TECHNOLOGIES FOR A UNIFIED TEST AND DEBUG ARCHITECTURE

    公开(公告)号:US20240329129A1

    公开(公告)日:2024-10-03

    申请号:US18537076

    申请日:2023-12-12

    CPC classification number: G01R31/31705 G06F11/27 G06F13/4221 G06F2213/0026

    Abstract: Technologies for a unified debug and test architecture in chiplets is disclosed. In an illustrative embodiment, several chiplets are integrated on an integrated circuit package. The chiplets are connected by a package interconnect, such as a universal chiplet interconnect express (UCIe) interconnect. Each chiplet includes several debug nodes, which are connected by an on-chiplet network. One of the chiplets, referred to as a package debug endpoint, acts as a link endpoint for an off-package link, such as a peripheral component interconnect express (PCIe) link. In use, debug messages can be sent to the package debug endpoint over a PCIe link. The debug messages can be routed within the chiplets and between chiplets, allowing for the debug functionality at each debug node to be probed using a common protocol. In this manner, chiplets from different vendors can be integrated into the same package and tested using common software.

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