
摘要翻译: 提供了一种测量气体流量的方法和装置。 在一个实施例中,用于气体控制的校准电路可用于验证和/或校准用于后侧冷却,处理气体输送,吹扫气体输送,清洁剂输送,载气输送和修复气体输送等的气体流。
-
-
-
-
-
-
-
-