Selectively protecting a register file
    1.
    发明授权
    Selectively protecting a register file 失效
    选择性地保护寄存器文件

    公开(公告)号:US07689804B2

    公开(公告)日:2010-03-30

    申请号:US11642337

    申请日:2006-12-20

    IPC分类号: G06F12/10

    CPC分类号: G06F11/1008

    摘要: In one embodiment, the present invention includes a method for protecting a value to be stored in a register of a register file with a first level of protection if the value is predicted to be used for a first time period, and protecting the value with a second level of protection if the value is predicted to be used for a second time period. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种方法,用于如果该值预测将在第一时间段内使用,则保护要存储在具有第一保护等级的寄存器文件的寄存器中的值,并且用 如果该值被预测用于第二时间段,则为第二级保护。 描述和要求保护其他实施例。

    Dynamically Estimating Lifetime of a Semiconductor Device
    2.
    发明申请
    Dynamically Estimating Lifetime of a Semiconductor Device 有权
    动态估计半导体器件的寿命

    公开(公告)号:US20090287909A1

    公开(公告)日:2009-11-19

    申请号:US12086357

    申请日:2005-12-30

    IPC分类号: G06F15/00

    CPC分类号: G06F11/008 G01R31/2846

    摘要: In one embodiment, the present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于获得诸如处理器的半导体器件的动态操作参数信息的方法,基于动态操作参数确定设备的整体或一个或多个部分的动态使用 信息,并基于动态使用动态估计设备的剩余寿命。 根据估计的剩余寿命,可以以期望的方式控制装置。 描述和要求保护其他实施例。

    Reducing Aging Effect On Registers
    3.
    发明申请
    Reducing Aging Effect On Registers 有权
    减少老化对登记的影响

    公开(公告)号:US20090150656A1

    公开(公告)日:2009-06-11

    申请号:US11791145

    申请日:2006-11-03

    IPC分类号: G06F9/30

    CPC分类号: G11C7/04

    摘要: Methods and apparatus to reduce aging effect on registers are described. In one embodiment, a select value is stored in a register that is unused, for example, to reduce the effects of negative bias temperature instability (NBTI) or oxide degradation on the register. Other embodiments are also described.

    摘要翻译: 描述了减少对寄存器的老化影响的方法和装置。 在一个实施例中,选择值存储在未使用的寄存器中,例如以减少负偏压温度不稳定性(NBTI)或寄存器中的氧化物劣化的影响。 还描述了其它实施例。

    Detecting Soft Errors Via Selective Re-Execution
    4.
    发明申请
    Detecting Soft Errors Via Selective Re-Execution 有权
    通过选择性重新执行检测软错误

    公开(公告)号:US20090113240A1

    公开(公告)日:2009-04-30

    申请号:US12224762

    申请日:2006-03-31

    IPC分类号: G06F11/14 G06F11/28

    CPC分类号: G06F11/008 G06F11/1497

    摘要: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于确定在处理器中执行的指令的漏洞级别的方法,以及如果漏洞级别高于阈值则重新执行该指令。 漏洞级别可能对应于指令在处理器中时指令的软错误可能性。 描述和要求保护其他实施例。

    Reducing aging effect on registers
    5.
    发明授权
    Reducing aging effect on registers 有权
    降低对寄存器的老化效应

    公开(公告)号:US08578137B2

    公开(公告)日:2013-11-05

    申请号:US11791145

    申请日:2006-11-03

    IPC分类号: G06F12/00

    CPC分类号: G11C7/04

    摘要: Methods and apparatus to reduce aging effect on registers are described. In one embodiment, a select value is stored in a register that is unused, for example, to reduce the effects of negative bias temperature instability (NBTI) or oxide degradation on the register. Other embodiments are also described.

