摘要:
An integrated circuit digital-to-analog converter includes a nichrome feedback resistor having .+-.1% accuracy in its output amplifier, a plurality of bit current determining resistors that have .+-.30% manufacturing accuracy, a bias voltage circuit that produces a temperature-compensated bias voltage including an integrated potentiometer that is laser trimmed to compensate for the inaccuracy of the bit current determining resistors. The bit current determining resistors thereby produce constant, precise temperature-independent bit currents. The integrated potentiometer is accurately laser trimmed without changing the series resistance of the potentiometer. This prevents current density changes that change the temperature sensitivity of temperature-compensating elements in the bias voltage circuit.
摘要:
A low voltage sixteen bit digital-to-analog converter operable between +5 and -5 volt power supplies and capable of providing output voltage levels to within about 1.4 volts of +V.sub.CC and -V.sub.CC includes a push-pull output stage with only a pullup transistor and a pulldown transistor connected in series between the positive and negative supply voltages. The output stage includes circuitry that reduces the base voltage of the pullup transistor or pulldown transistor enough to reduce its collector current to near zero, greatly increasing its effective collector-to-emitter breakdown voltage.
摘要:
An open-loop voltage reference circuit, adapted to regulate a plurality of bit switch currents within a digital-to-analog converter, includes a zener diode reference leg for developing a reference voltage. The reference leg also includes a base-emitter junction voltage multiplier for creating a compensating voltage having a temperature tracking coefficient that is equal and opposite to that of the zener diode junction voltage. The reference voltage developed by the reference leg is used to bias a temperature independent current within a slave leg, and a current mirror circuit mirrors the current within the slave leg for supplying a constant current to the reference leg. The magnitude of the reference voltage is reduced through a divider leg, and an emitter follower leg provides a low impedance bias voltage for driving the plurality of bit switch current sources. The open-loop voltage reference circuit is further adapted to compensate for second order errors caused by temperature induced variations in current gain and Early effect variations related to changes in the power supply voltage. A Gain Adjust feature is also provided for adjusting the bit switch currents without adversely affecting the regulation thereof.
摘要:
A dual successive approximation analog-to-digital converter, including circuitry for generating separate reference voltages for each analog-to-digital converter, is integrated onto a single semiconductor chip. A single successive approximation register including a 19 bit shift register and two 18 bit latches and associated gating circuitry operates to produce two sets of 18 successive approximation numbers, one supplied as successive digital inputs to a CDAC of one of the analog-to-digital converters and the other set of successive approximation numbers being applied as digital inputs to a CDAC of the other analog-to-digital converter. A CMOS comparator includes two high speed, low gain differential amplifier stages, the first including cascode MOSFETs to provide a high power supply rejection. A pair of auto-zeroing capacitors and a pair of auto-zeroing MOSFETs operate on the outputs of the second differential amplifier to reduce input offset voltage, achieving high speed, low noise operation in a small amount of semiconductor chip area. The auto-zeroed output is supplied to the input of a two stage differential amplifier, the outputs of which also are auto-zeroed and applied to a differential CMOS latch, thereby providing a high speed, low noise, low offset CMOS comparator.
摘要:
A digital-to-analog converter includes an input circuit (9) producing a plurality of corresponding switch control signals (25) in response to a digital input signal (D.sub.IN) and a resistive ladder network (10A) including an R/2R MSB ladder section (2) including a plurality of "R" resistors (17) and a plurality of "2R" resistors (5), and an R/2R LSB ladder section (3) including a plurality of "R" resistors (17) and a plurality of "2R" resistors (5). A scaling resistor (21) is coupled between a least significant node conductor (7-3) of the MSB ladder section and a most significant node conductor (7-4) of the LSB ladder section. A plurality of switch circuits (6) each selectively conducts a respective parallel resistor circuit (5) to a first reference voltage conductor (VREFH) or a second reference voltage conductor (VREFL) in response to the various switch control signals (25). The resistances of the resistors of the "R" resistors of the MSB ladder section are different than the resistances of the resistors of the "R" resistors of the LSB ladder section. The resistances of the "R" resistors of the MSB ladder section, the resistances of the "R" resistors of the LSB ladder section, and the resistance of the scaling resistor are related by the expression R"=2R-R', where R" is the resistance of a scaling resistor, R is the resistance of the "R" resistors of the MSB ladder section, and R' is the resistance of the "R" resistors of the LSB ladder section.
