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    System and method for offsetting measurement of machine tool
    1.
    发明授权
    System and method for offsetting measurement of machine tool 有权
    机床偏移测量系统及方法

    公开(公告)号：US09205525B2

    公开(公告)日：2015-12-08

    申请号：US13852431

    申请日：2013-03-28

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Chao-Chuang Mai ,  Chih-Ping Cheng ,  Chang-Sheng Chen ,  Chin-Hui Chen ,  Chia-Sheng Chiang

    IPC: B23Q17/09

    CPC classification number: B23Q17/0923

    Abstract: A method and a system, for offsetting measurement of machine tool, includes following steps. A tool seat is chosen, a first coordinate is set based on a first datum mark of the tool seat. There is a total tool seat assembling length in between the first datum mark and the tool seat. A tool is chosen, assembled in the tool seat, and includes a total tool length. A second coordinate is set based on a second datum mark of a measuring unit. The tool seat is moved to make a machining end of the tool contact with the second coordinate to obtain a relative total length in between the first and the second coordinate. The total tool length subtracts from the relative total length equals an assembled offset length. The total tool seat assembling length subtracts from the relative total length equals and obtains a tool assembling length.

    Abstract translation: 一种用于抵消机床测量的方法和系统，包括以下步骤。 选择工具座，基于工具座的第一基准标记来设定第一坐标。 在第一基准标记和工具座之间存在总的工具座组装长度。 选择工具，组装在工具座中，并包括总工具长度。 基于测量单元的第二基准标记来设定第二坐标。 移动工具座以使刀具接触的加工端与第二坐标相乘以获得第一和第二坐标之间的相对总长度。 总刀具长度从相对总长度减去等于组装的偏移长度。 刀具组合总长度从相对总长度减去等于并获得刀具组装长度。

    QUANTUM DEVICE AND MICROWAVE DEVICE
    3.
    发明公开
    QUANTUM DEVICE AND MICROWAVE DEVICE 审中-公开

    公开(公告)号：US20240346351A1

    公开(公告)日：2024-10-17

    申请号：US18088807

    申请日：2022-12-27

    Applicant: Industrial Technology Research Institute

    Inventor： Chang-Sheng Chen ,  Che-Hao Li ,  Cheng-Hua Tsai ,  Meng-Hsuan Chen ,  Wei Chaun Yu ,  Meng-Sheng Chen

    IPC: G06N10/40 ,  H05K1/14 ,  H10N60/81 ,  H10N69/00

    CPC classification number: G06N10/40 ,  H05K1/147 ,  H10N60/81 ,  H10N69/00

    Abstract: The disclosure provides a quantum device and a microwave device. The quantum device includes a first partition, a second partition, an upper circuit board, a lower circuit board and a flexible circuit. The second partition is arranged below the first partition. The first partition and the second partition are used to define an ultra-low temperature chamber of the quantum device. The upper circuit board, the lower circuit board and the flexible circuit are arranged in the ultra-low temperature chamber. The upper circuit board is disposed on a lower surface of the first partition. The lower circuit board is disposed on an upper surface of the second partition. The flexible circuit is electrically connected between the upper circuit board and the lower circuit board to provide multiple signal paths for mutual signal transmission between the upper circuit board and the lower circuit board.

    Antenna array and collision avoidance radar having the same
    5.
    发明授权
    Antenna array and collision avoidance radar having the same 有权

    公开(公告)号：US11081805B2

    公开(公告)日：2021-08-03

    申请号：US16796421

    申请日：2020-02-20

    Applicant: Industrial Technology Research Institute

    Inventor： Chun-Chi Lin ,  Chang-Sheng Chen ,  Guo-Shu Huang

    IPC: H01Q21/06 ,  G01S13/931 ,  H01Q1/32

    Abstract: An antenna array is provided, which may include a connection portion and a plurality of antenna units. The antenna units may be disposed on the two sides of the connection portion respectively. The proximal end of each of the antenna units may be connected to the connection portion and the distal end of one or more of the antenna units may be grounded. The length of each of the antenna units may be less than or equal to ¼ wavelength of the operating frequency of the antenna array, and the distance between any two adjacent antenna units may be less than or equal to ½ wavelength of the operating frequency of the antenna array.

    SYSTEM AND METHOD FOR OFFSETTING MEASUREMENT OF MACHINE TOOL
    6.
    发明申请
    SYSTEM AND METHOD FOR OFFSETTING MEASUREMENT OF MACHINE TOOL 有权
    用于偏移机床测量的系统和方法

    公开(公告)号：US20140130571A1

    公开(公告)日：2014-05-15

    申请号：US13852431

    申请日：2013-03-28

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Chao-Chuang MAI ,  Chih-Ping Cheng ,  Chang-Sheng Chen ,  Chin-Hui Chen ,  Chia-Sheng Chiang

    IPC: G01B5/012

    CPC classification number: B23Q17/0923

    Abstract: A method and a system, for offsetting measurement of machine tool, includes following steps. A tool seat is chosen, a first coordinate is set based on a first datum mark of the tool seat. There is a total tool seat assembling length in between the first datum mark and the tool seat. A tool is chosen, assembled in the tool seat, and includes a total tool length. A second coordinate is set based on a second datum mark of a measuring unit. The tool seat is moved to make a machining end of the tool contact with the second coordinate to obtain a relative total length in between the first and the second coordinate. The total tool length subtracts from the relative total length equals an assembled offset length. The total tool seat assembling length subtracts from the relative total length equals and obtains a tool assembling length.

    Abstract translation: 一种用于抵消机床测量的方法和系统，包括以下步骤。 选择工具座，基于工具座的第一基准标记来设定第一坐标。 在第一基准标记和工具座之间存在总的工具座组装长度。 选择工具，组装在工具座中，并包括总工具长度。 基于测量单元的第二基准标记来设定第二坐标。 移动工具座以使刀具接触的加工端与第二坐标相乘以获得第一和第二坐标之间的相对总长度。 总刀具长度从相对总长度减去等于组装的偏移长度。 刀具组合总长度从相对总长度减去等于并获得刀具组装长度。

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