Abstract:
A voltage-controlled oscillator (VCO) having an operating frequency dependent on a total capacitance of selectable tuning capacitors can be fabricated within an integrated circuit (IC). The VCO can include active electronic devices fabricated within a set of lower layers of the IC and selectable tuning capacitors having electrically conductive structures separated by dielectric material fabricated within a set of upper layers of the IC. The upper layers of the IC are located above the set of lower layers of the IC. The VCO can also include a set of interconnect structures configurable to select a total capacitance of the selectable tuning capacitors by electrically interconnecting the first portion of the VCO to capacitors of the at least one selectable tuning capacitor.
Abstract:
A phase-frequency detector (PFD) is electrically coupled to a charge pump of a phase-locked-loop (PLL). The PFD includes a first differential latch electrically coupled to the charge pump. The first differential latch drives a differential pair of increment signals to the charge pump in response to differential pairs of both reference clock signals and reset signals. The PFD also includes a second differential latch electrically coupled to the charge pump. The second differential latch drives a differential pair of decrement signals to the charge pump in response to differential pairs of both feedback clock signals and reset signals. The PFD also includes a differential AND gate electrically coupled to both the first differential latch and the second differential latch. The differential AND gate drives the differential pair of reset signals to both of the differential latches in response to the differential pairs of both increment signals and decrement signals.
Abstract:
A variable frequency oscillator device includes a first inverter stage that is designed to invert an input signal to generate a sawtooth signal by charging and discharging a capacitor using current sources that each provides a respective amount of current that is responsive to a control signal and to a dampening signal. A second inverter stage is designed to generate a first inverted signal from the sawtooth signal of the first inverter stage. A third inverter stage is designed to generate a second inverted signal from the first inverted signal, and dampen a signal transition rate for the first inverted signal based upon the control signal.
Abstract:
An embodiment of the invention may include a method and structure for determining a failure in a guard ring of a chip. The method may include measuring a current frequency of oscillation of a crack check circuit located within a guard ring. The method may include comparing the frequency to a baseline frequency of oscillation of the crack check circuit. The current frequency and baseline frequency may be normalized using a set of bypass lines. The method may include determining there is a failure of the guard ring based on the difference between the normalized frequency of oscillation and the baseline normalized frequency of oscillation.
Abstract:
Using a burn-in operational amplifier (opamp) for a phased locked loop (PLL) regulator including activating a voltage stress mode for an integrated circuit comprising a PLL regulator for a PLL, wherein the PLL regulator comprises thin-oxide transistors, and wherein activating the voltage stress mode for the integrated circuit comprises applying an elevated voltage to an input of the PLL regulator; and enabling, during the voltage stress mode, a burn-in opamp coupled to the input of the PLL regulator, wherein enabling the burn-in opamp bias the input of the PLL regulator to a voltage lower than the elevated voltage.
Abstract:
A method and a circuit for implementing dynamic phase error correction for phase locked loop (PLL) circuits, and a design structure on which the subject circuit resides are provided. The circuit implements dynamic phase error correction and includes an adjustable delay line that is placed in either the reference or feedback clock path. The phase error correction circuit detects the propagation delay of the reference clock path from input pin to the phase frequency detector in the PLL. It also detects the propagation delay of the feedback clock path from input pin to the phase frequency detector in the PLL. The detected propagation delays are compared and a control signal is generated that is proportional to the mismatch. The control signal is applied to the adjustable delay line. The delay of the delay line is continually adjusted until the reference and feedback clock paths are balanced.
Abstract:
A structure is provided that includes a first active circuit in which at least one of areas surrounding the first active circuit includes an active circuit-containing region. A second active circuit is spaced apart from the first active circuit. The second active circuit includes a circuit mimic fill area present in at least one of the areas surrounding the second active circuit. The circuit mimic fill area substantially matches the active circuit-containing region that is adjacent to the first active circuit. The circuit mimic fill area is located on an equivalent side of the second active circuit as the active circuit-containing region that is present adjacent the first active circuit. The use of the circuit mimic fill mitigates the effects over medium range and beyond distances that cause device failure.
Abstract:
A structure is provided that includes a first active circuit in which at least one of areas surrounding the first active circuit includes an active circuit-containing region. A second active circuit is spaced apart from the first active circuit. The second active circuit includes a circuit mimic fill area present in at least one of the areas surrounding the second active circuit. The circuit mimic fill area substantially matches the active circuit-containing region that is adjacent to the first active circuit. The circuit mimic fill area is located on an equivalent side of the second active circuit as the active circuit-containing region that is present adjacent the first active circuit. The use of the circuit mimic fill mitigates the effects over medium range and beyond distances that cause device failure.
Abstract:
A phase locked loop having a charge pump is described. The charge pump relies on close matching of FETs (Field Effect Transistor) electrical parameters to FETs in a current reference circuit. To achieve close matching of FET electrical performance, FEOL (Front End Of Line), comprising all FET shapes, of the current pump is identical in shapes and layout to the current reference circuit. BEOL (Back End Of Line) differs between the charge pump and the current reference circuit. The charge pump and the current reference circuit are arranged in a row. A shield circuit having FEOL shapes and layout identical to the current pump may be placed at each end of the row.
Abstract:
A voltage-controlled oscillator (VCO) having an operating frequency dependent on a total capacitance of selectable tuning capacitors can be fabricated within an integrated circuit (IC). The VCO can include active electronic devices fabricated within a set of lower layers of the IC and selectable tuning capacitors having electrically conductive structures separated by dielectric material fabricated within a set of upper layers of the IC. The upper layers of the IC are located above the set of lower layers of the IC. The VCO can also include a set of interconnect structures configurable to select a total capacitance of the selectable tuning capacitors by electrically interconnecting the first portion of the VCO to capacitors of the at least one selectable tuning capacitor.