METHOD FOR TESTING PEROVSKITE PRECURSOR SOLUTION

    公开(公告)号:US20230079784A1

    公开(公告)日:2023-03-16

    申请号:US17528236

    申请日:2021-11-17

    Abstract: Provided is a method for testing a perovskite precursor solution, including: taking a perovskite precursor solution containing a plurality of dispersed perovskite colloids as a sample to perform liquid analysis, thereby obtaining an analysis information; and determining whether the perovskite precursor solution is a good product based on obtained analysis information from the liquid analysis, wherein the analysis information is at least one selected from the group consisting of element content of the colloid, element distribution, colloid size, and colloid appearance, thereby a feasible and effective testing method is defined through the correlation between the perovskite precursor colloid and the perovskite.

    Perovskite film and manufacturing method thereof

    公开(公告)号:US11271157B1

    公开(公告)日:2022-03-08

    申请号:US17035681

    申请日:2020-09-29

    Abstract: Provided are a perovskite film and a manufacturing method thereof. The method includes the following steps. A perovskite precursor material is coated in a linear direction on a substrate with a temperature between 100° C. and 200° C., wherein a concentration of the perovskite precursor material is between 0.05 M and 1.5 M. An infrared light irradiation is performed on the perovskite precursor material to cure the perovskite precursor material to form a thin film including a compound represented by formula (1). The perovskite film has a single 2D phase structure or has a structure in which a 3D phase structure is mixed with a single 2D phase structure. (RNH3)2MA(n−1)M1nX(3n+1)  formula (1), wherein the definitions of R, MA, M1, X, and n are as defined above.

    PEROVSKITE FILM AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20220069221A1

    公开(公告)日:2022-03-03

    申请号:US17035681

    申请日:2020-09-29

    Abstract: Provided are a perovskite film and a manufacturing method thereof. The method includes the following steps. A perovskite precursor material is coated in a linear direction on a substrate with a temperature between 100° C. and 200° C., wherein a concentration of the perovskite precursor material is between 0.05 M and 1.5 M. An infrared light irradiation is performed on the perovskite precursor material to cure the perovskite precursor material to form a thin film including a compound represented by formula (1). The perovskite film has a single 2D phase structure or has a structure in which a 3D phase structure is mixed with a single 2D phase structure. (RNH3)2MA(n−1)M1nX(3n+1)  formula (1), wherein the definitions of R, MA, M1, X, and n are as defined above.

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