Nonvolatile memory and writing method

    公开(公告)号:US12176027B2

    公开(公告)日:2024-12-24

    申请号:US18467271

    申请日:2023-09-14

    Abstract: According to one embodiment, three bits stored in one memory cell of a nonvolatile memory correspond to three pages. In first page writing, a threshold voltage becomes within a first or second region base on a bit value. In second page writing, if being within the first region, it becomes within the first or fourth region; and if being within the second region, it becomes within the second or third region. In the third page writing, if being within the first region, it becomes within the first or sixth region; if being within the second region, it becomes within the second or seventh region; if being within the third region, it becomes within the third or eighth region; and if being within the fourth region, it becomes within the fourth or fifth region.

    Semiconductor memory device capable of shortening erase time

    公开(公告)号:US11830559B2

    公开(公告)日:2023-11-28

    申请号:US17348886

    申请日:2021-06-16

    Inventor: Noboru Shibata

    CPC classification number: G11C16/3445 G11C16/10 G11C16/14 G11C16/26

    Abstract: In a memory cell array, a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines are arranged in a matrix. A control circuit controls the potentials of said plurality of word lines and said plurality of bit lines. In an erase operation, the control circuit erases an n number of memory cells (n is a natural number equal to or larger than 2) of said plurality of memory cells at the same time using a first erase voltage, carries out a verify operation using a first verify level, finds the number of cells k (k≤n) exceeding the first verify level, determines a second erase voltage according to the number k, and carries out an erase operation again using the second erase voltage.

    Nonvolatile memory multilevel cell programming

    公开(公告)号:US11646076B2

    公开(公告)日:2023-05-09

    申请号:US17545470

    申请日:2021-12-08

    Abstract: A memory system includes a nonvolatile memory which comprises a plurality of memory cells capable of storing 4-bit data represented by first to fourth bits by sixteen threshold regions, and a memory controller configured to cause the nonvolatile memory to execute a first program for writing data of the first bit, the second bit, and the fourth bit and then causes the nonvolatile memory to execute a second program for writing data of the third bit. In fifteen boundaries existing between adjacent threshold regions among the first to sixteenth threshold regions, a maximum value of the number of first boundaries used for determining a value of the data of the first bit, the number of second boundaries used for determining a value of the data of the second bit, the number of third boundaries used for determining a value of the data of the third bit.

    Semiconductor memory device, memory system, and write method

    公开(公告)号:US11437095B2

    公开(公告)日:2022-09-06

    申请号:US17158567

    申请日:2021-01-26

    Abstract: According to one embodiment, a memory system includes a semiconductor memory device including a memory cell capable of holding at least 4-bit data and a controller configured to control a first write operation and a second write operation based on the 4-bit data. The controller includes a conversion circuit configured to convert 4-bit data into 2-bit data. The semiconductor memory device includes a recovery controller configured to recover the 4-bit data based on the converted 2-bit data and data written in the memory cell by the first write operation. The first write operation is executed based on the 4-bit data received from the controller, and the second write operation is executed based on the 4-bit data recovered by the recovery controller.

    Semiconductor memory device
    8.
    发明授权

    公开(公告)号:US11423997B2

    公开(公告)日:2022-08-23

    申请号:US17201332

    申请日:2021-03-15

    Abstract: A semiconductor memory device includes first and second memory string including first and second memory cell, respectively, and first and second bit line connected to first and second memory string, respectively. In a first program operation, a first bit line voltage is supplied to the first and the second bit line. In a second program operation, a second bit line voltage larger than the first bit line voltage or a third bit line voltage larger than the second bit line voltage is supplied to the first and the second bit line. In a third program operation, the second and the third bit line voltage is supplied to the first and the second bit line, respectively. In a fourth program operation, the third and the second bit line voltage is supplied to the first and the second bit line, respectively.

    Semiconductor memory
    9.
    发明授权

    公开(公告)号:US11011239B2

    公开(公告)日:2021-05-18

    申请号:US16724100

    申请日:2019-12-20

    Abstract: A semiconductor memory according to an embodiment includes first and second memory cells, first and second memory cell arrays, first and second word lines, and controller. The first and second memory cell array include the first and second memory cells, respectively. The first and second word lines are coupled to the first and second memory cells, respectively. Data of six or more bits including a first bit, a second bit, a third bit, a fourth bit, a fifth bit, and a sixth bit is stored with the use of a combination of a threshold voltage of the first memory cell and a threshold voltage of the second memory cell.

    Memory system
    10.
    发明授权

    公开(公告)号:US12293787B2

    公开(公告)日:2025-05-06

    申请号:US18364524

    申请日:2023-08-03

    Abstract: A memory system has a nonvolatile memory which comprises memory cells capable of storing 4-bit data of first to fourth bits by sixteen threshold regions including a first threshold region corresponding to an erased state and second to sixteenth threshold regions having higher voltage levels than a voltage level of the first threshold region corresponding to a written state; and a controller which causes the nonvolatile memory to execute a first program for writing data of the first bit and the second bit and then causes the nonvolatile memory to execute a second program for writing data of the third bit and the fourth bit. The controller controls such that the threshold region is any threshold region of a seventeenth threshold region corresponding to an erased state and eighteenth to twentieth threshold regions having higher voltage levels than that of the seventeenth threshold region corresponding to a written state.

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