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公开(公告)号：US07954021B2
公开(公告)日：2011-05-31
申请号：US12604614
申请日：2009-10-23
IPC分类号： G11C29/00
CPC分类号： G06F11/2094 , G06F11/073 , G06F11/076 , G06F11/1048 , G06F11/1662
摘要： A method for flash sparing on a solid state drive (SSD) includes detecting a failure from a primary memory device; determining if a failure threshold for the primary memory device has been reached; and, in the event the failure threshold for the primary memory device has been reached: quiescing the SSD; and updating an entry in a sparing map table to replace the primary memory device with a spare memory device.
摘要翻译： 用于在固态驱动器（SSD）上闪存保存的方法包括从主存储器件检测故障; 确定是否已经达到主存储器件的故障阈值; 并且在主存储器件的故障阈值已达到的情况下：静止SSD; 以及更新备用映射表中的条目以用备用存储器设备替换主存储器设备。
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公开(公告)号：US20110099419A1
公开(公告)日：2011-04-28
申请号：US12604614
申请日：2009-10-23
CPC分类号： G06F11/2094 , G06F11/073 , G06F11/076 , G06F11/1048 , G06F11/1662
摘要： A method for flash sparing on a solid state drive (SSD) includes detecting a failure from a primary memory device; determining if a failure threshold for the primary memory device has been reached; and, in the event the failure threshold for the primary memory device has been reached: quiescing the SSD; and updating an entry in a sparing map table to replace the primary memory device with a spare memory device.
摘要翻译： 用于在固态驱动器（SSD）上闪存保存的方法包括从主存储器件检测故障; 确定是否已经达到主存储器件的故障阈值; 并且在主存储器件的故障阈值已达到的情况下：静止SSD; 以及更新备用映射表中的条目以用备用存储器设备替换主存储器设备。
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3.发明授权Enabling throttling on average write throughput for solid state storage devices 有权实现固态存储设备的平均写入吞吐量的限制公开(公告)号：US08850153B2
公开(公告)日：2014-09-30
申请号：US13250416
申请日：2011-09-30
申请人： Gary A. Tressler , Andrew D. Walls
发明人： Gary A. Tressler , Andrew D. Walls
CPC分类号： G06F3/0613 , G06F3/0655 , G06F3/0659 , G06F3/0679 , G06F3/0688 , G06F12/0246 , G06F2206/1014
摘要： A mechanism is provided for enabling throttling on average write throughput instead of peak write throughput for solid-state storage devices. The mechanism assures an average write throughput within a range but allows excursions of high throughput with periods of low throughput offsetting against those of heavy usage. The mechanism periodically determines average throughput and determines whether average throughput exceeds a high throughput threshold for a certain amount of time without being offset by periods of low throughput.
摘要翻译： 提供了一种机制，用于实现平均写入吞吐量的节流，而不是固态存储设备的峰值写入吞吐量。 该机制确保了一个范围内的平均写入吞吐量，但允许高吞吐量的偏移量与低吞吐量的周期抵消了大量使用的吞吐量。 该机制周期性地确定平均吞吐量，并确定平均吞吐量是否超过一个高吞吐量阈值达一定时间量，而不会被低吞吐量周期所抵消。
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公开(公告)号：US20130086302A1
公开(公告)日：2013-04-04
申请号：US13250416
申请日：2011-09-30
申请人： Gary A. Tressler , Andrew D. Walls
发明人： Gary A. Tressler , Andrew D. Walls
IPC分类号： G06F12/00
CPC分类号： G06F3/0613 , G06F3/0655 , G06F3/0659 , G06F3/0679 , G06F3/0688 , G06F12/0246 , G06F2206/1014
摘要： A mechanism is provided for enabling throttling on average write throughput instead of peak write throughput for solid-state storage devices. The mechanism assures an average write throughput within a range but allows excursions of high throughput with periods of low throughput offsetting against those of heavy usage. The mechanism periodically determines average throughput and determines whether average throughput exceeds a high throughput threshold for a certain amount of time without being offset by periods of low throughput.
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5.发明授权Flash array built in self test engine with trace array and flash metric reporting 有权闪存阵列内置自检引擎，具有跟踪数组和闪存指标报告公开(公告)号：US08627158B2
公开(公告)日：2014-01-07
申请号：US13314657
申请日：2011-12-08
IPC分类号： G11C29/00
CPC分类号： G06F11/1068 , G11C16/00 , G11C29/16
摘要： A mechanism is provided for a flash array test engine. The flash array test engine includes a circuit. The circuit is configured to generate test workloads in a test mode for testing a flash device array, where each of the test workloads includes specific addresses, data, and command patterns to be sent to the flash device array. The circuit is configured to accelerate wear in the flash device array, via the test workloads, at an accelerated rate relative to general system workloads that are not part of the test mode. The circuit is configured to vary a range of conditions for the flash device array to determine whether each of the conditions passes or fails and to store failure data and corresponding failure data address information for the flash device array.
