Carrying device for information recording medium
    7.
    发明授权
    Carrying device for information recording medium 失效
    信息记录媒体携带装置

    公开(公告)号:US06628590B1

    公开(公告)日:2003-09-30

    申请号:US09433956

    申请日:1999-11-04

    IPC分类号: G11B700

    CPC分类号: G11B17/0515 G11B19/12

    摘要: An information recording-reproducing apparatus includes carrier rollers arranged in a carriage path having a width almost equal to a diameter of a large diameter disc, and a mechanical side switch PSW at one peripheral end of the carriage path. First and second optical detectors are arranged in the carriage path at an interval smaller than a diameter of the small diameter disc. The first optical detector and the side switch are arranged at an interval larger than the diameter of the small diameter disc, while the second optical detector and the side switch are arranged at an interval smaller than the diameter of the small diameter disc. The type of the disc as well as difference between the disc and an object other than the disc are determined based on the detection signals from the optical detectors and the side switch.

    摘要翻译: 信息记录再现装置包括布置在具有几乎等于大直径盘的直径的宽度的托架路径中的托辊和在托架路径的一个外周端处的机械侧开关PSW。 第一和第二光学检测器以小于小直径盘的直径的间隔布置在托架路径中。 第一光学检测器和侧面开关以比直径小的圆盘的直径大的间隔排列,而第二光学检测器和侧面开关以小于直径盘的直径的间隔排列。 基于来自光学检测器和侧面开关的检测信号来确定盘的类型以及盘与盘之外的物体之间的差异。

    Coreless and brushless direct-current motor, Gifford McMahon (GM) cryogenic cooler, pulse tube cryogenic cooler, cryopump, Magnetic Resonance Imaging (MRI) apparatus, Superconducting Magnet (SCM) apparatus, Nuclear Magnetic Resonance (NMR) apparatus, and cryogenic cooler for cooling semiconductor
    8.
    发明授权
    Coreless and brushless direct-current motor, Gifford McMahon (GM) cryogenic cooler, pulse tube cryogenic cooler, cryopump, Magnetic Resonance Imaging (MRI) apparatus, Superconducting Magnet (SCM) apparatus, Nuclear Magnetic Resonance (NMR) apparatus, and cryogenic cooler for cooling semiconductor 有权
    无芯无刷直流电机,吉福德麦克马洪(GM)低温冷却器,脉冲管低温冷却器,低温泵,磁共振成像(MRI)装置,超导磁体(SCM)装置,核磁共振(NMR)装置和低温冷却器 冷却半导体

    公开(公告)号:US07719160B2

    公开(公告)日:2010-05-18

    申请号:US11528525

    申请日:2006-09-28

    IPC分类号: H02K1/22

    CPC分类号: H02K21/12 H02K5/128 H02K16/02

    摘要: A coreless and brushless direct-current motor includes an armature coil wound without core and formed in the shape of a saddle; an outside rotor magnet formed by a permanent magnet, the outside rotor magnet being provided at an outside of the armature coil in the shape of a cylinder so as to face the armature coil, the outside rotor magnet being rotated by the magnetic field; an inside rotor magnet formed by a permanent magnet, the inside rotor magnet being provided in the shape of a cylinder at an inside of the armature coil so that the inside rotor magnet has a pole opposite to the outside rotor magnet and a rotational shaft is independently provided; an output shaft connected to the inside rotor magnet; and a sealing part of a barrier structure which sealing part partitions the armature coil and the outside rotor magnet to an outside of the inside rotor magnet and seals the armature coil and the outside rotor magnet.

