Method of manufacturing organic semiconductor film

    公开(公告)号:US10468597B2

    公开(公告)日:2019-11-05

    申请号:US16041766

    申请日:2018-07-21

    Abstract: A method of manufacturing an organic semiconductor film, including a step of moving a coating blade surface positioned to face a substrate surface in a first direction parallel to the substrate surface, while in contact with an organic semiconductor solution supplied to a portion between the blade surface and the substrate surface to form the organic semiconductor film in the first direction. The coating blade is disposed to have first and second gaps having different separation gap sizes with the substrate surface in a region where the blade surface and the organic semiconductor solution are in contact. The first gap is positioned on an upstream side of the first direction and the second gap, which is smaller than the first gap, is provided on a downstream side. A second gap size is a minimum distance between the substrate surface and the blade surface and is 40 μm or less.

    FLEXIBLE ORGANIC ELECTRONIC DEVICE
    3.
    发明申请
    FLEXIBLE ORGANIC ELECTRONIC DEVICE 审中-公开
    柔性有机电子器件

    公开(公告)号:US20140174528A1

    公开(公告)日:2014-06-26

    申请号:US14192157

    申请日:2014-02-27

    Abstract: An organic electronic device includes at least an organic-inorganic layered barrier layer, a plastic support, a transparent electrode layer, an organic active layer, a metal electrode layer and an upper sealing member, and contains a strong acid polymer, wherein an n-type oxide semiconductor layer is provided adjacent to the metal electrode layer on the plastic support-side of the metal electrode layer.

    Abstract translation: 有机电子器件至少包括有机无机层状阻挡层,塑料载体,透明电极层,有机活性层,金属电极层和上密封构件,并且含有强酸性聚合物,其中, 在金属电极层的塑料支撑侧上与金属电极层相邻设置有氧化物半导体层。

    Organic thin film transistor and method for manufacturing organic thin film transistor

    公开(公告)号:US10699907B2

    公开(公告)日:2020-06-30

    申请号:US15909746

    申请日:2018-03-01

    Inventor: Yoshiki Maehara

    Abstract: An organic thin film transistor comprises a base material, a gate electrode, a gate insulating layer, an organic semiconductor layer, a source electrode, and a drain electrode, and further comprises charge injection layers which are provided between the source electrode and a base material side layer of the source electrode and between the drain electrode and a base material side layer of the drain electrode and have a thickness that decreases in a direction opposite to a direction in which the source electrode and the drain electrode face each other on a side of the source electrode facing the drain electrode and a side of the drain electrode facing the source electrode, and is manufactured by scanning a metal layer with a laser so as to form the source electrode and the drain electrode, and dropwise-adding a solution which becomes the charge injection layers to a laser-scanned portion.

    Method of manufacturing film using alignment material

    公开(公告)号:US10608119B2

    公开(公告)日:2020-03-31

    申请号:US16114610

    申请日:2018-08-28

    Abstract: Provided is a method of manufacturing a film, including: a manufacturing step of forming a film by performing movement, in a state in which a blade surface of a coating blade disposed to be spaced so as to face a substrate surface of a substrate is in contact with a solution for forming a film which is provided between the blade surface and the substrate surface, in a first direction in a plane parallel to the substrate surface, in which the solution is stored in a liquid reservoir between the blade surface and the substrate surface, and at least a portion of an outer peripheral end portion of the coating blade which is in contact with the solution is tilted with respect to the first direction in a plane parallel to the substrate surface. Accordingly, a method of manufacturing a film for forming a high quality film with high productivity is provided.

    Transistor and manufacturing method of transistor

    公开(公告)号:US10249733B2

    公开(公告)日:2019-04-02

    申请号:US15709577

    申请日:2017-09-20

    Inventor: Yoshiki Maehara

    Abstract: Provided are an air up type transistor which has high electrical connection reliability and high productivity, and is capable of exhibiting good transistor characteristics while achieving microfabrication, and a manufacturing method of a transistor. A semiconductor layer is formed on an upper surface of a support precursor layer which becomes a semiconductor layer support and then a part of the semiconductor layer is removed to form one or more opening portions from which the support precursor layer is exposed. Two etching protective layers are formed on the semiconductor layer such that the two etching protective layers are separated from each other and at least a part of the opening portion is positioned in a region between the two etching protective layers. A part of the support precursor layer is removed by bringing an etchant into contact with the support precursor layer through the plurality of opening portions, thereby forming a space at a position corresponding to a region between the two etching protective layers so as to form two semiconductor layer supports that are arranged with the space interposed therebetween.

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