Method for Forming Multilayer Film and Apparatus for Forming Multilayer Film
    1.
    发明申请
    Method for Forming Multilayer Film and Apparatus for Forming Multilayer Film 审中-公开
    用于形成多层膜的方法和用于形成多层膜的装置

    公开(公告)号:US20100038234A1

    公开(公告)日:2010-02-18

    申请号:US12519712

    申请日:2007-12-17

    IPC分类号: C23C14/34 C23C14/06

    摘要: A multilayer thin film formation method and a multilayer thin film formation apparatus that improve dielectric characteristics and piezoelectric characteristics of a thin film formed from a lead-based perovskite complex oxide. The multilayer thin film formation method includes formation of a lower electrode layer (32b) containing a noble metal above a substrate (S) by sputtering a lower electrode layer target (TG2), and superposing a lead-based complex oxide layer (33) on the lower electrode layer (32b) by sputtering an oxide layer target (TG3) containing lead. The lower electrode layer (32b) has a thickness restricted to 10 to 30 nm, and the lead-based complex oxide layer (33) has a thickness restricted to 0.2 and 5.0 μm.

    摘要翻译: 一种提高由铅系钙钛矿复合氧化物形成的薄膜的介电特性和压电特性的多层薄膜形成方法和多层薄膜形成装置。 多层薄膜形成方法包括通过溅射下电极层靶(TG2),在基底(S)上方形成含有贵金属的下电极层(32b),并将引线基复合氧化物层(33)叠加在 通过溅射含有铅的氧化物层靶(TG3)来形成下电极层(32b)。 下部电极层(32b)的厚度为10〜30nm,铅系复合氧化物层(33)的厚度为0.2〜5.0μm。

    Multilayer Film Forming Method and Multilayer Film Forming Apparatus
    2.
    发明申请
    Multilayer Film Forming Method and Multilayer Film Forming Apparatus 审中-公开
    多层成膜方法和多层成膜装置

    公开(公告)号:US20090294280A1

    公开(公告)日:2009-12-03

    申请号:US12522356

    申请日:2007-12-20

    IPC分类号: C23C14/34

    摘要: A multilayer film formation method enables the formation of a multilayer including a complex oxide layer and having the desired shape of an element without performing an etching process. The method positions a first mask (30A) above a substrate (S), forms an adhesion layer (36) and a lower electrode layer (37) on the substrate with the first mask by sputtering an adhesion layer target (T1) and a lower electrode layer target (T2), positions a second mask (30B) formed from a ceramic material above the lower electrode layer, superimposes a complex oxide layer (38) on the lower electrode layer with the second mask by sputtering an oxide layer target (T3), positions a third mask (30C) above the complex oxide layer, and superimposes an upper electrode layer (39) on the complex oxide layer with the third mask by sputtering an upper electrode layer target (T4).

    摘要翻译: 多层膜形成方法能够形成包括复合氧化物层并且具有所需形状的元件的多层而不进行蚀刻工艺。 该方法将第一掩模(30A)定位在衬底(S)上方,通过溅射粘附层靶(T1)和下层(T1),在第一掩模上在衬底上形成粘合层(36)和下电极层(37) 将由陶瓷材料形成的第二掩模(30B)定位在下部电极层的上方,通过溅射氧化物层靶(T3)将复合氧化物层(38)与第二掩模重叠在下部电极层上 ),在复合氧化物层上方设置第三掩模(30C),并通过溅射上电极层靶(T4)将上电极层(39)与第三掩模叠加在复合氧化物层上。

    Film-forming apparatus and film-forming method
    3.
    发明授权
    Film-forming apparatus and film-forming method 有权
    成膜装置及成膜方法

    公开(公告)号:US08168001B2

    公开(公告)日:2012-05-01

    申请号:US10417139

    申请日:2003-04-17

    摘要: Film-forming apparatus including a film-forming vacuum chamber having a stage for a substrate, a chamber for mixing gas comprising a raw gas and a reactive gas connected to the film-forming chamber, a chamber for vaporizing the raw material, and a gas head for introducing the mixed gas into the film-forming chamber, disposed on the upper face of the film-forming chamber and opposed to the stage. Particle traps with controllable temperatures are positioned between the vaporization chamber and the mixing chamber and on the downstream side of the mixing chamber. When forming a thin film with the apparatus, a reactive gas and/or a carrier gas are passed through the film-forming chamber while opening a valve in a by-pass line, connecting the primary side to the secondary side of the particle trap arranged at the downstream side of the mixing chamber. The valve is then closed and the film-forming operation is initiated.

    摘要翻译: 一种成膜装置,其特征在于,具备:具有基板台的成膜用真空室,将含有原料气体的气体和与所述成膜室连接的反应性气体混合的室,将所述原料蒸发的室, 用于将混合气体引入成膜室,其设置在成膜室的上表面上并且与该台相对。 具有可控温度的颗粒捕集器位于蒸发室和混合室之间以及混合室的下游侧。 当用该装置形成薄膜时,反应气体和/或载气通过成膜室,同时打开旁通管线中的阀,将初级侧与次级侧连接,将颗粒捕集器的二次侧排列 在混合室的下游侧。 然后关闭阀门,并开始成膜操作。