Optical metrology tool equipped with modulated illumination sources

    公开(公告)号:US10215688B2

    公开(公告)日:2019-02-26

    申请号:US15217549

    申请日:2016-07-22

    摘要: The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulse trains for use in multi-wavelength time-sequential optical metrology.

    Optical Metrology Tool Equipped with Modulated Illumination Sources
    5.
    发明申请
    Optical Metrology Tool Equipped with Modulated Illumination Sources 审中-公开
    配有调制照明源的光学计量工具

    公开(公告)号:US20170016815A1

    公开(公告)日:2017-01-19

    申请号:US15217549

    申请日:2016-07-22

    摘要: The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulses trains for use in multi-wavelength time-sequential optical metrology.

    摘要翻译: 该系统包括被配置为照亮设置在样品台上的样品的表面的可调制照明源,被配置为检测从样品表面发出的照射的检测器,被配置为将来自可调节照明源的照明引导到 所述样品,集合光学器件被配置为将样品的表面的照射引导到所述检测器;以及调制控制系统,其通信地耦合到所述可调节照明源,其中所述调制控制系统被配置为调制所述可调节照明源的驱动电流 选择的调制频率,其适于产生具有选定的相干特征长度的照明。 此外,本发明包括多个光源的输出的时间顺序交错以产生用于多波长时间顺序光学测量的周期性脉冲串。

    Optical metrology tool equipped with modulated illumination sources

    公开(公告)号:US10969328B2

    公开(公告)日:2021-04-06

    申请号:US16284950

    申请日:2019-02-25

    摘要: The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulse trains for use in multi-wavelength time-sequential optical metrology.