    摘要翻译: 无芯无刷直流电动机包括没有铁芯缠绕并形成鞍座形状的电枢线圈; 由永磁体形成的外转子磁体,外转子磁体设置在与电枢线圈相对的圆筒形状的电枢线圈的外侧,外转子磁体通过磁场旋转; 由永磁体形成的内转子磁体,内转子磁体设置在电枢线圈的内侧的圆筒形状,使得内转子磁体具有与外转子磁体相反的极,并且旋转轴独立地 提供; 连接到内转子磁体的输出轴; 以及密封部,其将电枢线圈和外侧转子磁铁分隔成内侧转子磁体的外部,并密封电枢线圈和外部转子磁体。

    DIRECTION FINDER ANTENNA
    9.
    发明申请
    DIRECTION FINDER ANTENNA 审中-公开
    方向寻找天线

    公开(公告)号:US20070109213A1

    公开(公告)日:2007-05-17

    申请号:US11557140

    申请日:2006-11-07

    申请人: Teruo Takahashi

    发明人: Teruo Takahashi

    IPC分类号: H01Q21/00

    CPC分类号: H01Q21/062

    摘要: The present invention provides a direction finder antenna that includes an antenna mount having one flat portion and four extensible whip antenna elements respectively upright provided rotatably at antenna upright-provided points formed on one circumference at an antenna upright-provided surface. The four extensible whip antenna elements can be rotatably set to arbitrary angular positions lying in sector-shaped areas each having an open angle of 180° orthogonal to the one circumference, which are formed on the antenna upright-provided surface side, centering on the respective antenna upright-provided points at the antenna upright-provided surface.

    摘要翻译: 本发明提供了一种取向器天线,其包括具有一个平坦部分的天线安装座和分别竖立的四个可延伸的鞭状天线元件,所述四个可延伸的鞭状天线元件可旋转地设置在天线垂直设置的一个圆周上形成在天线垂直设置表面处。 四个可延伸的鞭状天线元件可以可旋转地设置在任意角度位置,其位于扇形区域中,每个扇形区域具有垂直于一个圆周的180°的开角度,它们形成在天线竖立设置表面侧上,以相应的 天线直立提供的点在天线直立提供的表面。

    Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
    10.
    发明授权
    Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them 有权
    厚度测量装置,厚度测量方法和湿蚀刻装置以及利用它们的湿式蚀刻方法

    公开(公告)号:US06768552B2

    公开(公告)日:2004-07-27

    申请号:US10275136

    申请日:2002-11-01

    IPC分类号: G01B902

    摘要: At each measurement time, reflected light from a semiconductor wafer W or the like by measurement light from a measurement light source 11 is coupled to reference light from a reference light generating section 14, and interference light is detected by a photodetector 15. A raw thickness value calculating section 16b selects two light intensity peaks corresponding to the upper and lower surfaces of the wafer W from a light intensity distribution between an interference light intensity and a reference optical path length and calculates a raw thickness value. A statistical thickness value calculating section 16c executes statistical processing including data sorting, determination whether the raw thickness value falls within an allowable numerical value range, and determination of a thickness change line, thereby obtaining a statistical thickness value. With this arrangement, a thickness measuring apparatus and thickness measuring method capable of measuring the thickness of a semiconductor wafer during execution of wet etching independently of the presence of an etchant, and a wet etching apparatus and wet etching method using the thickness measuring apparatus and method are implemented.

    摘要翻译: 在每个测量时间,通过来自测量光源11的测量光来自半导体晶片W等的反射光与来自参考光产生部分14的参考光耦合,并且由光电检测器15检测干涉光。原始厚度 值计算部分16b从干涉光强度和参考光程长度之间的光强度分布中选择与晶片W的上表面和下表面相对应的两个光强峰值,并计算原始厚度值。 统计厚度值计算部分16c执行包括数据分类,确定原始厚度值是否在容许数值范围内的统计处理以及厚度变化线的确定,从而获得统计厚度值。 利用这种布置,可以独立于蚀刻剂的存在,以及使用该厚度测量装置和方法的湿蚀刻装置和湿式蚀刻方法,能够在执行湿蚀刻期间测量半导体晶片的厚度的厚度测量装置和厚度测量方法 被实施。