    摘要翻译: 描述了减少对寄存器的老化影响的方法和装置。 在一个实施例中,选择值存储在未使用的寄存器中,例如以减少负偏压温度不稳定性(NBTI)或寄存器中的氧化物劣化的影响。 还描述了其它实施例。

    PROTECTING DATA STORAGE STRUCTURES FROM INTERMITTENT ERRORS
    6.
    发明申请
    PROTECTING DATA STORAGE STRUCTURES FROM INTERMITTENT ERRORS 有权
    保护来自间歇错误的数据存储结构

    公开(公告)号:US20090037783A1

    公开(公告)日:2009-02-05

    申请号:US11833765

    申请日:2007-08-03

    IPC分类号: G06F11/16 G06F11/10

    CPC分类号: G06F11/1008 G06F11/1405

    摘要: Embodiments of apparatuses and methods for protecting data storage structures from intermittent errors are disclosed. In one embodiment, an apparatus includes a plurality of data storage locations, execution logic, error detection logic, and control logic. The execution logic is to execute an instruction to generate a data value to store in one of the data storage locations. The error detection logic is to detect an error in the data value stored in the data storage location. The control logic is to respond to the detection of the error by causing the execution logic to re-execute the instruction to regenerate the data value to store in the data storage location, causing the error detection logic to check the data value read from the data storage location, and deactivating the data storage location if another error is detected.

    摘要翻译: 公开了用于保护数据存储结构免于间歇性错误的装置和方法的实施例。 在一个实施例中,装置包括多个数据存储位置,执行逻辑,错误检测逻辑和控制逻辑。 执行逻辑是执行指令以生成数据值以存储在数据存储位置之一中。 错误检测逻辑是检测数据存储位置中存储的数据值中的错误。 控制逻辑是通过使执行逻辑重新执行用于重新生成数据值以存储在数据存储位置的指令来响应错误的检测,使得错误检测逻辑检查从数据读取的数据值 存储位置,如果检测到另一个错误,则停用数据存储位置。

    NBTI-resilient memory cells with NAND gates
    7.
    发明授权
    NBTI-resilient memory cells with NAND gates 有权
    具有NAND门的NBTI弹性存储单元

    公开(公告)号:US07447054B2

    公开(公告)日:2008-11-04

    申请号:US11611344

    申请日:2006-12-15

    IPC分类号: G11C17/00

    CPC分类号: G11C11/412 G11C11/56

    摘要: An NBTI-resilient memory cell is made up of a ring of multiple NAND gates. The NAND gates are arranged such that one of the NAND gates has a “0” in its output, while the remaining NAND gates have a “1” in their outputs. PMOS transistors within the memory cell experience less degradation than in inverter-based memory cells. Guard-banding to account for transistor degradation may be mitigated, or the operating frequency of the memory cell may be increased.

    摘要翻译: NBTI弹性存储单元由多个NAND门的环组成。 NAND门被布置成使得一个NAND门在其输出中具有“0”,而其余的NAND门在其输出中具有“1”。 存储器单元内的PMOS晶体管比基于逆变器的存储单元中的PMOS晶体管的衰减更少。 可以减轻保护带以解决晶体管劣化,或者可以增加存储单元的工作频率。

    Enhancing Reliability of a Many-Core Processor
    10.
    发明申请
    Enhancing Reliability of a Many-Core Processor 有权
    提高多核处理器的可靠性

    公开(公告)号:US20090094481A1

    公开(公告)日:2009-04-09

    申请号:US12224108

    申请日:2006-02-28

    IPC分类号: G06F9/50 G06F11/20

    摘要: In one embodiment, the present invention includes a method for identifying available cores of a many-core processor, allocating a first subset of the cores to an enabled state and a second subset of the cores to a spare state, and storing information regarding the allocation in a storage. The allocation of cores to the enables state may be based on a temperature-aware algorithm, in certain embodiments. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于识别多核处理器的可用核心的方法,将核心的第一子集分配给启用状态,将核心的第二子集分配到备用状态,以及存储关于分配的信息 在一个存储。 在某些实施例中,将核分配到启用状态可以基于温度感知算法。 描述和要求保护其他实施例。