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公开(公告)号:US20140242374A1
公开(公告)日:2014-08-28
申请号:US13774624
申请日:2013-02-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: Johann Strasser , Thomas Kunstmann , Manfred Frank , Werner Robl , Maximilian Krug , Simon Faiss , Matthias Mueller
CPC classification number: H01L23/14 , B05D7/52 , B32B3/26 , C23C18/1644 , C23C18/1651 , C23C18/32 , C23C18/50 , C25D7/12 , C25D7/123 , H01L23/3733 , H01L23/49866 , H01L23/53238 , H01L2924/0002 , Y10T428/249956 , Y10T428/249957 , Y10T428/24997 , H01L2924/00
Abstract: Various methods, apparatuses and devices relate to porous metal layers on a substrate which are three-dimensionally coated. In one embodiment, a porous metal layer is deposited over a substrate. The porous metal layer can be three-dimensionally coated with a coating material.
Abstract translation: 各种方法,装置和装置涉及三维涂覆在基底上的多孔金属层。 在一个实施例中,多孔金属层沉积在衬底上。 多孔金属层可以用涂料三维涂覆。
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公开(公告)号:US09627335B2
公开(公告)日:2017-04-18
申请号:US14272535
申请日:2014-05-08
Applicant: Infineon Technologies AG
Inventor: Stephan Henneck , Evelyn Napetschnig , Daniel Pedone , Bernhard Weidgans , Simon Faiss , Ivan Nikitin
IPC: H01L21/4763 , H01L23/00
CPC classification number: H01L24/05 , H01L24/03 , H01L2224/03424 , H01L2224/0345 , H01L2224/03464 , H01L2224/03472 , H01L2224/03614 , H01L2224/05007 , H01L2224/05027 , H01L2224/05082 , H01L2224/05155 , H01L2224/05558 , H01L2224/05583 , H01L2224/05639 , H01L2224/05644 , H01L2924/00014 , H01L2924/01023
Abstract: A method for processing a semiconductor device in accordance with various embodiments may include: depositing a first metallization layer over a semiconductor workpiece; patterning the first metallization layer; and depositing a second metallization layer over the patterned first metallization layer, wherein depositing the second metallization layer includes an electroless deposition process including immersing the patterned first metallization layer in a metal electrolyte.
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