公开(公告)号：US20230245940A1

公开(公告)日：2023-08-03

申请号：US18133868

申请日：2023-04-12

申请人： Intel Corporation

发明人： Rahul JAIN ,  Kyu Oh LEE ,  Siddharth K. ALUR ,  Wei-Lun K. JEN ,  Vipul V. MEHTA ,  Ashish DHALL ,  Sri Chaitra J. CHAVALI ,  Rahul N. MANEPALLI ,  Amruthavalli P. ALUR ,  Sai VADLAMANI

IPC分类号： H01L23/31 ,  H01L21/48 ,  H01L21/56 ,  H01L23/538 ,  H01L23/00 ,  H01L25/065 ,  H01L23/532 ,  H01L23/498

CPC分类号： H01L23/3185 ,  H01L21/4853 ,  H01L21/4857 ,  H01L21/563 ,  H01L23/5381 ,  H01L23/5383 ,  H01L23/5386 ,  H01L24/16 ,  H01L25/0655 ,  H01L23/53295 ,  H01L23/3128 ,  H01L24/06 ,  H01L23/49816 ,  H01L24/13 ,  H01L24/81 ,  H01L25/0657 ,  H01L2224/16227 ,  H01L2924/18161 ,  H01L2224/83051 ,  H01L2224/81

摘要： An apparatus is provided which comprises: a substrate, a die site on the substrate to couple with a die, a die side component site on the substrate to couple with a die side component, and a raised barrier on the substrate between the die and die side component sites to contain underfill material disposed at the die site, wherein the raised barrier comprises electroplated metal. Other embodiments are also disclosed and claimed.

公开(公告)号：US20190311916A1

公开(公告)日：2019-10-10

申请号：US16317789

申请日：2016-07-14

申请人： Intel Corporation

发明人： Sri Chaitra CHAVALI ,  Siddharth K. ALUR ,  Amanda E. SCHUCKMAN ,  Amruthavalli Palla ALUR ,  Islam A. SALAMA ,  Yikang DENG ,  Kristof DARMAWIKARTA

IPC分类号： H01L21/48 ,  H01L23/498 ,  H01L23/522 ,  H01L23/532 ,  H01L23/00

摘要： Various embodiments of the disclosure are directed to a semiconductor package and a method for fabrication of the semiconductor package. Further, disclosed herein are systems and methods that are directed to using a photoimageable dielectric (PID) layer with substantially similar mechanical properties as that of a mold material. The disclosure can be used, for example, in the context of bumpless laserless embedded substrate structures (BLESS) technology for wafer/panel level redistribution layer (RDL) and/or fan-out packaging applications. The disclosed embodiments may reduce the need for multiple dry resist film (DFR) lamination steps during various processing steps for semiconductor packaging and can also facilitate multiple layer counts due to the availability of thin PID materials.

公开(公告)号：US20240186202A1

公开(公告)日：2024-06-06

申请号：US18415268

申请日：2024-01-17

申请人： Intel Corporation

发明人： Rahul JAIN ,  Kyu Oh LEE ,  Siddharth K. ALUR ,  Wei-Lun K. JEN ,  Vipul V. MEHTA ,  Ashish DHALL ,  Sri Chaitra J. CHAVALI ,  Rahul N. MANEPALLI ,  Amruthavalli P. ALUR ,  Sai VADLAMANI

IPC分类号： H01L23/31 ,  H01L21/48 ,  H01L21/56 ,  H01L23/00 ,  H01L23/498 ,  H01L23/532 ,  H01L23/538 ,  H01L25/065

CPC分类号： H01L23/3185 ,  H01L21/4853 ,  H01L21/4857 ,  H01L21/563 ,  H01L23/3128 ,  H01L23/49816 ,  H01L23/53295 ,  H01L23/5381 ,  H01L23/5383 ,  H01L23/5386 ,  H01L24/06 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/0655 ,  H01L25/0657 ,  H01L2224/16227 ,  H01L2224/81 ,  H01L2224/83051 ,  H01L2924/18161

摘要： An apparatus is provided which comprises: a substrate, a die site on the substrate to couple with a die, a die side component site on the substrate to couple with a die side component, and a raised barrier on the substrate between the die and die side component sites to contain underfill material disposed at the die site, wherein the raised barrier comprises electroplated metal. Other embodiments are also disclosed and claimed.

公开(公告)号：US20190393109A1

公开(公告)日：2019-12-26

申请号：US16481216

申请日：2017-03-30

申请人： Intel Corporation

发明人： Lisa Ying Ying CHEN ,  Lauren Ashley LINK ,  Robert Alan MAY ,  Amruthavalli Pallavi ALUR ,  Kristof Kuwawi DARMAWIKARTA ,  Siddharth K. ALUR ,  Sri Ranga Sai BOYAPATI ,  Andrew James BROWN ,  Lilia MAY

IPC分类号： H01L23/15 ,  H01L23/498 ,  H01L21/48 ,  C04B35/622 ,  C04B35/64

摘要： Semiconductor packages including package substrates having polymer-derived ceramic cores are described. In an example, a package substrate includes a core layer including a polymer-derived ceramic. The polymer-derived ceramic may include filler particles to control shrinkage and reduce warpage of the core layer during fabrication and use of the package substrate. The core layer may include counterbores or blind holes to embed a contact pad or an electrical interconnect in the core layer. A semiconductor die may be mounted on the package substrate and may be electrically connected to the contact pad or the electrical interconnect.