System and method for low coherence broadband quadrature interferometry
    1.
    发明授权
    System and method for low coherence broadband quadrature interferometry 失效
    低相干宽带正交干涉测量系统和方法

    公开(公告)号:US07019838B2

    公开(公告)日:2006-03-28

    申请号:US10855652

    申请日:2004-05-28

    IPC分类号: G01B9/02

    摘要: A quadrature broadband interferometry system and method obtains a complete complex interferometric signal instantaneously in both homodyne and heterodyne systems in a simple, compact, and inexpensive setup. This is accomplished by separating interferometric components from non-interferometric components in each of at least two detector signals of an interferometer having a number of N×N couplers, scaling the interferometric components, and generating real and imaginary parts of a complex interferometric signal from the scaled interferometric components. The detector signals preferably derive from a broadband light source coupled to the interferometer, and the number of N×N couplers may be one or more, with N≧3.

    摘要翻译: 正交宽带干涉测量系统和方法在简单,紧凑且便宜的设置中在零差和外差系统中瞬时获得完整的复杂干涉信号。 这是通过将具有多个N×N耦合器的干涉仪的至少两个检测器信号中的每一个中的干涉测量分量分离成干涉测量分量来实现的,缩放干涉测量分量,以及从经缩放的干涉测量中产生复干涉信号的实部和虚部 组件。 检测器信号优选地源自耦合到干涉仪的宽带光源,并且N×N个耦合器的数量可以是一个或多个,其中N≥3。

    Systems and methods for surgical microscope and optical coherence tomography (OCT) imaging
    8.
    发明授权
    Systems and methods for surgical microscope and optical coherence tomography (OCT) imaging 有权
    手术显微镜和光学相干断层扫描(OCT)成像的系统和方法

    公开(公告)号:US08366271B2

    公开(公告)日:2013-02-05

    申请号:US13010497

    申请日:2011-01-20

    IPC分类号: A61B3/14 A61B3/00

    摘要: A surgical microscope assembly includes a microscope main objective and microscope imaging optics. The microscope main objective and microscope imaging optics define a viewing beam path that passes from a sample through the microscope main objective and the microscope imaging optics. The assembly includes an optical coherence tomography (OCT) unit having an illumination beam and a collection beam and a beamsplitter between the microscope main objective and the microscope imaging optics. The beamsplitter is configured to direct a portion of light from the microscope main objective to the microscope imaging optics and to direct another portion of light from the microscope main objective to the OCT unit collection beam. The beamsplitter is further configured to direct an illumination beam from the OCT unit to the microscope main objective and to the sample. A beam forming unit is between the OCT unit and the beamsplitter. The beam forming unit is configured to form the illumination beam of the OCT unit so as to generally correspond to a size of the microscope main objective.

    摘要翻译: 手术显微镜组件包括显微镜主要目标和显微镜成像光学元件。 显微镜主要目标和显微镜成像光学器件定义了从样品通过显微镜主要目标和显微镜成像光学器件的观察光束路径。 组件包括具有照明光束和收集光束的光学相干断层摄影(OCT)单元和在显微镜主要物镜和显微镜成像光学器件之间的分束器。 分束器被配置为将来自显微镜主物镜的光的一部分引导到显微镜成像光学器件,并将来自显微镜主物镜的另一部分光引导到OCT单元收集光束。 分束器还被配置成将来自OCT单元的照明光束引导到显微镜主目标和样品。 光束形成单元位于OCT单元和分束器之间。 光束形成单元被配置为形成OCT单元的照明光束,以便大致对应于显微镜主要物镜的尺寸。

    Depth-resolved spectroscopic optical coherence tomography
    10.
    再颁专利
    Depth-resolved spectroscopic optical coherence tomography 有权
    深度分辨光谱相干断层扫描

    公开(公告)号:USRE42641E1

    公开(公告)日:2011-08-23

    申请号:US10020041

    申请日:2001-12-14

    IPC分类号: G01B9/02

    摘要: A method is described for determining depth-resolved backscatter characteristics of scatterers within a sample, comprising the steps of: acquiring a plurality of sets of cross-correlation interferogram data using an interferometer having a sample arm with the sample in the sample arm, wherein the sample includes a distribution of scatterers therein, and wherein the acquiring step includes the step of altering the distribution of scatterers within the sample with respect to the sample arm for substantially each acquisition; and averaging, in the Fourier domain, the cross-correlation interferogram data, thereby revealing backscattering characteristics of the scatterers within the sample.

    摘要翻译: 描述了一种用于确定样本内的散射体的深度分辨后向散射特性的方法,包括以下步骤:使用具有样本臂的样本臂与样本臂中的样本的干涉仪获取多组互相干涉图数据,其中, 样本包括其中散射体的分布,并且其中所述获取步骤包括基本上每次获取相对于所述样本臂改变所述样本内的散射体的分布的步骤; 并且在傅里叶域中平均互相关干涉图数据,从而揭示样品内的散射体的后向散射特性。