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    ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA
    2.
    发明申请
    ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA 失效
    数据中识别系统的迭代过程

    公开(公告)号：US20070226566A1

    公开(公告)日：2007-09-27

    申请号：US11277422

    申请日：2006-03-24

    申请人： Maroun Kassab ,  Leah Pfeifer Pastel

    发明人： Maroun Kassab ,  Leah Pfeifer Pastel

    IPC分类号： G01R31/28

    CPC分类号： G01R31/3183 ,  G01R31/31703

    摘要： An iterative process for identifying systematics in data is provided. In general, a set of data is processed based on a signature definition to create a set of signature data. The set of signature data is then analyzed to identify common signatures. The set of signature data is modified, using knowledge of the common signature(s), creating a revised set of signature data. The revised set of signature data is then analyzed again to identify new common signatures, if any. The modifying and analyzing steps are repeated until no new common signatures are identified. When no new common signatures are identified, the identified common signatures are reported.

    摘要翻译： 提供了一种用于识别数据中的系统性的迭代过程。 通常，基于签名定义处理一组数据以创建一组签名数据。 然后分析该组签名数据以识别公共签名。 使用公共签名的知识来修改签名数据集，创建经修改的签名数据集。 然后再次分析经修订的签名数据集，以识别新的公共签名（如果有的话）。 重复修改和分析步骤，直到找不到新的公共签名。 当没有识别出新的共同签名时，报告所识别的共同签名。

    METHODS AND APPARATUS FOR TESTING A SCAN CHAIN TO ISOLATE DEFECTS
    3.
    发明申请
    METHODS AND APPARATUS FOR TESTING A SCAN CHAIN TO ISOLATE DEFECTS 失效
    用于测试扫描链以分离缺陷的方法和装置

    公开(公告)号：US20080059857A1

    公开(公告)日：2008-03-06

    申请号：US11924597

    申请日：2007-10-25

    申请人： LEENDERT HUISMAN ,  William Huott ,  Maroun Kassab ,  Franco Motika

    发明人： LEENDERT HUISMAN ,  William Huott ,  Maroun Kassab ,  Franco Motika

    IPC分类号： G01R31/28

    CPC分类号： G01R31/318533

    摘要： Systems, methods and apparatus are provided for isolating a defect in a scan chain. The invention includes modifying a first test mode of a plurality of latches included in a scan chain, operating the latches in the modified first test mode, and operating the plurality of latches included in the scan chain in a second test mode. A portion of the scan chain adjacent and following a stuck-@-0 or stuck-@-1 fault in the scan chain may store and/or output a value complementary to the value on the output of the previous portion of the scan chain due to the fault. Such values may be unloaded from the scan chain and used for diagnosing (e.g., isolating a defect in) the defective scan chain. Numerous other aspects are provided.

    摘要翻译： 提供了用于隔离扫描链中的缺陷的系统，方法和装置。 本发明包括修改包括在扫描链中的多个锁存器的第一测试模式，在修改的第一测试模式下操作锁存器，以及在第二测试模式下操作包括在扫描链中的多个锁存器。 扫描链中与扫描链相邻并跟随卡纸 - @ - 0或卡住 - - - 1故障的部分扫描链可以存储和/或输出与扫描链的先前部分的输出值相匹配的值， 到了错误。 这些值可以从扫描链中卸载并用于诊断（例如，分离缺陷）缺陷扫描链。 提供了许多其他方面。

    METHODS AND APPARATUS FOR DEFECT ISOLATION
    4.
    发明申请
    METHODS AND APPARATUS FOR DEFECT ISOLATION 失效
    缺陷分离方法与装置

    公开(公告)号：US20050193297A1

    公开(公告)日：2005-09-01

    申请号：US10708380

    申请日：2004-02-27

    申请人： Leendert Huisman ,  William Huott ,  Maroun Kassab ,  Franco Motika

    发明人： Leendert Huisman ,  William Huott ,  Maroun Kassab ,  Franco Motika

    IPC分类号： G01R31/28 ,  G01R31/3185

    CPC分类号： G01R31/318533

    摘要： In a first aspect, a first method is provided for isolating a defect in a scan chain. The first method includes the steps of (1) modifying a first test mode of one or more of a plurality of latches included in the scan chain; (2) operating the one or more latches whose first test modes are modified in the modified first test mode; and (3) operating one or more of the plurality of latches included in the scan chain in a second test mode. Numerous other aspects are provided.