摘要:
A digital-to-analog converter includes a resistive divider network including a plurality of series resistors of resistance R and a plurality of shunt resistors of resistance 2R' and a circuit for switching a shunt resistor of the resistive divider network in the digital-to-analog converter to either of first and second reference voltages. The switching circuit includes a first switch MOSFET coupling the low reference voltage to the shunt resistor, and a second switch MOSFET coupling the shunt resistor to the high reference voltage. First and second switch control circuits adjust the on resistances of the first and second switch MOSFETs to be proportional to the resistances of first and second reference resistors, which have the same temperature coefficient as the resistors of which the divider network is composed. The on resistance of each of the first and second switch MOSFETs is equal to R.sub.ONi, and the resistance 2R' is equal to 2R-R.sub.ONi. The on resistances do not need to be binarily scaled.
摘要:
A system for automatically calibrating a main digital to analog converter (DAC) includes first and second adjustment DAC's, an offset DAC, a difference amplifier, an analog to digital converter (ADC), a microprocessor, and an analog switch. To calibrate the offset of the main DAC, the microprocessor causes "zeros" to be applied to the digital inputs of the main DAC and the offset DAC. The output of the offset DAC is coupled to an input of the difference amplifier. The microprocessor causes a ground voltage to be applied to the second input of the difference amplifier via the analog switch. The output of the difference amplifier is inputted to the ADC, which produces a first word. The first word is stored by the microprocessor. The analog switch is activated to apply the analog output voltage of the main DAC to the second input of the difference amplifier. The ADC produces a second word which is compared to the first word. The microprocessor computes a first correction word which is transmitted to the first adjustment DAC. The first adjustment DAC produces a corresponding analog signal which is applied to a first correction input of the main DAC, causing the analog output voltage to be adjusted toward the ground voltage. To calibrate the linearity of the main DAC, the microprocessor causes the analog voltage corresponding to the fourth most significant bit to be converted to a third digital word by means of the ADC, and then causes the analog output voltage corresponding to the sum of the less significant bits to be converted to a fourth word by means of the ADC. The difference between the third and fourth words is used by the microprocessor to compute a second correction code. The second correction code is converted to a second analog correction signal by the second DAC, causing the third analog output voltage to differ from the second analog output voltage by an amount corresponding to one least significant bit.
摘要:
A circuit for preventing analog-to-digital conversion errors due to MOS threshold shifts produced in a comparator during successive approximation testing of MSB and LSB groups of binarily weighted bit capacitors includes a first amplifier that amplifies voltage changes produced on a charge distribution conductor connected to the bit capacitors during successive approximation testing of the bit capacitors of the MSB group. The output of the first amplifier subjects a MOSFET in an input stage of the comparator to sufficiently large gate-to-source voltages to produce an MOS threshold shift in the MOSFET. During successive approximation testing of bit capacitors of the LSB group, a second amplifier amplifies signals representative of voltage changes produced on the charge distribution conductor and applies the amplified signals to the same MOSFET. The second amplifier has a sufficiently large gain that the earlier induced MOS threshold shift, when referred back to an input of the amplifier by dividing the MOS threshold shift by the gain, is small enough compared to the voltage changes produced on the charge distribution conductor during the successive approximation testing of the bit capacitors of the LSB group to avoid conversion errors.
摘要:
In a digital to analog converter, a circuit for improving the performance of digital to analog converters by reducing and minimizing the variation in analog ground current is disclosed. The resulting digital to analog converter has reduced variation in output signal, the digital to analog converter can provide a more accurate representation of the input digital signal.
摘要:
A digital-to-analog converter circuit includes an open-loop reference circuit for regulating a plurality of bit switch currents and utilizes a high-speed single-ended input interface network for level shifting digital input signals to the bit switches whereat the level shifted input signals switch against a substantially fixed threshold voltage. The single-ended input interface network includes a PNP input transistor coupled to an input terminal and coupled by a resistor to a regulated voltage. The PNP input transistor is coupled to a level shifting network including an emitter follower transistor and a zener junction biased by a current source. The threshold voltage is also developed by a level shifting network that includes a zener junction for compensating variations within the level shifting network of the single-ended input interface network.