High resolution recording medium and method for producing same
    1.
    发明授权
    High resolution recording medium and method for producing same 失效
    高分辨率记录介质及其制造方法

    公开(公告)号:US4522862A

    公开(公告)日:1985-06-11

    申请号:US445557

    申请日:1982-11-30

    摘要: A recording medium with a multicolor high resolution pattern created by layer packs. Pattern-forming layers of the layer packs are successively applied by photolithographic means in a sequence corresponding to a color of the high resolution pattern. The pattern-forming layers of the layer packs are separate from one another on the substrate of the recording medium.The process for producing the recording medium includes applying a photoresist layer to a substrate and developing the photoresist. Pattern-forming layers are successively applied over the whole surface of the substrate in a sequence corresponding to a color. The remaining photoresist and the layers overlying it are removed to leave a sequence of pattern-forming layers on the substrate separate from any adjacent pattern-forming layers.

    摘要翻译: 具有由层包制成的多色高分辨率图案的记录介质。 通过光刻装置以对应于高分辨率图案的颜色的顺序连续施加层包装图案形成层。 层包装的图案形成层在记录介质的基板上彼此分离。 制造记录介质的方法包括将光致抗蚀剂层施加到基底上并显影光致抗蚀剂。 图案形成层以对应于颜色的顺序依次施加在基板的整个表面上。 去除剩余的光致抗蚀剂和覆盖在其上的层,以在衬底上分离出与任何相邻图案形成层分离的一系列图案形成层。

    Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the method
    2.
    发明授权
    Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the method 失效
    用于制造自支撑电子 - 光学透明结构的方法,以及根据该方法制造的结构

    公开(公告)号:US06800404B2

    公开(公告)日:2004-10-05

    申请号:US10209186

    申请日:2002-07-31

    IPC分类号: G03F116

    CPC分类号: G03F1/20 H01J2237/31794

    摘要: A method for producing a self-supporting electron-optical transparent structure that includes multi-layer strips and recesses located between the multi-layer strips. The method includes applying a first layer to a second layer, presetting a pattern by exposing or irradiating the first layer and etching the pattern out of the first layer so that partial areas of the second layer are uncovered. The method further includes galvanically applying layers to the uncovered partial areas of the second layer so that multi-layer strips are formed thereon and an electron-optical transparent structure is formed and removing the electron-optical transparent structure off the second layer.

    摘要翻译: 一种用于制造自支撑电子 - 光学透明结构的方法,其包括位于多层条之间的多层条带和凹陷。 该方法包括将第一层施加到第二层,通过曝光或照射第一层来预先设置图案,并将图案从第一层蚀刻出来,使第二层的部分区域不被覆盖。 该方法还包括将层电镀到第二层的未覆盖部分区域,以便在其上形成多层条带并形成电子 - 光学透明结构,并从第二层除去电子 - 光学透明结构。

    Evaporator device for the evaporation of several materials
    3.
    发明授权
    Evaporator device for the evaporation of several materials 失效
    蒸发器用于蒸发几种材料

    公开(公告)号:US4632059A

    公开(公告)日:1986-12-30

    申请号:US773517

    申请日:1985-09-05

    摘要: An evaporator device system having an electron jet heating device for the vaporization of several materials onto a substrate in a vacuum chamber includes at least two crucibles for the reception of respective evaporation materials. These crucibles are concentrically arranged on a turntable. For the more uniform evaporation of the material, at least the crucible aligned with the electron jet is caused to rotate in the turntable during operation of the eletron jet heating device.

