Material characterization from infrared radiation

    公开(公告)号:US10354387B2

    公开(公告)日:2019-07-16

    申请号:US15443751

    申请日:2017-02-27

    Abstract: Systems, apparatuses, and/or methods to characterize a material. For example, and apparatus may include a pattern receiver to receive an IR pattern corresponding to non-uniform IR radiation that is to result from an interaction with a material, such as a translucent material. The apparatus may further include a characterizer to make a characterization of the material, such as a translucent material, based on the IR pattern. The characterization may differentiate the material, such as a translucent material, from one or more other materials, such as one or more other translucent materials.

    Feature characterization from infrared radiation

    公开(公告)号:US10146375B2

    公开(公告)日:2018-12-04

    申请号:US15200062

    申请日:2016-07-01

    Abstract: Systems, apparatuses, and/or methods to characterize a user feature. For example, and apparatus may include a pattern receiver to receive a feature infrared (IR) pattern corresponding to non-uniform IR radiation reflected by skin of the user feature and an object IR pattern corresponding to IR radiation reflected by an object. The apparatus may further include a filter to generate a modified IR pattern from the object IR pattern and to remove at least a part of the modified IR pattern from feature IR pattern. In addition, the apparatus may include a feature characterizer to characterize the user feature based on the feature IR pattern. In one example, a computing platform may be controlled based on the characterization of the user feature.

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