Vacuum heating furnace with tapered portion
    1.
    发明授权
    Vacuum heating furnace with tapered portion 失效
    带锥形部分的真空加热炉

    公开(公告)号:US6093911A

    公开(公告)日:2000-07-25

    申请号:US83055

    申请日:1998-05-22

    IPC分类号: H01L21/22 H01L21/00

    CPC分类号: H01L21/67115

    摘要: A vacuum heating furnace comprises a translucent container for retaining a heated object and a heating light source for heating a heated object retained in the translucent container. The translucent container has on its surface a tapered portion to receive transmitted light totally reflected on the inner surface of the translucent container at an angle smaller than a critical angle.

    摘要翻译: 真空加热炉包括用于保持加热物体的半透明容器和用于加热保持在半透明容器中的被加热物体的加热光源。 半透明容器在其表面上具有锥形部分,以小于临界角的角度接收在半透明容器的内表面上全反射的透射光。

    Vacuum heating furnace with tapered portion
    2.
    发明授权
    Vacuum heating furnace with tapered portion 失效
    带锥形部分的真空加热炉

    公开(公告)号:US06288368B1

    公开(公告)日:2001-09-11

    申请号:US09547316

    申请日:2000-04-11

    IPC分类号: A21B100

    CPC分类号: H01L21/67115

    摘要: A vacuum heating furnace comprises a translucent container for retaining a heated object and a heating light source for heating a heated object retained in the translucent container. The translucent container has on its surface a tapered portion to receive transmitted light totally reflected on the inner surface of the translucent container at an angle smaller than a critical angle.

    摘要翻译: 真空加热炉包括用于保持加热物体的半透明容器和用于加热保持在半透明容器中的被加热物体的加热光源。 半透明容器在其表面上具有锥形部分,以小于临界角的角度接收在半透明容器的内表面上全反射的透射光。

    Semiconductor manufacturing device and method for manufacturing semiconductor devices
    3.
    发明授权
    Semiconductor manufacturing device and method for manufacturing semiconductor devices 有权
    半导体制造装置及半导体装置的制造方法

    公开(公告)号:US08197638B2

    公开(公告)日:2012-06-12

    申请号:US10589490

    申请日:2005-03-04

    IPC分类号: H01L21/00 C23C14/00 C23C16/00

    摘要: Wafer contamination is prevented, while preventing damage to a high-frequency electrode and a susceptor. A main body 41 of the susceptor 40 of an MMT apparatus is composed of a heater arranging plate 42, an electrode arranging plate 48, and a supporting plate 56 all made from quartz. A circular electrode arranging hole 49 with a fixed depth is concentrically formed on the upper surface of the electrode arranging plate 48, and quadrangular pillars 50 are formed protruding in a matrix on the bottom of the electrode arranging hole 49. Multiple insertion holes 52 are formed in a disk-shaped high-frequency electrode 51, and the high-frequency electrode 51 is installed in the electrode arranging hole 49 by inserting each pillar 50 into each insertion hole 52. The gaps Sa and Sb are provided between the high-frequency electrode 51 and the electrode arranging plate 48. The pillar 50 boosts the strength of the electrode arranging plate 48. Damage to the high-frequency electrode is prevented even if the thermal expansion coefficient of the high-frequency electrode is larger than that of the electrode arranging plate, since the gaps absorb the thermal expansion differential.

    摘要翻译: 防止晶片污染,同时防止损坏高频电极和基座。 MMT装置的基座40的主体41由加热器布置板42,电极布置板48和全部由石英制成的支撑板56组成。 在电极配置板48的上表面同心地形成有固定深度的圆形电极布置孔49,并且在电极布置孔49的底部以矩阵形式形成四边形柱50,形成多个插入孔52 在盘形高频电极51中,并且通过将每个支柱50插入每个插入孔52中而将高频电极51安装在电极布置孔49中。间隙Sa和Sb设置在高频电极 51和电极配置板48.支柱50提高电极排列板48的强度。即使高频电极的热膨胀系数大于电极排列的热膨胀系数,也防止了高频电极的损坏 因为间隙吸收热膨胀差。

    Method for use in manufacturing a semiconductor device
    5.
    发明授权
    Method for use in manufacturing a semiconductor device 有权
    用于制造半导体器件的方法

    公开(公告)号:US06514869B2

    公开(公告)日:2003-02-04

    申请号:US09924538

    申请日:2001-08-09

    IPC分类号: H01L21311

    摘要: In a semiconductor device manufacturing method for processing a plurality of substrates by alternately repeating a pretreatment stage and a continuous substrate processing stage, the continuous substrate processing stage comprises the steps of: loading a substrate on a heater unit located at a substrate loading/unloading position, the heater unit supporting and heating the substrate; processing the loaded substrate after transferring the heater unit having thereon the loaded substrate to a substrate processing position; unloading the processed substrate; and repeating the loading step, the processing step and the unloading step until a set of substrates are processed, and wherein the pretreatment stage is carried out by maintaining the heater unit between the substrate loading/unloading position and the substrate processing position.