    摘要翻译: 具有用于在真空室中将几种材料蒸发到基板上的电子射流加热装置的蒸发器装置系统包括用于接收各蒸发材料的至少两个坩埚。 这些坩埚同心地布置在转台上。 为了使材料更均匀地蒸发,在电子射流加热装置的操作期间,至少使与电子射流对准的坩埚在转盘中旋转。

    Method for manufacturing a scale, a scale manufactured according to the method and a position measuring device
    5.
    发明授权
    Method for manufacturing a scale, a scale manufactured according to the method and a position measuring device 有权
    制造鳞片的方法,根据该方法制造的鳞片和位置测量装置

    公开(公告)号:US07312878B2

    公开(公告)日:2007-12-25

    申请号:US10491931

    申请日:2002-09-24

    IPC分类号: G02B5/18 G01B11/14

    CPC分类号: G02B5/1861

    摘要: In a method for producing a scale in the form of a phase grating, the scale itself, and a position measuring device including the scale, the scale includes two reflection layers located at a distance from one another on either side of a spacer layer. The production of the scale includes the following steps: provision of a first reflection layer, which is unbroken over its entire surface and fulfils the relationship A=R/η≧3, where R represents the degree of reflection and η represents the backscatter coefficient for electrons; application of the spacer layer to the first reflection layer; application of the second reflection layer to the spacer layer; and structuring of the second reflection layer by an electron beam lithography process.

    摘要翻译: 在用于制造相位光栅,刻度尺本身和包括刻度的位置测量装置形式的刻度的方法中,刻度尺包括两个位于间隔层两侧彼此间隔一定距离的反射层。 规模的生产包括以下步骤:提供在其整个表面上不间断的第一反射层,并实现关系A = R / eta> = 3,其中R表示反射度,η表示反向散射系数 对于电子; 间隔层施加到第一反射层; 将第二反射层施加到间隔层上; 以及通过电子束光刻工艺构造第二反射层。

    Method for producing a scale scale produced according to said method and position measuring device
    6.
    发明申请
    Method for producing a scale scale produced according to said method and position measuring device 有权
    根据所述方法和位置测量装置生产的刻度尺的制造方法

    公开(公告)号:US20050052743A1

    公开(公告)日:2005-03-10

    申请号:US10491931

    申请日:2002-09-24

    IPC分类号: G02B5/18

    CPC分类号: G02B5/1861

    摘要: In a method for producing a scale in the form of a phase grating, the scale itself, and a position measuring device including the scale, the scale includes two reflection layers located at a distance from one another on either side of a spacer layer. The production of the scale includes the following steps: provision of a first reflection layer, which is unbroken over its entire surface and fulfils the relationship A=R/η≧3, where R represents the degree of reflection and η represents the backscatter coefficient for electrons; application of the spacer layer to the first reflection layer; application of the second reflection layer to the spacer layer; and structuring of the second reflection layer by an electron beam lithography process.

    摘要翻译: 在用于制造相位光栅,刻度尺本身和包括刻度的位置测量装置形式的刻度的方法中,刻度尺包括两个位于间隔层两侧彼此间隔一定距离的反射层。 规模的生产包括以下步骤:提供在其整个表面上不间断的第一反射层,并实现关系A = R / eta> = 3,其中R表示反射度,η表示反向散射系数 对于电子; 间隔层施加到第一反射层; 将第二反射层施加到间隔层上; 以及通过电子束光刻工艺构造第二反射层。

    High resolution recording medium
    7.
    发明授权
    High resolution recording medium 失效
    高分辨率记录介质

    公开(公告)号:US4431695A

    公开(公告)日:1984-02-14

    申请号:US230280

    申请日:1981-01-30

    申请人: Georg Flatscher

    发明人: Georg Flatscher

    摘要: A multi-color, high density recording medium including a substrate having at least two patterned interference filters formed thereon is described. Each of the filters transmits a different wavelength range of visible light and each of the filters comprises an unpatterned interference layer of an inorganic material which is substantially absorption-free in the visible wavelength range of the spectrum. At least one of the interference filters formed on the substrate comprises a first, unpatterned reflecting layer positioned on one side of the respective interference layer, and a second, patterned reflecting layer positioned on the other side of the respective interference layer, such that the pattern of only the first reflecting layer forms the pattern of the at least one interference filter.

