TRANSACTIONAL MEMORY PERFORMANCE AND FOOTPRINT

    公开(公告)号:US20190079773A1

    公开(公告)日:2019-03-14

    申请号:US15704759

    申请日:2017-09-14

    发明人: Shakti Kapoor

    IPC分类号: G06F9/38 G06F9/30 G06F3/06

    摘要: Embodiments of the invention are directed to methods for handling cache. The method includes retrieving a plurality of instructions from a cache. The method further includes placing the plurality of instructions into an instruction fetch buffer. The method includes retrieving a first instruction of the plurality of instructions from the instruction fetch buffer. The method includes executing the first instruction. The method includes retrieving a second instruction from the plurality of instructions from the instruction fetch buffer unless a back invalidate is received from the cache. Thereafter executing the second instruction without refreshing the instruction fetch buffer from the cache.

    EFFICIENT TESTING OF DIRECT MEMORY ADDRESS TRANSLATION

    公开(公告)号:US20190050314A1

    公开(公告)日:2019-02-14

    申请号:US16141971

    申请日:2018-09-26

    摘要: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

    Efficient validation of transactional memory in a computer processor

    公开(公告)号:US10169181B2

    公开(公告)日:2019-01-01

    申请号:US15265939

    申请日:2016-09-15

    摘要: A transactional memory test tests a transactional memory system on a computer processor. A test case with a transactional memory test is constructed such that the transactional memory test proceeds further in the transaction mode if the transaction is successful. In contrast, if there is a failure of the transaction, then the transactional memory test is executed in the non-transaction state. The transactional memory test stresses both transaction success and transaction failure cases of the processor for more efficient validation of the computer processor. Also, when checking the correctness of the test case the correct result remains the same whether the transaction passes or fails to simplify verification.