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Patent Agency Ranking
公开(公告)号：US10761186B2
公开(公告)日：2020-09-01
申请号：US15834118
申请日：2017-12-07
Applicant: Infineon Technologies AG
Inventor： Jochen O. Schrattenecker , Florian Starzer , Oliver Frank , Michael Kropfitsch , Georg Krebelder , Helmut Kollmann , Thomas Sailer
Abstract: A radar device comprises a test signal generator including a digital harmonic oscillator that generates a digital oscillator signal with a first spectral component; a first digital-to-analog-converter that generates an analog oscillator signal based on the digital oscillator signal. Furthermore, the radar device comprises at least one radar channel receiving the analog oscillator signal during one or more self-tests.
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公开(公告)号：US11796636B2
公开(公告)日：2023-10-24
申请号：US17082453
申请日：2020-10-28
Applicant: Infineon Technologies AG
CPC classification number: G01S7/4056 , G01S7/4008 , G01S7/4017 , G01S13/342 , G01S13/343 , G01S13/931 , H03C3/095 , H03C3/0925 , H03C3/0941 , H03L7/06 , H03L7/18 , H03L7/193 , G01S7/032
Abstract: An apparatus is described that, according to an exemplary embodiment, has an RF oscillator for generating an RF oscillator signal at a first frequency and a frequency divider having a division ratio that is fixed during operation. The frequency divider is supplied with the RF oscillator signal and is configured to provide an oscillator signal at a second frequency. The apparatus further has a monitor circuit, to which the oscillator signal at the second frequency is supplied and which is configured to measure the second frequency and to provide at least one digital value that is dependent on the second frequency of the oscillator signal. The at least one digital value is provided on a test contact.
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公开(公告)号：US11428775B2
公开(公告)日：2022-08-30
申请号：US17019828
申请日：2020-09-14
Applicant: Infineon Technologies AG
Inventor： Alexander Melzer , Andreas Dollinger , Rene Kobler , Georg Krebelder , Christoph Wagner , Martin Wiessflecker
IPC: G01S7/02 , G01S13/58 , G01S7/35 , G01S13/931
Abstract: A radar system includes a local oscillator for generating a local oscillator signal, transmission channels, and a reception channel. The transmission channels are designed to generate and output RF radar signals based on the local oscillator signal The transmission channels have phase shifters for setting the phase of the RF radar signals. The reception channel is designed to receive an RF signal and to convert it into a baseband signal by using the local oscillator signal supplied thereto. A method includes operating the local oscillator in a CW mode, setting a specific combination of phase shifts for the phase shifters of the transmission channels, altering the phase of the local oscillator signal supplied to the reception channel or of the phase shifts of the phase shifters by a phase offset, and ascertaining that phase offset for which the baseband signal at least approximately assumes a maximum.
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公开(公告)号：US10859674B2
公开(公告)日：2020-12-08
申请号：US16014044
申请日：2018-06-21
Applicant: Infineon Technologies AG
Abstract: An apparatus is described that, according to an exemplary embodiment, has an RF oscillator for generating an RF oscillator signal at a first frequency and a frequency divider having a division ratio that is fixed during operation. The frequency divider is supplied with the RF oscillator signal and is configured to provide an oscillator signal at a second frequency. The apparatus further has a monitor circuit, to which the oscillator signal at the second frequency is supplied and which is configured to measure the second frequency and to provide at least one digital value that is dependent on the second frequency of the oscillator signal. The at least one digital value is provided on a test contact.
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5.发明授权公开(公告)号：US10761140B2
公开(公告)日：2020-09-01
申请号：US16038223
申请日：2018-07-18
Applicant: Infineon Technologies AG
Inventor： Oliver Frank , Christoph Hazott , Georg Krebelder , Bruno Mariacher , Otto Pfabigan , Sebastian Pointner , Ralf Reiterer , Florian Starzer
IPC: G01R31/319 , G06F30/33 , G06F30/327 , G01R31/317 , H01L21/66
Abstract: A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.
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