    摘要翻译: 描述了包括其上形成有至少两个图案化的干涉滤光器的基板的多色高密度记录介质。 每个滤光器透射不同的可见光的波长范围,并且每个滤光器包括在光谱的可见光波长范围内基本上无吸收的无机材料的未图案的干涉层。 形成在基板上的至少一个干涉滤光器包括位于相应干涉层的一侧上的第一未图案化反射层和位于相应干涉层另一侧上的第二图案化反射层,使得图案 只有第一反射层形成至少一个干涉滤光器的图案。

    Reflective measuring scale graduation and method for its manufacture
    8.
    发明授权
    Reflective measuring scale graduation and method for its manufacture 失效
    反射式测量刻度及其制造方法

    公开(公告)号:US06671092B2

    公开(公告)日:2003-12-30

    申请号:US09801449

    申请日:2001-03-08

    申请人: Georg Flatscher

    发明人: Georg Flatscher

    IPC分类号: G02B500

    CPC分类号: G02B5/08 G01D5/34707

    摘要: A reflective measuring scale graduation, as well as a method for manufacturing the same are described. The reflective measuring scale graduation includes first and second subdivisions having different reflection properties, which extend in at least one first direction on a reflecting substrate. The highly reflecting first subdivisions are made of a plurality of partial layers having different indices of refraction and function as an interference filter. The low reflecting second subdivisions are composed of at least one absorber layer on the substrate.

    摘要翻译: 描述了反射测量刻度,以及其制造方法。 反射测量刻度包括具有不同反射特性的第一和第二细分,其在反射基底上沿至少一个第一方向延伸。 高度反射的第一细分由具有不同折射率的多个部分层制成并且用作干涉滤光器。 低反射的第二细分由衬底上的至少一个吸收层组成。

    Photoelectric position measuring device
    9.
    发明授权
    Photoelectric position measuring device 失效
    光电位置测量装置

    公开(公告)号:US06445456B2

    公开(公告)日:2002-09-03

    申请号:US08991140

    申请日:1997-12-16

    IPC分类号: G01B902

    CPC分类号: G02B5/1871 G01D5/38

    摘要: In a position measuring device, a scale is embodied as a phase grating on which several partial beams impinge and are diffracted and caused to interfere with each other in the scanning unit. The entry angle (&agr;) of the partial beams corresponds to the Littrow angle, so that the diffracted partial beams of ±1st diffraction order are diffracted at the same angle &bgr;=&agr;. The diffraction efficiency of the scale is particularly great if the flanks of the bars of the scales are at an angle of approximately 70° with respect to the measuring direction, i.e., if the bars and gaps are embodied to be trapezoidal in cross section.

    摘要翻译: 在位置测量装置中,标尺被实施为相位光栅,其中多个部分光束在其上被照射并被衍射并且在扫描单元中彼此干涉。 部分光束的入射角(α)对应于Littrow角,使得±1衍射级的衍射部分光束以相同的角β=α衍射。 如果鳞片的条的侧面相对于测量方向处于大约70°的角度,即如果条和间隙被实施为横截面为梯形,则标尺的衍射效率特别大。

    Scale and method for making a scale
    10.
    发明授权
    Scale and method for making a scale 失效
    规模和制作尺度的方法

    公开(公告)号:US5880882A

    公开(公告)日:1999-03-09

    申请号:US764984

    申请日:1996-12-13

    CPC分类号: G01D5/38 G01D5/34707

    摘要: A scale for opto-electrical linear or angular measuring systems. A gradation in the form of a phase grating is embodied on the scale and has alternating raised and stepped areas. A continuous compensating layer of chrome and on it a continuous highly reflective layer of titanium nitride are applied to one side of a step-like structured base body. The material and the layer thickness of the compensating layer is selected in such a way that it counteracts the mechanical stresses of the reflecting surface layer and thus, in the finished state of the scale, the deposited layers no longer exert stresses on the base body.

    摘要翻译: 光电直线或角度测量系统的尺度。 相位光栅形式的渐变以规模体现,具有交替的凸起和阶梯区域。 连续补偿铬层,并在其上连续高反射层的氮化钛被施加到阶梯状结构化基体的一侧。 选择补偿层的材料和层厚度使得其抵消反射表面层的机械应力,因此,在标尺的最终状态下,沉积层不再对基体施加应力。