    摘要翻译： 在第一方面，提供了用于隔离扫描链中的缺陷的第一方法。 第一种方法包括以下步骤：（1）修改包括在扫描链中的多个锁存器中的一个或多个的第一测试模式; （2）在修改后的第一测试模式下操作其第一测试模式被修改的一个或多个锁存器; 以及（3）在第二测试模式中操作包括在扫描链中的多个锁存器中的一个或多个。 提供了许多其他方面。

    Identifying defects
    5.
    发明授权
    Identifying defects 有权
    识别缺陷

    公开(公告)号：US08571299B2

    公开(公告)日：2013-10-29

    申请号：US12871039

    申请日：2010-08-30

    申请人： Mohammed F. Fayaz ,  Julie L. Lee ,  Leah M. Pastel ,  Maroun Kassab

    发明人： Mohammed F. Fayaz ,  Julie L. Lee ,  Leah M. Pastel ,  Maroun Kassab

    IPC分类号： G06K9/00

    CPC分类号： G01N21/95607 ,  G01N2021/8864 ,  H01L22/12 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

    摘要： Identifying systematic defects in wafer processing including performing defect inspection of a plurality of wafers, identifying defects in each of the plurality of wafers as not being associated with a trivial and/or known root cause, determining a physical location on each wafer where each of the defects occurs and correlating the physical locations where each of the defects occurs with cell instances defined for those physical locations.

    摘要翻译： 识别晶片处理中的系统缺陷，包括执行多个晶片的缺陷检查，将多个晶片中的每一个中的缺陷识别为不与平凡和/或已知的根本原因相关联，确定每个晶片上的每个晶片上的物理位置 发生缺陷，并将每个缺陷发生的物理位置与为这些物理位置定义的单元格实例相关联。

    IDENTIFYING DEFECTS
    6.
    发明申请
    IDENTIFYING DEFECTS 有权
    识别缺陷

    公开(公告)号：US20120050728A1

    公开(公告)日：2012-03-01

    申请号：US12871039

    申请日：2010-08-30

    申请人： Mohammed F. Fayaz ,  Maroun Kassab ,  Julie L. Lee ,  Leah M. Pastel

    发明人： Mohammed F. Fayaz ,  Maroun Kassab ,  Julie L. Lee ,  Leah M. Pastel

    IPC分类号： G01N21/00 ,  G06F19/00

    CPC分类号： G01N21/95607 ,  G01N2021/8864 ,  H01L22/12 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

    摘要： Identifying systematic defects in wafer processing including performing defect inspection of a plurality of wafers, identifying defects in each of the plurality of wafers as not being associated with a trivial and/or known root cause, determining a physical location on each wafer where each of the defects occurs and correlating the physical locations where each of the defects occurs with cell instances defined for those physical locations.

    摘要翻译： 识别晶片处理中的系统缺陷，包括执行多个晶片的缺陷检查，将多个晶片中的每一个中的缺陷识别为不与平凡和/或已知的根本原因相关联，确定每个晶片上的每个晶片上的物理位置 发生缺陷，并将每个缺陷发生的物理位置与为这些物理位置定义的单元格实例相关联。

    Method for determining features associated with fails of integrated circuits
    7.
    发明授权
    Method for determining features associated with fails of integrated circuits 有权
    确定与集成电路故障相关的特征的方法

    公开(公告)号：US07870519B2

    公开(公告)日：2011-01-11

    申请号：US11941998

    申请日：2007-11-19

    申请人： Rao H. Desineni ,  Maroun Kassab ,  Leah Marie Pfeifer Pastel

    发明人： Rao H. Desineni ,  Maroun Kassab ,  Leah Marie Pfeifer Pastel

    IPC分类号： G06F17/50 ,  G01R31/28

    CPC分类号： G01R31/318342

    摘要： A method for testing an integrated circuit and analyzing test data. The method includes: defining a set of signal path selection criteria; selecting a subset of signal paths of an integrated circuit design, the selecting signal paths meeting the selection criteria; identifying pattern observation points for each signal path of the subset of signal paths; selecting a set of features associated with the integrated circuit design; applying a set of test patterns to one or more integrated circuit chips; determining failing signal paths of the subset of signal paths for each integrated circuit chip; mapping failing signal paths of the subset of signal paths to the set of features to generate a correspondence between the failing signal paths and the features; and analyzing the correspondence and identifying suspect features of the set of features based on the analyzing.