摘要翻译： 为闪存阵列测试引擎提供了一种机制。 闪存阵列测试引擎包括一个电路。 电路被配置为在测试模式下生成测试工作负载，用于测试闪存器件阵列，其中每个测试工作负载包括要发送到闪存器件阵列的特定地址，数据和命令模式。 该电路被配置为相对于不属于测试模式的一般系统工作负载，以加速的速度通过测试工作负载加速闪存器件阵列中的磨损。 电路被配置为改变闪存器件阵列的条件范围，以确定每个条件是否通过或失败，并存储闪存器件阵列的故障数据和相应的故障数据地址信息。
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公开(公告)号：US08214580B2
公开(公告)日：2012-07-03
申请号：US12604616
申请日：2009-10-23
IPC分类号： G06F12/00
CPC分类号： G06F11/2094 , G06F3/0616 , G06F3/0631 , G06F3/0679 , G06F12/0246 , G06F2212/214 , G06F2212/7204 , G06F2212/7206 , G06F2212/7208
摘要： A method for adjusting a drive life and a capacity of a solid state drive (SSD), the SSD comprising a plurality of memory devices includes determining a desired drive life for the SSD; determining a utilization for the SSD; and allocating a portion of the plurality of memory devices as available memory and a portion of the plurality of memory devices as spare memory based on the desired drive life and the utilization. An SSD with an adjustable drive life and capacity includes a plurality of memory devices; and a memory allocation module configured to: determine a desired drive life for the SSD; determine a utilization for the SSD; and allocate a portion of the plurality of memory devices as available memory and a portion of the plurality of memory devices as spare memory based on the desired drive life and the utilization.
摘要翻译： 一种用于调整固态驱动器（SSD）的驱动寿命和容量的方法，所述SSD包括多个存储器件，包括确定所述SSD的期望驱动寿命; 确定SSD的利用率; 以及基于期望的驱动寿命和利用率，将多个存储器件的一部分分配为可用存储器和多个存储器件的一部分作为备用存储器。 具有可调驱动寿命和容量的SSD包括多个存储器件; 以及存储器分配模块，被配置为：确定所述SSD的期望驱动寿命; 确定SSD的利用率; 并且基于期望的驱动寿命和利用率，将多个存储器件的一部分分配为可用存储器和多个存储器件的一部分作为备用存储器。
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公开(公告)号：US20110099320A1
公开(公告)日：2011-04-28
申请号：US12604616
申请日：2009-10-23
CPC分类号： G06F11/2094 , G06F3/0616 , G06F3/0631 , G06F3/0679 , G06F12/0246 , G06F2212/214 , G06F2212/7204 , G06F2212/7206 , G06F2212/7208
摘要： A method for adjusting a drive life and a capacity of a solid state drive (SSD), the SSD comprising a plurality of memory devices includes determining a desired drive life for the SSD; determining a utilization for the SSD; and allocating a portion of the plurality of memory devices as available memory and a portion of the plurality of memory devices as spare memory based on the desired drive life and the utilization. An SSD with an adjustable drive life and capacity includes a plurality of memory devices; and a memory allocation module configured to: determine a desired drive life for the SSD; determine a utilization for the SSD; and allocate a portion of the plurality of memory devices as available memory and a portion of the plurality of memory devices as spare memory based on the desired drive life and the utilization.