    摘要翻译: 在通过交替重复预处理阶段和连续衬底处理阶段来处理多个衬底的半导体器件制造方法中,连续衬底处理阶段包括以下步骤:将衬底加载在位于衬底装载/卸载位置的加热器单元 所述加热器单元支撑并加热所述基板; 在将其上装载有衬底的加热器单元传送到衬底处理位置之后处理加载的衬底; 卸载经处理的基板; 并且重复加载步骤,处理步骤和卸载步骤直到处理一组基板,并且其中通过将加热器单元保持在基板装载/卸载位置和基板处理位置之间来执行预处理阶段。

    Semiconductor producing device and semiconductor device producing method
    7.
    发明授权
    Semiconductor producing device and semiconductor device producing method 有权
    半导体制造装置及半导体装置的制造方法

    公开(公告)号:US08906161B2

    公开(公告)日:2014-12-09

    申请号:US12458096

    申请日:2009-06-30

    摘要: A tubular electrode (215) and a tubular magnet (216) are installed on an external section of a processing furnace (202) for an MMT device. A susceptor (217) for holding a wafer (200) is installed inside a processing chamber (201) of the processing furnace. A gate valve (244) for conveying the wafer into and out of the processing chamber; and a shower head (236) for spraying processing gas in a shower onto the wafer, are installed inside the processing furnace. A high frequency electrode (2) and a heater (3) are installed inside the susceptor (217) with a clearance between them and the walls forming the space. The clearances formed between the walls forming the space in the susceptor and the high frequency electrode and the heater prevent damage to the high frequency electrode and the heater even if a thermal expansion differential occurs between the high frequency electrode, the heater and the susceptor.

    摘要翻译: 管状电极(215)和管状磁体(216)安装在用于MMT装置的加工炉(202)的外部。 用于保持晶片(200)的感受器(217)安装在处理炉的处理室(201)内。 用于将晶片输入和离开处理室的闸阀(244); 和用于将淋浴中的处理气体喷射到晶片上的喷头(236)安装在处理炉内。 高频电极(2)和加热器(3)安装在基座(217)的内部,它们之间的间隙和形成空间的壁之间。 即使在高频电极,加热器和基座之间发生热膨胀差,在形成基座和高频电极和加热器之间的空间的壁之间形成的间隙也防止对高频电极和加热器的损坏。

    Substrate processing apparatus, heating apparatus for use in the same, method of manufacturing semiconductors with those apparatuses, and heating element supporting structure
    8.
    发明授权
    Substrate processing apparatus, heating apparatus for use in the same, method of manufacturing semiconductors with those apparatuses, and heating element supporting structure 有权
    基板处理装置,使用该加热装置的加热装置,利用这些装置制造半导体的方法和加热元件支撑结构

    公开(公告)号:US07863204B2

    公开(公告)日:2011-01-04

    申请号:US11990519

    申请日:2006-08-23

    IPC分类号: H01L21/00

    CPC分类号: H01L21/67109

    摘要: A substrate treating device comprising a treatment chamber for storing and treating substrates and a heating device having a heating element and a heat insulator and heating the substrates in the treatment chamber by the heating element. The heating element is so formed that only its one end is held by a holding part, and a projection projected to the treatment chamber side at the intermediate part of the heating element and positioned in proximity to or in contact with the heating element is formed on the heat insulator. A pin with an enlarged part is passed through the heating element and the heat insulator at the intermediate part of the heating element and the enlarged part is positioned in proximity to or in contact with the heating element. The plurality of projections may be formed on the heat insulator and the pins may be disposed between these plurality of projections.

    摘要翻译: 一种基板处理装置,包括用于存储和处理基板的处理室和具有加热元件和隔热件的加热装置,并且通过加热元件加热处理室中的基板。 加热元件形成为只有其一端由保持部保持,并且在加热元件的中间部分处突出到处理室侧并且位于加热元件附近或与加热元件接触的突起处形成在 隔热材料。 具有放大部分的销通过加热元件并且在加热元件的中间部分处的隔热件并且扩大部分位于加热元件附近或与加热元件接触。 多个突起可以形成在绝热体上,并且销可以设置在这些多个突起之间。

    Substrate processing apparatus, heating apparatus for use in the same, method of manufacturing semiconductors with those apparatuses, and heating element supporting structure
    9.
    发明申请
    Substrate processing apparatus, heating apparatus for use in the same, method of manufacturing semiconductors with those apparatuses, and heating element supporting structure 有权
    基板处理装置,使用该加热装置的加热装置,利用这些装置制造半导体的方法和加热元件支撑结构

    公开(公告)号:US20090035948A1

    公开(公告)日:2009-02-05

    申请号:US11990519

    申请日:2006-08-23

    IPC分类号: H01L21/31 A21B1/00

    CPC分类号: H01L21/67109

    摘要: A substrate treating device comprising a treatment chamber for storing and treating substrates and a heating device having a heating element and a heat insulator and heating the substrates in the treatment chamber by the heating element. The heating element is so formed that only its one end is held by a holding part, and a projection projected to the treatment chamber side at the intermediate part of the heating element and positioned in proximity to or in contact with the heating element is formed on the heat insulator. A pin with an enlarged part is passed through the heating element and the heat insulator at the intermediate part of the heating element and The enlarged part is positioned in proximity to or in contact with the heating element. The plurality of projections may be formed on the heat insulator and the pins may be disposed between these plurality of projections.

    摘要翻译: 一种基板处理装置,包括用于存储和处理基板的处理室和具有加热元件和隔热件的加热装置,并且通过加热元件加热处理室中的基板。 加热元件形成为只有其一端由保持部保持,并且在加热元件的中间部分处突出到处理室侧并且位于加热元件附近或与加热元件接触的突起处形成在 隔热材料。 具有放大部分的销通过加热元件和加热元件的中间部分处的隔热件,并且扩大部分位于加热元件附近或与加热元件接触。 多个突起可以形成在绝热体上,并且销可以设置在这些多个突起之间。