    摘要翻译： 一种用于测试集成电路并分析测试数据的方法。 该方法包括：定义一组信号路径选择标准; 选择集成电路设计的信号路径的子集，所述选择信号路径满足选择标准; 识别信号路径子集的每个信号路径的模式观察点; 选择与集成电路设计相关的一组特征; 将一组测试图案应用于一个或多个集成电路芯片; 确定每个集成电路芯片的信号路径子集的失败信号路径; 将所述信号路径子集的故障信号路径映射到所述特征集合，以产生所述故障信号路径和所述特征之间的对应关系; 并基于分析，分析对应关系并识别该组特征的可疑特征。

    METHOD FOR TESTING INTEGRATED CIRCUITS
    8.
    发明申请
    METHOD FOR TESTING INTEGRATED CIRCUITS 有权
    测试集成电路的方法

    公开(公告)号：US20110214102A1

    公开(公告)日：2011-09-01

    申请号：US13102249

    申请日：2011-05-06

    申请人： Rao H. Desineni ,  Maroun Kassab ,  Franco Motika ,  Leah Marie Pfeifer Pastel

    发明人： Rao H. Desineni ,  Maroun Kassab ,  Franco Motika ,  Leah Marie Pfeifer Pastel

    IPC分类号： G06F17/50

    CPC分类号： G01R31/31835

    摘要： A method of testing an integrated circuit. The method includes selecting a set of physical features of nets and devices of the integrated circuit, the integrated circuit having pattern input points and pattern observation points connected by the nets, each of the nets defined by an input point and all fan out paths to (i) input points of other nets of the nets or (ii) to the pattern observation points; selecting a measurement unit for each feature of the set of features; assigning a weight to each segment of each fan out path based on a number of the measurement units of the feature in each segment of each fan out path of each of the nets; and generating a set of test patterns optimized for test-coverage and cost based on the weights assigned to each segment of each of the nets of the integrated circuit.

    摘要翻译： 一种集成电路测试方法。 该方法包括选择集成电路的网络和设备的一组物理特征，集成电路具有由网络连接的模式输入点和模式观察点，每个网络由输入点定义，并且所有扇出路径到（ i）网的其他网的输入点或（ii）到模式观察点; 为特征集合中的每个特征选择测量单元; 基于每个网络的每个扇出路径的每个段中的特征的测量单元的数量，为每个扇出路径的每个段分配权重; 以及基于分配给集成电路的每个网络的每个段的权重，生成针对测试覆盖和成本优化的一组测试模式。

    System and method for signature-based systematic condition detection and analysis
    10.
    发明授权
    System and method for signature-based systematic condition detection and analysis 失效
    基于签名的系统状态检测和分析的系统和方法

    公开(公告)号：US07853848B2

    公开(公告)日：2010-12-14

    申请号：US11875975

    申请日：2007-10-22

    申请人： Rao H. Desineni ,  Maroun Kassab ,  Leah M. Pastel

    发明人： Rao H. Desineni ,  Maroun Kassab ,  Leah M. Pastel

    IPC分类号： G01R31/28 ,  G01R31/30 ,  G01R31/26 ,  G01R31/08 ,  G06F17/50

    CPC分类号： G01R31/318321

    摘要： Disclosed are embodiments of a system, method and service for detecting and analyzing systematic conditions occurring in manufactured devices. Each embodiment comprises generating a unique signature for each of multiple tested devices. The signatures are generated based on an initial set of signature definitions and the values for those signature definitions that are derived at least in part from selected testing data. A systematic condition is detected based on commonalities between the signatures. The systematic condition is then analyzed, alone or in conjunction with additional information, in order to develop a list of underlying similarities between the devices. The analysis results can be used to refine the systematic condition detection and analysis processes by revising the signature definitions set and/or by modifying data selection.

    摘要翻译： 公开了用于检测和分析在制造的装置中发生的系统状况的系统，方法和服务的实施例。 每个实施例包括为多个被测试设备中的每一个产生唯一的签名。 基于签名定义的初始集合以及至少部分地从选定的测试数据导出的那些签名定义的值来生成签名。 基于签名之间的共同点检测系统条件。 然后单独或与附加信息一起分析系统条件，以便开发设备之间的基本相似性列表。 分析结果可用于通过修改签名定义集和/或通过修改数据选择来完善系统状态检测和分析过程。