Method of supporting microelectronic wafer during backside processing
    7.
    发明申请
    Method of supporting microelectronic wafer during backside processing 审中-公开
    在背面处理中支撑微电子晶片的方法

    公开(公告)号:US20060286768A1

    公开(公告)日:2006-12-21

    申请号:US11155751

    申请日:2005-06-16

    IPC分类号: H01L21/30

    摘要: A method of supporting a microelectronic wafer during backside processing. The method comprises: selecting a rigid carrier, an adhesive, and a radiation source to emit radiation at a predetermined wavelength range; forming a wafer-carrier stack by providing the adhesive between the wafer and the carrier and curing the adhesive to bond the wafer to the carrier; subjecting the wafer in the wafer-carrier stack to backside processing; and removing the carrier and the adhesive from the wafer-carrier stack comprising detackifying the adhesive by irradiating the wafer-carrier stack from a carrier side thereof with radiation from the radiation source. The carrier is adapted to transmit therethrough at least some of the radiation from the radiation source. and the adhesive is adapted to absorb substantially all radiation transmitted through the carrier and is further adapted to be detackified as a result of absorbing said substantially all radiation.

    摘要翻译: 背面处理中支撑微电子晶片的方法。 该方法包括:选择刚性载体,粘合剂和辐射源以发射预定波长范围的辐射; 通过在晶片和载体之间提供粘合剂并固化粘合剂以将晶片结合到载体上来形成晶片载体堆叠; 对晶片载体叠层中的晶片进行背面处理; 以及从所述晶片载体堆叠中移除所述载体和所述粘合剂,其包括通过用来自所述辐射源的辐射从其载体侧照射所述晶片载体叠层而使所述粘合剂脱胶。 载体适于透射来自辐射源的至少一些辐射。 并且粘合剂适于吸收透射穿过载体的基本上所有的辐射,并且还适于由于吸收所述基本上所有的辐射而被去胶化。

    Method of supporting microelectronic wafer during backside processing using carrier having radiation absorbing film thereon
    9.
    发明申请
    Method of supporting microelectronic wafer during backside processing using carrier having radiation absorbing film thereon 审中-公开
    在背面处理中使用其上具有辐射吸收膜的载体支撑微电子晶片的方法

    公开(公告)号:US20070004171A1

    公开(公告)日:2007-01-04

    申请号:US11173857

    申请日:2005-06-30

    IPC分类号: H01L21/30 H01L21/00

    摘要: A method of supporting a microelectronic wafer during backside processing. The method comprises: selecting a rigid carrier including a radiation absorbing film thereon, an adhesive, and a radiation source to emit radiation at a predetermined wavelength range; forming a wafer-carrier stack by providing the adhesive between the wafer and the carrier and curing the adhesive to bond the wafer to the carrier; subjecting the wafer in the wafer-carrier stack to backside processing; and removing the carrier and the adhesive from the wafer-carrier stack comprising detackifying the adhesive by irradiating the wafer-carrier stack from a carrier side thereof with radiation from the radiation source. The carrier is adapted to transmit therethrough at least some of the radiation from the radiation source. and the radiation absorbing film is adapted to absorb substantially all radiation transmitted through the carrier and is further adapted to be heated to detackify the adhesive as a result of absorbing said substantially all radiation.

    摘要翻译: 背面处理中支撑微电子晶片的方法。 该方法包括:选择其上包括辐射吸收膜的刚性载体,粘合剂和辐射源以发射预定波长范围的辐射; 通过在晶片和载体之间提供粘合剂并固化粘合剂以将晶片结合到载体上来形成晶片载体堆叠; 对晶片载体叠层中的晶片进行背面处理; 以及从所述晶片载体堆叠中移除所述载体和所述粘合剂,其包括通过用来自所述辐射源的辐射从其载体侧照射所述晶片载体叠层而使所述粘合剂脱胶。 载体适于透射来自辐射源的至少一些辐射。 并且辐射吸收膜适于吸收透射穿过载体的基本上所有辐射,并且还适于被加热以由于吸收所述基本上所有的辐射而使粘合剂脱胶。