摘要:
A low voltage sixteen bit digital-to-analog converter operable between +5 and -5 volt power supplies and capable of providing output voltage levels to within about 1.4 volts of +V.sub.CC and -V.sub.CC includes a push-pull output stage with only a pullup transistor and a pulldown transistor connected in series between the positive and negative supply voltages. The output stage includes circuitry that reduces the base voltage of the pullup transistor or pulldown transistor enough to reduce its collector current to near zero, greatly increasing its effective collector-to-emitter breakdown voltage.
摘要:
An integrated circuit digital-to-analog converter includes a nichrome feedback resistor having .+-.1% accuracy in its output amplifier, a plurality of bit current determining resistors that have .+-.30% manufacturing accuracy, a bias voltage circuit that produces a temperature-compensated bias voltage including an integrated potentiometer that is laser trimmed to compensate for the inaccuracy of the bit current determining resistors. The bit current determining resistors thereby produce constant, precise temperature-independent bit currents. The integrated potentiometer is accurately laser trimmed without changing the series resistance of the potentiometer. This prevents current density changes that change the temperature sensitivity of temperature-compensating elements in the bias voltage circuit.
摘要:
A micromachined capacitor structure having a first anchor (12) attached to the substrate (24), a tether (13) coupled to the anchor (12) and having a portion free to move in a lateral direction over the substrate (24) in response to acceleration. A tie-bar (14) is coupled to the movable portion of the tether (13), and at least one movable capacitor plate (16) is coupled to the tie bar (13). A first fixed capacitor plate (16) is attached to the substrate (24) laterally overlapping and vertically spaced from the at least one movable capacitor plate (16).
摘要:
A programmable multiple current source includes a plurality of current source circuits each having current level data storage circuitry. A current level data input terminal and a control input terminal are connected to each current source circuit to supply current level data to the storage circuitry. Peak detector and storage circuitry is coupled to each of the output terminals of the current source circuits. Each associated current source circuit includes a master digital-to-analog converter coupled to the current level data storage circuitry, a driver circuit coupled to the digital-to-analog converter and to the associated current source circuit, comparator and storage circuitry having a first input coupled to the peak detector and storage circuitry and a second input coupled to the driver circuit, and current level adjustment circuitry coupled to the comparator and storage circuitry and the driver circuit.
摘要:
An Input/Output (I/O) circuit (11) for an integrated circuit including Electrostatic Discharge Protection (ESD) circuitry is disclosed. A Silicon Controlled Rectifier SCR (30) is triggered by a transistor (36) which is scaled to an output transistor (24) of the I/O circuit (11) to shunt an ESD event. The SCR (30) couples between a pad (12) and a power supply line V.sub.SS. The transistor (36) is disabled. The triggering mechanism is voltage breakdown of the transistor (36) due to an ESD event. The SCR protection mechanism is process independent since the triggering mechanism is formed similarly to the output transistor (24) and thus breaks-down similarly. Zener diodes (26-29) are coupled to gates of the I/O circuit (11) and between the power supply lines. A phosphorous doping less than 5.0 E18 per cubic centimeter is used to form the cathode of zener diodes (26-29).
摘要:
A current source with adjustable temperature compensation in which the level of current supplied to a load is adjusted to compensate for the load's inherent change in performance with changes in temperature. The current source allows selection of the appropriate temperature compensating characteristic and operating current solely by altering internal component values.
摘要:
A memory circuit (24) limits the threshold voltage distribution for either programming or erasing a memory cell (40A) in a non-volatile memory array (34). A data latch (90) provides a current (I.sub.REF) to the memory cell (40A) that increases in current as the operating temperature of the memory cells (40A, 40B) increases. Current generated by the data latch (90) increases when the processing parameters cause a greater conductivity of the transistors in the memory cell (40A) and the current decreases when the processing parameters cause a lesser conductivity of the transistors in the memory cell (40A), thus allowing narrower limits on the distribution of the program and erase threshold voltages.
摘要:
A circuit (28) and method of sensing data stored in a memory circuit provide a reference current (I.sub.REF) that tracks memory cell current (I.sub.BIT) over a range of temperatures and power supply voltages. A comparator circuit (66) senses the memory cell current with respect to the reference current to produce the stored data (V.sub.DATA) By sensing current rather than voltage, the voltage swing on a high capacitance bitline (39) can be reduced to improve speed. The reference current is set during testing of the circuit by applying programming voltages (V.sub.WELL, V.sub.CG, V.sub.BL) to a reference device (52) that matches a storage device (36) in the memory cell (30).
摘要:
A memory circuit (24) includes a sense amp circuit (30) that uses multiplexers (86) in a column mux (32) for pre-charging only selected bitlines in order to limit the current during a read operation of the FLASH memory circuit (24). The sense amp circuit (30) provides the bitline with a pre-charge voltage that is set by a current reference (68) that is substantially supply independent. In the read mode the sense amp circuit (30) responds to either a voltage on the bitline that is lowered from the pre-charge voltage value by a selected programmed memory cell (40) or by a voltage that remains at the pre-charged voltage value for an unprogrammed memory cell.
摘要:
A multi-leaded protected power device having a boot-strap input has been provided. The power device includes a current controlled, boot-strap driven control die (20) for use with a power transistor (25). The control die includes an under voltage lock-out circuit (46) which inhibits drive to the power transistor until the input signals exceed a predetermined threshold level. Moreover, the control die includes a noise immunity enhancement circuit (56) for providing an excess reverse bias across an output SCR (58) for preventing false triggering of the output SCR. The power device further includes a status output lead (204) for indicating when a voltage occurring across the power transistor has exceeded a predetermined threshold, and a current output lead (220) for providing a current that is proportional to a current flowing through the power transistor.