摘要翻译： 一种用于调整固态驱动器（SSD）的驱动寿命和容量的方法，所述SSD包括多个存储器件，包括确定所述SSD的期望驱动寿命; 确定SSD的利用率; 以及基于期望的驱动寿命和利用率，将多个存储器件的一部分分配为可用存储器和多个存储器件的一部分作为备用存储器。 具有可调驱动寿命和容量的SSD包括多个存储器件; 以及存储器分配模块，被配置为：确定所述SSD的期望驱动寿命; 确定SSD的利用率; 并且基于期望的驱动寿命和利用率，将多个存储器件的一部分分配为可用存储器和多个存储器件的一部分作为备用存储器。
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8.发明授权Method and system for implementing a preferred parts plan over a communications network 失效通过通信网络实现优选零件计划的方法和系统公开(公告)号：US06650954B2
公开(公告)日：2003-11-18
申请号：US09892953
申请日：2001-06-27
IPC分类号： G06F1900
CPC分类号： G06Q10/0875 , G06Q10/06
摘要： An exemplary embodiment of the invention relates to a method for facilitating a preferred parts plan for an enterprise over a computer network utilizing a parts review process tool. The method comprises: receiving a bill of material from a client system that includes a non-preferred part; storing the bill of material in a bill of material review database; periodically searching and extracting non-preferred parts records from the bill of material review database; importing the non-preferred parts records into a deviation database; evaluating risk factors associated with non-preferred parts usage; developing an action plan to mitigate risks in using the non-preferred parts; developing a preferred parts strategy for use in minimizing requests to use non-preferred parts; and communicating the preferred parts strategy over a computer network to enterprise client systems.
摘要翻译： 本发明的示例性实施例涉及一种利用零件审查处理工具来促进通过计算机网络的企业的优选零件计划的方法。 该方法包括：从包括非优选部分的客户端系统接收物料清单; 将物料清单存储在物料清单数据库中; 从物料清单数据库中定期搜索和提取非优先零件记录; 将非优选零件记录导入偏差数据库; 评估与非首选部件使用相关的危险因素; 制定行动计划，以减轻使用非首选部分的风险; 制定优化零件战略，用于最小化使用非首选零件的请求; 以及通过计算机网络将优选部件策略传达给企业客户端系统。
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公开(公告)号：US20080091442A1
公开(公告)日：2008-04-17
申请号：US11548761
申请日：2006-10-12
IPC分类号： G06Q10/00 , G06F9/44 , G05B19/418
CPC分类号： G06Q10/06 , G06Q10/06375 , G06Q10/0875 , G06Q10/101 , Y02P90/265
摘要： Methods, systems and apparatus for defining, updating and communicating the current status of parts used by an enterprise to designers and procurement specialists. Allowable values of preferredness of parts are defined based on technology roadmaps, and these values are periodically checked in a current time period against certain criteria, and changes are made in the preferredness values to reflect current conditions in the time period and current estimates for future conditions. Software, including algorithms, is changed as required to implement the changes in the preferredness values, and the updated software is released for use by procurement and design personnel for ensuring consistency of values of preferredness and preferred part codes within an enterprise.
摘要翻译： 用于定义，更新和传达企业对设计人员和采购专家使用的零件的现状的方法，系统和装置。 根据技术路线图定义部件优先级的允许值，并根据某些标准在当前时间段内定期检查这些值，并根据某些标准对优先级值进行更改，以反映时间段内的当前条件和当前未来条件的估计值 。 包括算法在内的软件根据需要进行了更改，以实现优先级值的更改，更新后的软件将被采购和设计人员使用，以确保企业内部优先级和优先级零件代码的一致性。
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10.发明申请FLASH ARRAY BUILT IN SELF TEST ENGINE WITH TRACE ARRAY AND FLASH METRIC REPORTING 有权闪存阵列用自动测试引擎内置跟踪阵列和闪存公制报告公开(公告)号：US20130151914A1
公开(公告)日：2013-06-13
申请号：US13314657
申请日：2011-12-08
CPC分类号： G06F11/1068 , G11C16/00 , G11C29/16
摘要： A mechanism is provided for a flash array test engine. The flash array test engine includes a circuit. The circuit is configured to generate test workloads in a test mode for testing a flash device array, where each of the test workloads includes specific addresses, data, and command patterns to be sent to the flash device array. The circuit is configured to accelerate wear in the flash device array, via the test workloads, at an accelerated rate relative to general system workloads that are not part of the test mode. The circuit is configured to vary a range of conditions for the flash device array to determine whether each of the conditions passes or fails and to store failure data and corresponding failure data address information for the flash device array.
摘要翻译： 为闪存阵列测试引擎提供了一种机制。 闪存阵列测试引擎包括一个电路。 电路被配置为在测试模式下生成测试工作负载，用于测试闪存器件阵列，其中每个测试工作负载包括要发送到闪存器件阵列的特定地址，数据和命令模式。 该电路被配置为相对于不属于测试模式的一般系统工作负载，以加速的速度通过测试工作负载加速闪存器件阵列中的磨损。 电路被配置为改变闪存器件阵列的条件范围，以确定每个条件是否通过或失败，并存储闪存器件阵列的故障数据和相应的故障数据地址信息。
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