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公开(公告)号:US11322204B2
公开(公告)日:2022-05-03
申请号:US16557898
申请日:2019-08-30
Applicant: KIOXIA CORPORATION
Inventor: Taira Shibuya
Abstract: A semiconductor memory device includes first and second memory cells, adjacent first and second word line connected to gates of the first and second memory cells, respectively, a word line driver for the first and second word lines, a bit line connected to the first and second memory cells, a sense amplifier circuit configured to detect data stored in the memory cells via the bit line and apply a voltage to the bit line, and a control circuit configured to control the word line driver and the sense amplifier circuit to execute a write operation. During a write operation performed on the first memory cell to increase a threshold voltage of the first memory cell to a target state, the control circuit changes the bit line voltage of the bit line according to a difference between the target state and a threshold voltage state of the second memory cell.
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公开(公告)号:US11011239B2
公开(公告)日:2021-05-18
申请号:US16724100
申请日:2019-12-20
Applicant: KIOXIA CORPORATION
Inventor: Noboru Shibata , Hironori Uchikawa , Taira Shibuya
IPC: G11C11/00 , G11C16/26 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/34 , G06F3/06 , G11C16/32 , H01L27/115
Abstract: A semiconductor memory according to an embodiment includes first and second memory cells, first and second memory cell arrays, first and second word lines, and controller. The first and second memory cell array include the first and second memory cells, respectively. The first and second word lines are coupled to the first and second memory cells, respectively. Data of six or more bits including a first bit, a second bit, a third bit, a fourth bit, a fifth bit, and a sixth bit is stored with the use of a combination of a threshold voltage of the first memory cell and a threshold voltage of the second memory cell.
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公开(公告)号:US12020756B2
公开(公告)日:2024-06-25
申请号:US18134719
申请日:2023-04-14
Applicant: Kioxia Corporation
Inventor: Noboru Shibata , Hironori Uchikawa , Taira Shibuya
IPC: G11C16/00 , G06F3/06 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/26 , G11C16/32 , G11C16/34 , H10B69/00
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/32 , G11C16/3459 , H10B69/00
Abstract: A semiconductor memory includes a first memory cell configured to be set with a first threshold voltage, the first threshold voltage being one of different threshold voltage levels, a second memory cell configured to be set with a second threshold voltage, the second threshold voltage being one of different threshold voltage levels, a first word line coupled to the first memory cell, a second word line coupled to the second memory cell, and a controller configured to read data of one of different bits based on a combination of the first threshold voltage of the first memory cell and the second threshold voltage of the second memory cell.
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公开(公告)号:US11657879B2
公开(公告)日:2023-05-23
申请号:US17244246
申请日:2021-04-29
Applicant: Kioxia Corporation
Inventor: Noboru Shibata , Hironori Uchikawa , Taira Shibuya
IPC: G11C11/00 , G11C16/26 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/34 , G06F3/06 , G11C16/32 , H01L27/115
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/32 , G11C16/3459 , H01L27/115
Abstract: A semiconductor memory includes a first memory cell configured to be set with a first threshold voltage, the first threshold voltage being one of different threshold voltage levels, a second memory cell configured to be set with a second threshold voltage, the second threshold voltage being one of different threshold voltage levels, a first word line coupled to the first memory cell, a second word line coupled to the second memory cell, and a controller configured to read data of one of different bits based on a combination of the first threshold voltage of the first memory cell and the second threshold voltage of the second memory cell.
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